JPH0145584B2 - - Google Patents

Info

Publication number
JPH0145584B2
JPH0145584B2 JP55148988A JP14898880A JPH0145584B2 JP H0145584 B2 JPH0145584 B2 JP H0145584B2 JP 55148988 A JP55148988 A JP 55148988A JP 14898880 A JP14898880 A JP 14898880A JP H0145584 B2 JPH0145584 B2 JP H0145584B2
Authority
JP
Japan
Prior art keywords
electrode
sample
voltage
extraction electrode
deceleration
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP55148988A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5772073A (en
Inventor
Akio Ito
Yoshiaki Goto
Toshihiro Ishizuka
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Priority to JP55148988A priority Critical patent/JPS5772073A/ja
Publication of JPS5772073A publication Critical patent/JPS5772073A/ja
Publication of JPH0145584B2 publication Critical patent/JPH0145584B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Tests Of Electronic Circuits (AREA)
JP55148988A 1980-10-24 1980-10-24 Voltage measuring device Granted JPS5772073A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55148988A JPS5772073A (en) 1980-10-24 1980-10-24 Voltage measuring device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55148988A JPS5772073A (en) 1980-10-24 1980-10-24 Voltage measuring device

Publications (2)

Publication Number Publication Date
JPS5772073A JPS5772073A (en) 1982-05-06
JPH0145584B2 true JPH0145584B2 (OSRAM) 1989-10-04

Family

ID=15465182

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55148988A Granted JPS5772073A (en) 1980-10-24 1980-10-24 Voltage measuring device

Country Status (1)

Country Link
JP (1) JPS5772073A (OSRAM)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3638682A1 (de) * 1986-11-13 1988-05-19 Siemens Ag Spektrometerobjektiv fuer korpuskularstrahlmesstechnik

Also Published As

Publication number Publication date
JPS5772073A (en) 1982-05-06

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