JPH0148976B2 - - Google Patents

Info

Publication number
JPH0148976B2
JPH0148976B2 JP24883083A JP24883083A JPH0148976B2 JP H0148976 B2 JPH0148976 B2 JP H0148976B2 JP 24883083 A JP24883083 A JP 24883083A JP 24883083 A JP24883083 A JP 24883083A JP H0148976 B2 JPH0148976 B2 JP H0148976B2
Authority
JP
Japan
Prior art keywords
holder
reference sample
optical system
sample
angle
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP24883083A
Other languages
English (en)
Japanese (ja)
Other versions
JPS60143745A (ja
Inventor
Akio Tsumura
Noriharu Myaake
Suguru Yamamoto
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nitto Denko Corp
Original Assignee
Nitto Denko Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nitto Denko Corp filed Critical Nitto Denko Corp
Priority to JP24883083A priority Critical patent/JPS60143745A/ja
Priority to US06/687,403 priority patent/US4684256A/en
Priority to DE19843447878 priority patent/DE3447878A1/de
Publication of JPS60143745A publication Critical patent/JPS60143745A/ja
Publication of JPH0148976B2 publication Critical patent/JPH0148976B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/21—Polarisation-affecting properties

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP24883083A 1983-12-30 1983-12-30 光軸方向連続測定装置 Granted JPS60143745A (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP24883083A JPS60143745A (ja) 1983-12-30 1983-12-30 光軸方向連続測定装置
US06/687,403 US4684256A (en) 1983-12-30 1984-12-28 Apparatus and method for continuously measuring polarizing property
DE19843447878 DE3447878A1 (de) 1983-12-30 1984-12-31 Vorrichtung und verfahren zum fortlaufenden messen der polarisierungseigenschaft

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24883083A JPS60143745A (ja) 1983-12-30 1983-12-30 光軸方向連続測定装置

Publications (2)

Publication Number Publication Date
JPS60143745A JPS60143745A (ja) 1985-07-30
JPH0148976B2 true JPH0148976B2 (enrdf_load_stackoverflow) 1989-10-23

Family

ID=17184054

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24883083A Granted JPS60143745A (ja) 1983-12-30 1983-12-30 光軸方向連続測定装置

Country Status (1)

Country Link
JP (1) JPS60143745A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62157549A (ja) * 1985-12-30 1987-07-13 Kanzaki Paper Mfg Co Ltd シート状透光性試料の異方性測定方法

Also Published As

Publication number Publication date
JPS60143745A (ja) 1985-07-30

Similar Documents

Publication Publication Date Title
US4053232A (en) Rotating-compensator ellipsometer
JPS60242308A (ja) 薄いサンプルの厚さの測定方法及びその装置並びに薄いサンプルの特性の測定方法及びその装置
GB1419738A (en) Ellipsometer
US2866375A (en) Gloss meter
JPH0148976B2 (enrdf_load_stackoverflow)
US4684256A (en) Apparatus and method for continuously measuring polarizing property
US2176013A (en) Spectrophotometer and spectrophotometric analysis and prediction
CA1048806A (en) Rotating-compensator ellipsometer
US3342099A (en) Scattered light spectrophotometer
US4838691A (en) Method and apparatus for determining calibration accuracy of a scientific instrument
JPH08201277A (ja) 複屈折測定方法及び装置
US2310623A (en) Polarimetric apparatus
US3790796A (en) Method and apparatus for measurement of sheet opacity
JPH0127380B2 (enrdf_load_stackoverflow)
CN1034883C (zh) 一种椭圆偏振光谱仪的设计方法
EP0736766A1 (en) Method of and device for measuring the refractive index of wafers of vitreous material
JPS57136151A (en) Method for measuring deviation angle of cut plane of single crystal
JPH0444942B2 (enrdf_load_stackoverflow)
KR960008763Y1 (ko) 필름의 결정화도 측정장치
SU1755125A1 (ru) Устройство дл определени показател преломлени
JPS5473690A (en) Method and apparatus for measuring linearity of photo detectors
BATTEN Visible and infrared polarization ratio spectroreflectometer[Patent]
JPH049746A (ja) 色・濁度計
SU795159A1 (ru) Способ измерени показател поглощени
SU947637A1 (ru) Устройство дл измерени коэффициента отражени плоской поверхности образцов