JPH01298165A - Manufacture of carbon film - Google Patents

Manufacture of carbon film

Info

Publication number
JPH01298165A
JPH01298165A JP63128459A JP12845988A JPH01298165A JP H01298165 A JPH01298165 A JP H01298165A JP 63128459 A JP63128459 A JP 63128459A JP 12845988 A JP12845988 A JP 12845988A JP H01298165 A JPH01298165 A JP H01298165A
Authority
JP
Japan
Prior art keywords
film
bias
substrate
carbon
carbon film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63128459A
Other languages
Japanese (ja)
Inventor
Keiji Hirabayashi
敬二 平林
Yasushi Taniguchi
靖 谷口
Kenji Ando
謙二 安藤
Noriko Kurihara
栗原 紀子
Keiko Ikoma
生駒 圭子
Susumu Ito
進 伊藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP63128459A priority Critical patent/JPH01298165A/en
Publication of JPH01298165A publication Critical patent/JPH01298165A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To stably manufacture a carbon film at high film-forming speed over a long period by synchronizing the output of high-frequency waves or microwaves producing plasma decomposing a carbon compound-type gas with a positive or negative A.C. bias to be impressed on a substrate. CONSTITUTION:A carbon compound-type gas is introduced via a gas-introducing hole 3 into a high-frequency plasma CVD apparatus and discharged through a gas exhaust port 4. Further, high-frequency electric power is impressed from a high-frequency electric power source 2 on a high-frequency coil 1 to produce plasma. The above gas is decomposed by means of this high-frequency plasma, by which a carbon film of diamond, etc., is formed on a substrate 5 of the prescribed temp. held by a substrate holder 6 containing a heater 8. In the method of manufacturing the above carbon film, an A.C. bias is impressed from an A.C. bias electric power source 7 on the substrate 5, and further, the above high-frequency output is outputted while being synchronized with a positive or negative A.C. bias. By this method, a diamond-like carbon film or an isometric carbon hard carbon film can be formed at high film-forming speed, and this speed can be maintained even if film formation is continued for a long time.

Description

【発明の詳細な説明】 [産業上の分野] 本発明は、ダイヤモンドやi−カーボン等の硬質炭素膜
の製造方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field] The present invention relates to a method for manufacturing a hard carbon film such as diamond or i-carbon.

〔従来の技術1 ダイヤモンドは、物質の中では最も硬度および熱伝導率
に優れるので、その薄膜の応用が幅広(検討されている
[Prior Art 1 Diamond has the highest hardness and thermal conductivity among substances, so its thin film applications are wide-ranging (and are being considered).

ダイヤモンド状炭素膜の製造方法としては、従来より、
例えば、マイクロ波プラズマCVD法(特開昭59−3
098号公報等)、ECRプラズマCVD法(特開昭6
0−103098号公報、特開昭60−103099号
公報等)などのプラズマCVD法による製造方法が知ら
れている。
Conventionally, the manufacturing method of diamond-like carbon film is as follows.
For example, microwave plasma CVD method (Japanese Unexamined Patent Publication No. 59-3
098, etc.), ECR plasma CVD method (Japanese Unexamined Patent Application Publication No. 1986)
Manufacturing methods using plasma CVD methods, such as those disclosed in Japanese Patent Laid-open No. 0-103098 and Japanese Patent Application Laid-Open No. 60-103099, are known.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

しかしながら、これらの方法においては、ダイヤモンド
結晶の成長速度が、一般に1μffi/時程度と遅い。
However, in these methods, the growth rate of diamond crystals is generally as slow as about 1 μffi/hour.

その結晶の成長速度を速める目的で、例えば基体上に直
流バイアスを印加する方法、あるいはプラズマと基体と
の間に中間電極を配置して荷電粒子を基体に照射する方
法等を行なうことができる。それらの方法を行なえば、
成膜当初の結晶成長速度は向上できる。
In order to accelerate the growth rate of the crystal, for example, a method of applying a DC bias onto the substrate, or a method of arranging an intermediate electrode between the plasma and the substrate and irradiating the substrate with charged particles can be carried out. If you do those methods,
The crystal growth rate at the beginning of film formation can be improved.

