JPH01301153A - Ｘ線光学素子評価装置 - Google Patents

Ｘ線光学素子評価装置

Info

Publication number
JPH01301153A
JPH01301153A JP63130381A JP13038188A JPH01301153A JP H01301153 A JPH01301153 A JP H01301153A JP 63130381 A JP63130381 A JP 63130381A JP 13038188 A JP13038188 A JP 13038188A JP H01301153 A JPH01301153 A JP H01301153A
Authority
JP
Japan
Prior art keywords
rays
ray
optical element
reflected
ray optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63130381A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0583122B2 (cs
Inventor
Ryohei Yokoyama
良平 横山
Mitsuo Sumiya
住谷　充夫
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP63130381A priority Critical patent/JPH01301153A/ja
Publication of JPH01301153A publication Critical patent/JPH01301153A/ja
Publication of JPH0583122B2 publication Critical patent/JPH0583122B2/ja
Granted legal-status Critical Current

Links

Landscapes

  • Testing Of Optical Devices Or Fibers (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP63130381A 1988-05-30 1988-05-30 Ｘ線光学素子評価装置 Granted JPH01301153A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63130381A JPH01301153A (ja) 1988-05-30 1988-05-30 Ｘ線光学素子評価装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63130381A JPH01301153A (ja) 1988-05-30 1988-05-30 Ｘ線光学素子評価装置

Publications (2)

Publication Number Publication Date
JPH01301153A true JPH01301153A (ja) 1989-12-05
JPH0583122B2 JPH0583122B2 (cs) 1993-11-24

Family

ID=15032976

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63130381A Granted JPH01301153A (ja) 1988-05-30 1988-05-30 Ｘ線光学素子評価装置

Country Status (1)

Country Link
JP (1) JPH01301153A (cs)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2742867A1 (fr) * 1995-12-22 1997-06-27 Commissariat Energie Atomique Procede et dispositif interferometrique de caracterisation d'un milieu
FR2742866A1 (fr) * 1995-12-22 1997-06-27 Commissariat Energie Atomique Procede et dispositif de caracterisation d'un milieu ionise mettant en oeuvre une source de rayonnement electromagnetique a duree ultracourte

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2742867A1 (fr) * 1995-12-22 1997-06-27 Commissariat Energie Atomique Procede et dispositif interferometrique de caracterisation d'un milieu
FR2742866A1 (fr) * 1995-12-22 1997-06-27 Commissariat Energie Atomique Procede et dispositif de caracterisation d'un milieu ionise mettant en oeuvre une source de rayonnement electromagnetique a duree ultracourte
WO1997024019A1 (fr) * 1995-12-22 1997-07-03 Commissariat A L'energie Atomique Procede et dispositif interferometriques de caracterisation d'un milieu
WO1997024020A1 (fr) * 1995-12-22 1997-07-03 Commissariat A L'energie Atomique Procede et dispositif de caracterisation d'un milieu ionise mettant en oeuvre une source de rayonnement electromagnetique a duree ultracourte

Also Published As

Publication number Publication date
JPH0583122B2 (cs) 1993-11-24

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