JPH0146026B2 - - Google Patents

Info

Publication number
JPH0146026B2
JPH0146026B2 JP57127186A JP12718682A JPH0146026B2 JP H0146026 B2 JPH0146026 B2 JP H0146026B2 JP 57127186 A JP57127186 A JP 57127186A JP 12718682 A JP12718682 A JP 12718682A JP H0146026 B2 JPH0146026 B2 JP H0146026B2
Authority
JP
Japan
Prior art keywords
flaw detection
channel
defect
probe
detection pattern
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57127186A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5917156A (ja
Inventor
Akio Suzuki
Hiroshi Kajikawa
Tadashi Nishihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kobe Steel Ltd
Original Assignee
Kobe Steel Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kobe Steel Ltd filed Critical Kobe Steel Ltd
Priority to JP57127186A priority Critical patent/JPS5917156A/ja
Priority to US06/514,864 priority patent/US4524622A/en
Priority to DE8383304211T priority patent/DE3373709D1/de
Priority to EP83304211A priority patent/EP0102176B1/de
Publication of JPS5917156A publication Critical patent/JPS5917156A/ja
Publication of JPH0146026B2 publication Critical patent/JPH0146026B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/44—Processing the detected response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/4445—Classification of defects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/06—Visualisation of the interior, e.g. acoustic microscopy
    • G01N29/0609—Display arrangements, e.g. colour displays
    • G01N29/0618—Display arrangements, e.g. colour displays synchronised with scanning, e.g. in real-time
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G01N29/11—Analysing solids by measuring attenuation of acoustic waves
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/225—Supports, positioning or alignment in moving situation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/26—Arrangements for orientation or scanning by relative movement of the head and the sensor
    • G01N29/265—Arrangements for orientation or scanning by relative movement of the head and the sensor by moving the sensor relative to a stationary material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/36—Detecting the response signal, e.g. electronic circuits specially adapted therefor
    • G01N29/38—Detecting the response signal, e.g. electronic circuits specially adapted therefor by time filtering, e.g. using time gates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/044—Internal reflections (echoes), e.g. on walls or defects

Landscapes

  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • Engineering & Computer Science (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP57127186A 1982-07-20 1982-07-20 超音波法による欠陥の検出方法 Granted JPS5917156A (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP57127186A JPS5917156A (ja) 1982-07-20 1982-07-20 超音波法による欠陥の検出方法
US06/514,864 US4524622A (en) 1982-07-20 1983-07-18 Method and apparatus of ultrasonic flaw detection
DE8383304211T DE3373709D1 (en) 1982-07-20 1983-07-20 Method and apparatus for ultrasonic flaw detection
EP83304211A EP0102176B1 (de) 1982-07-20 1983-07-20 Verfahren und Vorrichtung zur Ultraschallfehlerprüfung

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57127186A JPS5917156A (ja) 1982-07-20 1982-07-20 超音波法による欠陥の検出方法

Publications (2)

Publication Number Publication Date
JPS5917156A JPS5917156A (ja) 1984-01-28
JPH0146026B2 true JPH0146026B2 (de) 1989-10-05

Family

ID=14953804

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57127186A Granted JPS5917156A (ja) 1982-07-20 1982-07-20 超音波法による欠陥の検出方法

Country Status (1)

Country Link
JP (1) JPS5917156A (de)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49127681A (de) * 1973-04-06 1974-12-06

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2298921A5 (fr) * 1973-01-29 1976-08-20 Commissariat Energie Atomique Procede de controle par ultrasons des soudures en forte epaisseur et dispositifs de mise en oeuvr
JPS5339594Y2 (de) * 1975-01-20 1978-09-26

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS49127681A (de) * 1973-04-06 1974-12-06

Also Published As

Publication number Publication date
JPS5917156A (ja) 1984-01-28

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