しかしながら、それらの方法は、成膜を続けて膜厚が厚
くなるに従い、その効果が無くなってしまう。なぜなら
ば、直流バイアスを印加する方法においては、成膜を続
けるに従い基体上の膜厚が厚くなり、かつその膜が高絶
縁性の膜(ダイヤモンド状炭素膜等)だからである。ま
た、中間電極を配置する方法においては、成膜を続ける
に従い、中間電極の表面に高絶縁性の膜が成膜されてし
まうからである。
However, as the film continues to be formed and the film thickness increases, these methods lose their effectiveness. This is because, in the method of applying a DC bias, the film on the substrate becomes thicker as the film continues to be formed, and the film is a highly insulating film (such as a diamond-like carbon film). Further, in the method of arranging the intermediate electrode, as film formation continues, a highly insulating film is formed on the surface of the intermediate electrode.

本発明の目的は、ダイヤモンド結晶の成長速度が速く、
かつ成膜を長時間続けてもその速度の速さを保つことが
できる炭素膜の製造方法を提供することにある。
The purpose of the present invention is to increase the growth rate of diamond crystals,
Another object of the present invention is to provide a method for producing a carbon film that can maintain a high film formation rate even if film formation is continued for a long time.

[課題を解決するための手段] 本発明は、炭素化合物系ガスを、高周波プラズマまたは
マイクロ波電子サイクロトロン共鳴プラズマにより分解
して基体上に膜を形成する炭素膜の製造方法において、 前記基体に交流バイアスを印加し、かつ前記高周波出力
または前記マイクロ波出力を交流バイアスの正または負
と同期させて出力することを特徴とする炭素膜の製造方
法である。
[Means for Solving the Problems] The present invention provides a method for producing a carbon film in which a carbon compound gas is decomposed by high-frequency plasma or microwave electron cyclotron resonance plasma to form a film on a substrate, including the steps of: The method of manufacturing a carbon film is characterized in that a bias is applied and the high frequency output or the microwave output is output in synchronization with the positive or negative of the alternating current bias.

本発明の方法においてば、基体に特定の交流バイアスを
印加するので、従来のプラズマCVD法に比較して成膜
速度が速く、かつ成膜を長時間続けてもその速度の速さ
を保つことができる。更には、基体に電荷がたまること
がなく、このため膜が絶縁破壊を起こすといった問題は
生じ難い。
In the method of the present invention, since a specific alternating current bias is applied to the substrate, the film formation speed is faster than that of the conventional plasma CVD method, and the film formation speed can be maintained even if the film formation continues for a long time. I can do it. Furthermore, no charge is accumulated on the substrate, and therefore problems such as dielectric breakdown of the film are less likely to occur.

更には、本発明の方法においては、プラズマを発生させ
るための高周波出力を、基体に印加する交流バイアスの
正または負と同期させて出力するので、膜中の結晶性を
容易に制御することができ、結晶性の高い膜を得ること
も低い膜を得ることもできる。
Furthermore, in the method of the present invention, the high frequency output for generating plasma is output in synchronization with the positive or negative AC bias applied to the substrate, so the crystallinity in the film can be easily controlled. It is possible to obtain a film with high crystallinity or a film with low crystallinity.

本発明の方法に用いることのできる装置は、プラズマを
発生できる手段と、基体に対して高周波バイアスを印加
可能な手段とを有する装置等である。
Devices that can be used in the method of the present invention include devices that have means capable of generating plasma and means capable of applying a high frequency bias to the substrate.

上記プラズマを発生できる手段とは、炭素化合物系ガス
を分解できるプラズマを発生可能な手段であり、例えば
高周波電源と高周波コイルを有する装置、あるいはマイ
クロ波電源とその導波管および電磁コイルを有する装置
などである。
The above means capable of generating plasma is a means capable of generating plasma capable of decomposing carbon compound gas, such as a device having a high frequency power source and a high frequency coil, or a device having a microwave power source, its waveguide, and an electromagnetic coil. etc.

以下、本発明の方法を、図面を参照しつつ詳細に説明す
る。
Hereinafter, the method of the present invention will be explained in detail with reference to the drawings.

第1図は、本発明の方法に用いることのできる高周波プ
ラズマCVD装置の一例を示す模式図である。
FIG. 1 is a schematic diagram showing an example of a high frequency plasma CVD apparatus that can be used in the method of the present invention.

この装置においては、原料ガスは、ガス導入口3より導
入され、ガス排気口4より排気される。
In this device, raw material gas is introduced through a gas inlet 3 and exhausted through a gas exhaust port 4.

