JPS5876707A - ナイフマ−ク検出装置のナイフマ−ク検出回路 - Google Patents

ナイフマ−ク検出装置のナイフマ−ク検出回路

Info

Publication number
JPS5876707A
JPS5876707A JP17536981A JP17536981A JPS5876707A JP S5876707 A JPS5876707 A JP S5876707A JP 17536981 A JP17536981 A JP 17536981A JP 17536981 A JP17536981 A JP 17536981A JP S5876707 A JPS5876707 A JP S5876707A
Authority
JP
Japan
Prior art keywords
output
pass filter
divider
knife mark
threshold level
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17536981A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0132922B2 (enrdf_load_stackoverflow
Inventor
Yutaka Abe
豊 阿部
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP17536981A priority Critical patent/JPS5876707A/ja
Publication of JPS5876707A publication Critical patent/JPS5876707A/ja
Publication of JPH0132922B2 publication Critical patent/JPH0132922B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacture Of Wood Veneers (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP17536981A 1981-10-31 1981-10-31 ナイフマ−ク検出装置のナイフマ−ク検出回路 Granted JPS5876707A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17536981A JPS5876707A (ja) 1981-10-31 1981-10-31 ナイフマ−ク検出装置のナイフマ−ク検出回路

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17536981A JPS5876707A (ja) 1981-10-31 1981-10-31 ナイフマ−ク検出装置のナイフマ−ク検出回路

Publications (2)

Publication Number Publication Date
JPS5876707A true JPS5876707A (ja) 1983-05-09
JPH0132922B2 JPH0132922B2 (enrdf_load_stackoverflow) 1989-07-11

Family

ID=15994883

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17536981A Granted JPS5876707A (ja) 1981-10-31 1981-10-31 ナイフマ−ク検出装置のナイフマ−ク検出回路

Country Status (1)

Country Link
JP (1) JPS5876707A (enrdf_load_stackoverflow)

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4949687A (enrdf_load_stackoverflow) * 1972-09-13 1974-05-14
JPS50104655U (enrdf_load_stackoverflow) * 1974-01-31 1975-08-28
JPS51148452A (en) * 1975-06-14 1976-12-20 Fujitsu Ltd Pattern defects detector
JPS55158505A (en) * 1979-05-28 1980-12-10 Matsushita Electric Works Ltd Knifed mark inspector

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS4949687A (enrdf_load_stackoverflow) * 1972-09-13 1974-05-14
JPS50104655U (enrdf_load_stackoverflow) * 1974-01-31 1975-08-28
JPS51148452A (en) * 1975-06-14 1976-12-20 Fujitsu Ltd Pattern defects detector
JPS55158505A (en) * 1979-05-28 1980-12-10 Matsushita Electric Works Ltd Knifed mark inspector

Also Published As

Publication number Publication date
JPH0132922B2 (enrdf_load_stackoverflow) 1989-07-11

Similar Documents

Publication Publication Date Title
GB1112687A (en) Improvements in or relating to arrangements for testing blocks of cigarettes
US3920970A (en) Laser scanner flaw detection system using baseline follower signal processing
AU2210683A (en) Photomultiplier testing for defects
US1816047A (en) Photometer
GB1493843A (en) Apparatus for monitoring a web of material for faults
US3718823A (en) Optical detectors for inspecting the condition of samples
US3700909A (en) Method for detecting pinhole defects in foil material
US3779649A (en) Method of and an electro-optical system for inspecting material
JPS5876707A (ja) ナイフマ−ク検出装置のナイフマ−ク検出回路
CA2255642A1 (en) Coin testing apparatus and method
EP0006648B1 (en) Method and device for inspecting a moving sheet material for streaklike defects
US3515488A (en) Film examining apparatus for detecting flaws in a continuously moving film web in which a delay circuit is used to permit deriving both the blanking signal and the inspection signal from a single light source
KR940005944A (ko) 표면결함검사장치
JP2995124B2 (ja) 寸法測定装置
JPS6365883B2 (enrdf_load_stackoverflow)
GB898828A (en) Improvements in or relating to the examination of transparent sheet material
CN116952538B (zh) 一种用于紫外探测器光电性能检测的快速质检装置
JPS56167236A (en) Method of testing exhaust condition of fluorescent lamp
JP2880721B2 (ja) 欠陥検査装置
JPH04236318A (ja) コンデンサ極性検査装置
JPS6353453A (ja) デイスクの欠陥検査装置
EP0130797B1 (en) Method of inspecting the surface of photographic paper
JP2532513B2 (ja) 物体有無検査方法
JPH0224538A (ja) ヒビ、ワレの検出装置
JPH044207Y2 (enrdf_load_stackoverflow)