JPH0136576B2 - - Google Patents

Info

Publication number
JPH0136576B2
JPH0136576B2 JP4018182A JP4018182A JPH0136576B2 JP H0136576 B2 JPH0136576 B2 JP H0136576B2 JP 4018182 A JP4018182 A JP 4018182A JP 4018182 A JP4018182 A JP 4018182A JP H0136576 B2 JPH0136576 B2 JP H0136576B2
Authority
JP
Japan
Prior art keywords
signal
output
detection circuit
comparator
level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP4018182A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58158543A (ja
Inventor
Kunihiko Edamatsu
Kazue Shimizu
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fuji Electric Co Ltd
Original Assignee
Fuji Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fuji Electric Co Ltd filed Critical Fuji Electric Co Ltd
Priority to JP4018182A priority Critical patent/JPS58158543A/ja
Publication of JPS58158543A publication Critical patent/JPS58158543A/ja
Publication of JPH0136576B2 publication Critical patent/JPH0136576B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/95Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/952Inspecting the exterior surface of cylindrical bodies or wires

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP4018182A 1982-03-16 1982-03-16 透明、不透明部から成る物体の欠陥検出回路 Granted JPS58158543A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4018182A JPS58158543A (ja) 1982-03-16 1982-03-16 透明、不透明部から成る物体の欠陥検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4018182A JPS58158543A (ja) 1982-03-16 1982-03-16 透明、不透明部から成る物体の欠陥検出回路

Publications (2)

Publication Number Publication Date
JPS58158543A JPS58158543A (ja) 1983-09-20
JPH0136576B2 true JPH0136576B2 (xx) 1989-08-01

Family

ID=12573606

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4018182A Granted JPS58158543A (ja) 1982-03-16 1982-03-16 透明、不透明部から成る物体の欠陥検出回路

Country Status (1)

Country Link
JP (1) JPS58158543A (xx)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62194169A (ja) * 1986-02-19 1987-08-26 スタンレー電気株式会社 冷却用フアンの制御装置

Also Published As

Publication number Publication date
JPS58158543A (ja) 1983-09-20

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