JPH0139041B2 - - Google Patents

Info

Publication number
JPH0139041B2
JPH0139041B2 JP2857783A JP2857783A JPH0139041B2 JP H0139041 B2 JPH0139041 B2 JP H0139041B2 JP 2857783 A JP2857783 A JP 2857783A JP 2857783 A JP2857783 A JP 2857783A JP H0139041 B2 JPH0139041 B2 JP H0139041B2
Authority
JP
Japan
Prior art keywords
measured
distance
lens
position sensor
dimensional
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP2857783A
Other languages
English (en)
Japanese (ja)
Other versions
JPS59154313A (ja
Inventor
Atsushi Yoshikawa
Tsutomu Kamyama
Shinichi Nagata
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP2857783A priority Critical patent/JPS59154313A/ja
Publication of JPS59154313A publication Critical patent/JPS59154313A/ja
Publication of JPH0139041B2 publication Critical patent/JPH0139041B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/26Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Measurement Of Optical Distance (AREA)
JP2857783A 1983-02-24 1983-02-24 距離および傾斜角測定装置 Granted JPS59154313A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2857783A JPS59154313A (ja) 1983-02-24 1983-02-24 距離および傾斜角測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2857783A JPS59154313A (ja) 1983-02-24 1983-02-24 距離および傾斜角測定装置

Publications (2)

Publication Number Publication Date
JPS59154313A JPS59154313A (ja) 1984-09-03
JPH0139041B2 true JPH0139041B2 (zh) 1989-08-17

Family

ID=12252453

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2857783A Granted JPS59154313A (ja) 1983-02-24 1983-02-24 距離および傾斜角測定装置

Country Status (1)

Country Link
JP (1) JPS59154313A (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007286072A (ja) * 2007-08-06 2007-11-01 Kobe Steel Ltd 平坦度測定方法及びその装置

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0697163B2 (ja) * 1985-09-26 1994-11-30 横河電機株式会社 変位変換器
JPH0619244B2 (ja) * 1985-09-30 1994-03-16 横河電機株式会社 変位変換器
JPH07104128B2 (ja) * 1987-11-25 1995-11-13 コニカ株式会社 変位・傾き測定装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007286072A (ja) * 2007-08-06 2007-11-01 Kobe Steel Ltd 平坦度測定方法及びその装置

Also Published As

Publication number Publication date
JPS59154313A (ja) 1984-09-03

Similar Documents

Publication Publication Date Title
US6879403B2 (en) Three dimensional scanning camera
JP2752003B2 (ja) 走査機能を備えた検査干渉計
EP0503874A2 (en) Optical measurement device with enhanced sensitivity
TWI402498B (zh) 影像形成方法及影像形成裝置
JPS5999304A (ja) 顕微鏡系のレーザ光による比較測長装置
TWI844611B (zh) 厚度測量裝置
JP2000275027A (ja) スリット共焦点顕微鏡とそれを用いた表面形状計測装置
US20060181715A1 (en) Method and apparatus for measuring wafer thickness
TW202024563A (zh) 厚度量測裝置
JP6684992B2 (ja) 突起検査装置及びバンプ検査装置
KR100878425B1 (ko) 표면 측정 장치
JPH0139042B2 (zh)
JPH0139041B2 (zh)
JP7373644B2 (ja) 透過及び反射光を組み合わせた半導体素子の内部クラックの撮像
JP2005017127A (ja) 干渉計および形状測定装置
JP2008309532A (ja) 3次元測定装置及び検査装置
JPS62502421A (ja) 二次元の対象物を整向、検査及び/または測定するための装置
JPH07208917A (ja) 自動焦点合わせ方法及び装置
JP2000258144A (ja) ウェーハの平坦度および厚み測定装置
US20220344192A1 (en) Systems and methods for absolute sample positioning
JPH037766Y2 (zh)
JPH08261734A (ja) 形状測定装置
JP3003671B2 (ja) 試料表面の高さ検出方法及びその装置
JPH0618230A (ja) 厚み測定装置
JPH0357914A (ja) 光学式プローブ