JPH0187269U - - Google Patents
Info
- Publication number
- JPH0187269U JPH0187269U JP18313887U JP18313887U JPH0187269U JP H0187269 U JPH0187269 U JP H0187269U JP 18313887 U JP18313887 U JP 18313887U JP 18313887 U JP18313887 U JP 18313887U JP H0187269 U JPH0187269 U JP H0187269U
- Authority
- JP
- Japan
- Prior art keywords
- circuit board
- movable plate
- base
- pin
- inspected
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 5
- 238000007689 inspection Methods 0.000 claims 3
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18313887U JPH0642222Y2 (ja) | 1987-11-30 | 1987-11-30 | 回路基板検査装置 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18313887U JPH0642222Y2 (ja) | 1987-11-30 | 1987-11-30 | 回路基板検査装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0187269U true JPH0187269U (th) | 1989-06-08 |
| JPH0642222Y2 JPH0642222Y2 (ja) | 1994-11-02 |
Family
ID=31474570
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18313887U Expired - Lifetime JPH0642222Y2 (ja) | 1987-11-30 | 1987-11-30 | 回路基板検査装置 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0642222Y2 (th) |
-
1987
- 1987-11-30 JP JP18313887U patent/JPH0642222Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0642222Y2 (ja) | 1994-11-02 |
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