JPH0132922B2 - - Google Patents

Info

Publication number
JPH0132922B2
JPH0132922B2 JP56175369A JP17536981A JPH0132922B2 JP H0132922 B2 JPH0132922 B2 JP H0132922B2 JP 56175369 A JP56175369 A JP 56175369A JP 17536981 A JP17536981 A JP 17536981A JP H0132922 B2 JPH0132922 B2 JP H0132922B2
Authority
JP
Japan
Prior art keywords
knife mark
output
pass filter
divider
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56175369A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5876707A (ja
Inventor
Yutaka Abe
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP17536981A priority Critical patent/JPS5876707A/ja
Publication of JPS5876707A publication Critical patent/JPS5876707A/ja
Publication of JPH0132922B2 publication Critical patent/JPH0132922B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacture Of Wood Veneers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP17536981A 1981-10-31 1981-10-31 ナイフマ−ク検出装置のナイフマ−ク検出回路 Granted JPS5876707A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17536981A JPS5876707A (ja) 1981-10-31 1981-10-31 ナイフマ−ク検出装置のナイフマ−ク検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17536981A JPS5876707A (ja) 1981-10-31 1981-10-31 ナイフマ−ク検出装置のナイフマ−ク検出回路

Publications (2)

Publication Number Publication Date
JPS5876707A JPS5876707A (ja) 1983-05-09
JPH0132922B2 true JPH0132922B2 (enrdf_load_stackoverflow) 1989-07-11

Family

ID=15994883

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17536981A Granted JPS5876707A (ja) 1981-10-31 1981-10-31 ナイフマ−ク検出装置のナイフマ−ク検出回路

Country Status (1)

Country Link
JP (1) JPS5876707A (enrdf_load_stackoverflow)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4949687A (enrdf_load_stackoverflow) * 1972-09-13 1974-05-14
JPS50104655U (enrdf_load_stackoverflow) * 1974-01-31 1975-08-28
JPS51148452A (en) * 1975-06-14 1976-12-20 Fujitsu Ltd Pattern defects detector
JPS55158505A (en) * 1979-05-28 1980-12-10 Matsushita Electric Works Ltd Knifed mark inspector

Also Published As

Publication number Publication date
JPS5876707A (ja) 1983-05-09

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