JPH0184074U - - Google Patents
Info
- Publication number
- JPH0184074U JPH0184074U JP1987179982U JP17998287U JPH0184074U JP H0184074 U JPH0184074 U JP H0184074U JP 1987179982 U JP1987179982 U JP 1987179982U JP 17998287 U JP17998287 U JP 17998287U JP H0184074 U JPH0184074 U JP H0184074U
- Authority
- JP
- Japan
- Prior art keywords
- terminal
- power terminal
- accelerated life
- power supply
- test sample
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図、第３図、第４図、第５図はそれぞれ本
考案による加速寿命試験治具の回路図を示す。第
２図は治具の電源端子と被試験試料の電源端子の
間に抵抗を接続した回路図である。
図において、１……被試験試料（ＤＵＴ）、２
……加速寿命試験治具の電源端子、３……地気端
子、４……ダイオード、５……抵抗、６……治具
の電源端子に被試験試料の電源端子を直接接続し
た糸、７……ダイオードを介して治具の電源端子
と被試験試料の電源端子を接続した糸。
FIG. 1, FIG. 3, FIG. 4, and FIG. 5 each show a circuit diagram of an accelerated life test jig according to the present invention. FIG. 2 is a circuit diagram in which a resistor is connected between the power terminal of the jig and the power terminal of the sample under test. In the figure, 1... Sample under test (DUT), 2
... Power terminal of accelerated life test jig, 3... Earth terminal, 4... Diode, 5... Resistor, 6... Thread directly connecting the power terminal of the test sample to the power terminal of the jig, 7 ...A thread that connects the power terminal of the jig and the power terminal of the test sample via a diode.
Claims (1)
子、地気端子を有するプリント板上に被試験試料
を装着するためのソケツトを有し、ソケツトの各
端子とプリント板上の電源端子、地気端子を適宜
電気的に接続した加速寿命試験治具において、前
記プリント板上の電源端子と被試験試料の電源端
子に対応するソケツトの端子の間に、順方向にダ
イオードを接続したことを特徴とする加速寿命試
験治具。 It has a socket for mounting the test sample on a printed circuit board that has a power terminal for receiving power supply from an external power supply and a ground terminal. The accelerated life test jig is characterized in that a diode is connected in the forward direction between the power terminal on the printed board and the terminal of the socket corresponding to the power terminal of the test sample. Accelerated life test jig.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987179982U JPH0184074U (en) | 1987-11-25 | 1987-11-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1987179982U JPH0184074U (en) | 1987-11-25 | 1987-11-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0184074U true JPH0184074U (en) | 1989-06-05 |
Family
ID=31471522
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1987179982U Pending JPH0184074U (en) | 1987-11-25 | 1987-11-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0184074U (en) |
-
1987
- 1987-11-25 JP JP1987179982U patent/JPH0184074U/ja active Pending
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