JPH01500968A - 断層像形成方法及び装置 - Google Patents

断層像形成方法及び装置

Info

Publication number
JPH01500968A
JPH01500968A JP62504469A JP50446987A JPH01500968A JP H01500968 A JPH01500968 A JP H01500968A JP 62504469 A JP62504469 A JP 62504469A JP 50446987 A JP50446987 A JP 50446987A JP H01500968 A JPH01500968 A JP H01500968A
Authority
JP
Japan
Prior art keywords
radiation
line
section
collimator
cross
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP62504469A
Other languages
English (en)
Japanese (ja)
Inventor
アニス，マーチン
Original Assignee
アメリカン　サイエンス　アンド　エンジニアリング，インク．
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by アメリカン　サイエンス　アンド　エンジニアリング，インク． filed Critical アメリカン　サイエンス　アンド　エンジニアリング，インク．
Publication of JPH01500968A publication Critical patent/JPH01500968A/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
JP62504469A 1986-07-22 1987-07-21 断層像形成方法及び装置 Pending JPH01500968A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US06/888,019 US4809312A (en) 1986-07-22 1986-07-22 Method and apparatus for producing tomographic images
US888,019 1986-07-22

Publications (1)

Publication Number Publication Date
JPH01500968A true JPH01500968A (ja) 1989-04-06

Family

ID=25392362

Family Applications (1)

Application Number Title Priority Date Filing Date
JP62504469A Pending JPH01500968A (ja) 1986-07-22 1987-07-21 断層像形成方法及び装置

Country Status (4)

Country Link
US (1) US4809312A (US08158827-20120417-C00028.png)
JP (1) JPH01500968A (US08158827-20120417-C00028.png)
DE (1) DE3790388T1 (US08158827-20120417-C00028.png)
WO (1) WO1988000698A1 (US08158827-20120417-C00028.png)

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JP2010501860A (ja) * 2006-08-23 2010-01-21 アメリカン サイエンス アンド エンジニアリング，インコーポレイテッド 散乱減衰式断層撮影
JP2017127624A (ja) * 2015-10-30 2017-07-27 コミサリア ア レネルジ アトミク エ オウ エネルジ アルタナティヴ Ｘ線回折分光用コリメータ、関連装置およびその使用

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CN107479085A (zh) 2010-03-14 2017-12-15 拉皮斯坎系统股份有限公司 多屏检测系统
EP3252506B1 (en) 2011-02-08 2020-11-18 Rapiscan Systems, Inc. Covert surveillance using multi-modality sensing
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CN104170051B (zh) 2012-02-03 2017-05-31 拉皮斯坎系统股份有限公司 组合散射和透射的多视图成像系统
US10670740B2 (en) 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
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CN107209282B (zh) 2014-11-20 2019-12-20 爱康公司 X射线扫描系统和方法
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CN104764759B (zh) * 2015-04-01 2017-11-21 中国原子能科学研究院 一种用于x射线背散射成像系统的跳线飞点扫描装置
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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010501860A (ja) * 2006-08-23 2010-01-21 アメリカン サイエンス アンド エンジニアリング，インコーポレイテッド 散乱減衰式断層撮影
JP2017127624A (ja) * 2015-10-30 2017-07-27 コミサリア ア レネルジ アトミク エ オウ エネルジ アルタナティヴ Ｘ線回折分光用コリメータ、関連装置およびその使用

Also Published As

Publication number Publication date
WO1988000698A1 (en) 1988-01-28
DE3790388T1 (US08158827-20120417-C00028.png) 1988-08-25
US4809312A (en) 1989-02-28

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