高周波電源2に接続された高周波コイル1により原料ガ
スが分解される。また基板5は、基板ホルダー6上に設
置され、加熱ヒーター8で加熱され、交流バイアス電源
7により交流バイアスが印加される。
The raw material gas is decomposed by a high frequency coil 1 connected to a high frequency power source 2. Further, the substrate 5 is placed on a substrate holder 6, heated by a heater 8, and applied with an AC bias by an AC bias power source 7.

第1図に示す装置における、高周波電源2からの高周波
の出力は、一般に入力の電源が50Hzならば第3図に
示すような出力とされている(交流60Hzならばl/
120秒ごとの山となる)。
In the device shown in Fig. 1, the high frequency output from the high frequency power supply 2 is generally as shown in Fig. 3 if the input power supply is 50Hz (if AC is 60Hz, it is l/
(This will be a mountain every 120 seconds).

第2図は、本発明の方法に用いることのできるECRプ
ラズマCVD装置の一例を示す模式図である。
FIG. 2 is a schematic diagram showing an example of an ECR plasma CVD apparatus that can be used in the method of the present invention.

原料ガスはガス導入口3より導入され、ガス排気口4よ
り排気される。9はマイクロ波電源で導波管10を通じ
てマイクロ波が導入され、電磁コイルIIにより電子サ
イクロトロン共口1プラズマを発生させて、原料を分解
する。基板5は基板ホルダー6で固定され、加熱ヒータ
ー8で加熱され、更に交流バイアス電源7により交流バ
イアスが印加される。
Raw material gas is introduced through the gas inlet 3 and exhausted through the gas exhaust port 4. 9 is a microwave power supply, and microwaves are introduced through a waveguide 10, and an electromagnetic coil II generates an electron cyclotron plasma to decompose the raw material. The substrate 5 is fixed by a substrate holder 6, heated by a heater 8, and further applied with an AC bias by an AC bias power source 7.

以下、本発明における、高周波またはマイクロ波出力を
交流バイアスの正または負と同期させて出力することに
ついて詳細に説明する。
Hereinafter, the method of outputting high frequency or microwave output in synchronization with the positive or negative AC bias according to the present invention will be described in detail.

第4図および第5図は、本発明のバイアス印加方法と高
周波またはマイクロ波出力投入方法の例を示す図である
。なお、図中においては、50Hzの交流バイアスを印
加し−Cいる。
FIGS. 4 and 5 are diagrams showing examples of the bias application method and high frequency or microwave output input method of the present invention. In the figure, an AC bias of 50 Hz is applied.

第4図は、基体に交流バイアスを印加し、さらに高周波
出力またはマイクロ波出力を、基体バイアスが負のとき
だけ出力するように調整されている例である。このよう
に調整することにより、基体はイオンの照射の効果を受
け、一般にi−カーホンと呼ばれる硬質炭素膜が高成長
速度で成長する。
FIG. 4 shows an example in which an alternating current bias is applied to the base, and further adjustment is made so that high frequency output or microwave output is output only when the base bias is negative. By adjusting in this manner, the substrate receives the effect of ion irradiation, and a hard carbon film, generally called i-carphone, grows at a high growth rate.

第5図は、高周波出力またはマイクロ波出力を、基体バ
イアスが正のときだけ出力するように調製されている例
である。このように調整することにより、基体は電子照
射の効果を受け、結晶性の高い、いわゆるダイヤモンド
状炭素膜が、高成長速度で析出する。しかも膜厚が厚く
なってもバイアスの効果は変化がみられない。
FIG. 5 shows an example in which high frequency output or microwave output is adjusted to be output only when the substrate bias is positive. By adjusting in this manner, the substrate receives the effect of electron irradiation, and a highly crystalline, so-called diamond-like carbon film is deposited at a high growth rate. Moreover, even if the film thickness increases, the bias effect remains unchanged.

なお、ここでいう「ダイヤモンド状炭素膜」とは、ビッ
カース硬度で〜2000kg/mm2程度以上の硬度を
もち、1O10Ωcm程度といった高い値の絶縁性をも
った、ダイヤモンド類似の性質を持つ膜である。
The term "diamond-like carbon film" as used herein refers to a film having properties similar to diamond, having a Vickers hardness of about 2000 kg/mm2 or higher and a high insulation value of about 1O10 Ωcm.

