JPH0150872B2 - - Google Patents

Info

Publication number
JPH0150872B2
JPH0150872B2 JP59107623A JP10762384A JPH0150872B2 JP H0150872 B2 JPH0150872 B2 JP H0150872B2 JP 59107623 A JP59107623 A JP 59107623A JP 10762384 A JP10762384 A JP 10762384A JP H0150872 B2 JPH0150872 B2 JP H0150872B2
Authority
JP
Japan
Prior art keywords
temperature
measuring device
tester
constant temperature
circuit component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP59107623A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60252276A (ja
Inventor
Katsumi Takami
Jukichi Yamaguchi
Fujio Ozawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP59107623A priority Critical patent/JPS60252276A/ja
Publication of JPS60252276A publication Critical patent/JPS60252276A/ja
Publication of JPH0150872B2 publication Critical patent/JPH0150872B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP59107623A 1984-05-29 1984-05-29 回路部品の測定装置 Granted JPS60252276A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59107623A JPS60252276A (ja) 1984-05-29 1984-05-29 回路部品の測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59107623A JPS60252276A (ja) 1984-05-29 1984-05-29 回路部品の測定装置

Publications (2)

Publication Number Publication Date
JPS60252276A JPS60252276A (ja) 1985-12-12
JPH0150872B2 true JPH0150872B2 (Direct) 1989-10-31

Family

ID=14463874

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59107623A Granted JPS60252276A (ja) 1984-05-29 1984-05-29 回路部品の測定装置

Country Status (1)

Country Link
JP (1) JPS60252276A (Direct)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2520558Y2 (ja) * 1990-06-29 1996-12-18 日立電子エンジニアリング株式会社 低温ハンドラ
JP2757609B2 (ja) * 1991-07-31 1998-05-25 日立電子エンジニアリング株式会社 Icハンドラの温度制御方法
JP2705420B2 (ja) * 1991-12-27 1998-01-28 日立電子エンジニアリング株式会社 低温ハンドラの温度制御方法

Also Published As

Publication number Publication date
JPS60252276A (ja) 1985-12-12

Similar Documents

Publication Publication Date Title
US6476627B1 (en) Method and apparatus for temperature control of a device during testing
JP4070724B2 (ja) 温度調整方法及び検査測定装置
US5084671A (en) Electric probing-test machine having a cooling system
KR19980033219A (ko) 시료 탑재대의 온도 제어 장치
US7940064B2 (en) Method and apparatus for wafer level burn-in
US20080238466A1 (en) Temperature sensing and prediction in ic sockets
US5903163A (en) Apparatus and method of controlling the environmental temperature near semiconductor devices under test
JP7398037B2 (ja) 冷却システム
CN201716330U (zh) 老化测试箱
US20250027988A1 (en) Temperature adjustment system and electronic component testing apparatus
JP7617765B2 (ja) 超伝導マグネット装置
JPH0150872B2 (Direct)
US20020175694A1 (en) Method of burning in an integrated circuit chip package
JP2001013201A (ja) Icデバイスの試験方法及び試験装置
JP7569495B2 (ja) プローバの冷却システム
JP3700505B2 (ja) Icハンドラー
JPH1144727A (ja) 回路基板検査装置
JP7349113B2 (ja) パワーサイクル試験装置及びパワーサイクル試験方法
JP2998557B2 (ja) 恒温槽の常温コントロール装置
KR100938363B1 (ko) 메모리 모듈의 신뢰성 검사용 온도조절장치
GB2604985A (en) The temperature-vacuum impacting device
JP2023014963A5 (Direct)
CN223742643U (zh) 一种防凝露结构及试验箱
US20250093407A1 (en) Method of having good thermal isolation in wafer test cassette
RU2029930C1 (ru) Стенд для испытания регуляторов температуры