JPS5876707A - ナイフマ−ク検出装置のナイフマ−ク検出回路 - Google Patents
ナイフマ−ク検出装置のナイフマ−ク検出回路Info
- Publication number
- JPS5876707A JPS5876707A JP17536981A JP17536981A JPS5876707A JP S5876707 A JPS5876707 A JP S5876707A JP 17536981 A JP17536981 A JP 17536981A JP 17536981 A JP17536981 A JP 17536981A JP S5876707 A JPS5876707 A JP S5876707A
- Authority
- JP
- Japan
- Prior art keywords
- output
- pass filter
- divider
- knife mark
- threshold level
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims abstract description 13
- 238000005259 measurement Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 239000005338 frosted glass Substances 0.000 description 1
- 239000005337 ground glass Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
Landscapes
- Engineering & Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Manufacture Of Wood Veneers (AREA)
- Length Measuring Devices By Optical Means (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17536981A JPS5876707A (ja) | 1981-10-31 | 1981-10-31 | ナイフマ−ク検出装置のナイフマ−ク検出回路 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17536981A JPS5876707A (ja) | 1981-10-31 | 1981-10-31 | ナイフマ−ク検出装置のナイフマ−ク検出回路 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5876707A true JPS5876707A (ja) | 1983-05-09 |
JPH0132922B2 JPH0132922B2 (enrdf_load_stackoverflow) | 1989-07-11 |
Family
ID=15994883
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17536981A Granted JPS5876707A (ja) | 1981-10-31 | 1981-10-31 | ナイフマ−ク検出装置のナイフマ−ク検出回路 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5876707A (enrdf_load_stackoverflow) |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4949687A (enrdf_load_stackoverflow) * | 1972-09-13 | 1974-05-14 | ||
JPS50104655U (enrdf_load_stackoverflow) * | 1974-01-31 | 1975-08-28 | ||
JPS51148452A (en) * | 1975-06-14 | 1976-12-20 | Fujitsu Ltd | Pattern defects detector |
JPS55158505A (en) * | 1979-05-28 | 1980-12-10 | Matsushita Electric Works Ltd | Knifed mark inspector |
-
1981
- 1981-10-31 JP JP17536981A patent/JPS5876707A/ja active Granted
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4949687A (enrdf_load_stackoverflow) * | 1972-09-13 | 1974-05-14 | ||
JPS50104655U (enrdf_load_stackoverflow) * | 1974-01-31 | 1975-08-28 | ||
JPS51148452A (en) * | 1975-06-14 | 1976-12-20 | Fujitsu Ltd | Pattern defects detector |
JPS55158505A (en) * | 1979-05-28 | 1980-12-10 | Matsushita Electric Works Ltd | Knifed mark inspector |
Also Published As
Publication number | Publication date |
---|---|
JPH0132922B2 (enrdf_load_stackoverflow) | 1989-07-11 |
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