なお、第4図および第5図の例においては、高周波出力
またはマイクロ波出力とバイアスとの同期を、そのピー
クが完全に一致するように同期させた場合を示したが、
本発明の方法はこれに限定されるものではなく、ある程
度位相がずれていてもかまわない。ある程度位相をずら
して同期させた場合には、イオン照射と電子照射の両方
の効果を受け、i−カーボンとダイヤモンド状炭素の混
合物の膜が得られる。
In addition, in the example of FIG. 4 and FIG. 5, the synchronization of the high frequency output or the microwave output and the bias was shown so that the peaks coincided completely, but
The method of the present invention is not limited to this, and the phase may be shifted to some extent. When the phases are shifted to some extent and synchronized, a film of a mixture of i-carbon and diamond-like carbon is obtained due to the effects of both ion irradiation and electron irradiation.

以上は交流バイアスが50Hzの例であるが、本発明の
方法においては交流バイアスが1 kHz以下であれば
特に限定されない。1 kHzよりも高いとプラズマを
正または負の時のみ発生させることが困難となり、かつ
自己バイアスが発生して基体が負のみに帯電してしまう
等の問題が生じることがある。
Although the above is an example in which the AC bias is 50 Hz, the method of the present invention is not particularly limited as long as the AC bias is 1 kHz or less. If the frequency is higher than 1 kHz, it becomes difficult to generate plasma only when the voltage is positive or negative, and problems such as self-biasing occurring and the substrate being charged only negatively may occur.

本発明に用いる原料ガス(炭素化合物系ガス)としては
、例えばメタン、エタン等の炭化水素ガスを用いること
ができ、キャリヤガスとしての82 、Ar、He等と
の混合ガスも用いることができる。
As the raw material gas (carbon compound gas) used in the present invention, for example, a hydrocarbon gas such as methane or ethane can be used, and a mixed gas with 82, Ar, He, etc. as a carrier gas can also be used.

[実施例] 以下、実施例によって本発明を具体的に説明する。[Example] Hereinafter, the present invention will be specifically explained with reference to Examples.

実施例1 第1図に示した高周波プラズマCVD装置を用い、基体
への交流バイアスと高周波出力を第4図のように同期さ
せて投入し、以下の条件にて本発明の方法を実施してi
−カーボンを成膜した6基体はシリコン基板で、水素ガ
スとメタンガスをそれぞれ100 SCCM、2 SC
CM導入し、チャンバー内の圧力を20 Torrとし
た。高周波出力は500Wとして基板を600℃に加熱
した。また、交流バイアスはVp= 100Vとした。
Example 1 Using the high frequency plasma CVD apparatus shown in FIG. 1, the AC bias and high frequency output to the substrate were applied in synchronization as shown in FIG. 4, and the method of the present invention was carried out under the following conditions. i
- The six substrates on which carbon was deposited were silicon substrates, and hydrogen gas and methane gas were applied at 100 SCCM and 2 SC, respectively.
CM was introduced, and the pressure inside the chamber was set to 20 Torr. The high frequency output was 500 W and the substrate was heated to 600°C. Further, the AC bias was set to Vp = 100V.

なお、高周波の周波数は13.56MHzである。Note that the frequency of the high frequency is 13.56 MHz.

以上のようにして得た炭素膜は表面が平滑なうす茶色の
透明膜であり、X線回折では結晶性は認められない】−
カーボン膜であった。
The carbon film obtained as above is a light brown transparent film with a smooth surface, and no crystallinity is observed by X-ray diffraction]-
It was a carbon film.

その膜のビッカース硬度は6000kg/ mm2と硬
く、成膜速度は5μm/時であった。
The Vickers hardness of the film was 6000 kg/mm2, and the film formation rate was 5 μm/hour.

実施例2 高周波出力を第5図のように同期させて投入した以外は
実施例1と同様の条件にて本発明の方法を実施してダイ
ヤモンド状炭素膜を成膜した。
Example 2 A diamond-like carbon film was formed by carrying out the method of the present invention under the same conditions as in Example 1, except that the high frequency output was applied in synchronization as shown in FIG.

以上のようにして得られた炭素膜のX線回折により、ダ
イヤモンド結晶が確認された。
Diamond crystals were confirmed by X-ray diffraction of the carbon film obtained as described above.

そのダイヤモンド状炭素膜は、走査型電子顕微鏡観察で
は自形のはっきり出た結晶がみられた。
The diamond-like carbon film showed clearly euhedral crystals when observed using a scanning electron microscope.

成膜速度は4μm/時であった。The film formation rate was 4 μm/hour.

実施例3 第2図に示したECRプラズマCVD装置を用い、基体
への交流バイアスとマイクロ波出力を第4図のように同
期させて投入し、以下の条件にて本発明の方法を実施し
てi−カーボンを成膜した。
Example 3 Using the ECR plasma CVD apparatus shown in Fig. 2, the AC bias and microwave output to the substrate were applied in synchronization as shown in Fig. 4, and the method of the present invention was carried out under the following conditions. i-carbon was formed into a film.

基体はシリコンで、水素ガスとメタンガスをそれぞれ+
00 SCCM、20 SCCM導入し、チャンバー内
の圧力をI X 1O−2Torrとした。マイクロ波
出力は500Wとして基板を600℃に加熱した。また
、交流バイアスはVp= 100V、マイクロ波の周波
数は2.45MHz、ta場はマイクロ波導入窓部分で
875ガウスとした。
The base is silicon, and hydrogen gas and methane gas are each +
00 SCCM and 20 SCCM were introduced, and the pressure inside the chamber was set to I x 10-2 Torr. The microwave output was 500 W and the substrate was heated to 600°C. Further, the AC bias was Vp = 100 V, the microwave frequency was 2.45 MHz, and the ta field was 875 Gauss at the microwave introduction window.

以上のようにして得た炭素膜は表面が平滑な薄茶色の透
明膜であり、X線回折では結晶性は認められない1−カ
ーボン膜であった。
The carbon film obtained as described above was a light brown transparent film with a smooth surface, and was a 1-carbon film with no crystallinity observed by X-ray diffraction.

その膜のビッカース硬度は6000kg/mm2と硬く
、成膜速度は8叩/時であった。
The Vickers hardness of the film was 6000 kg/mm2, and the film forming rate was 8 taps/hour.

実施例4 基体への交流バイアスを第5図のように同期させて投入
した以外は実施例3と同様の条件にて本発明の方法を実
施してダイヤモンド状炭素膜を成膜した。
Example 4 A diamond-like carbon film was formed by carrying out the method of the present invention under the same conditions as in Example 3, except that the AC bias to the substrate was applied synchronously as shown in FIG.

以上のようにして得られた炭素膜のX線回折により、ダ
イヤモンド結晶が確認された。
Diamond crystals were confirmed by X-ray diffraction of the carbon film obtained as described above.

そのダイヤモンド状炭素膜は、走査型電子顕微鏡観察で
は平滑な膜であった。成膜速度は5 )1111 /時
であった。
The diamond-like carbon film was found to be smooth when observed using a scanning electron microscope. The deposition rate was 5)1111/hour.

比較例1 高周波バイアスを印加しない以外は実施例3と同様にし
て成膜を行なった。
Comparative Example 1 Film formation was carried out in the same manner as in Example 3 except that no high frequency bias was applied.

以上のようにして得られた炭素膜のX線回折により、ダ
イヤモンド結晶が確認された。
Diamond crystals were confirmed by X-ray diffraction of the carbon film obtained as described above.

しかしながらその膜は、走査型電子顕微鏡観察によれば
、基体上にダンゴ状のダイヤモンド粒の集合体が膜状に
析出していたものであった。また、析出速度は1μm/
時と遅かった。
However, when the film was observed under a scanning electron microscope, it was found that aggregates of diamond grains in the form of a diamond were deposited on the substrate in the form of a film. In addition, the precipitation rate was 1 μm/
It was late.

[発明の効果] 以上説明したように、プラズマCVD法に基づく本発明
の方法は、基体に特定の交流バイアスを印加するので、
炭素膜の成膜速度が速く、かつ成膜を長時間続けてもそ
の速度の速さを保つことができる。また、交流バイアス
の印加条件により、非晶質の硬質炭素膜(i−カーボン
等)と結晶性の高い炭素膜(ダイヤモンド状炭素膜)を
必要に応じて作り分けることもできる。
[Effects of the Invention] As explained above, the method of the present invention based on the plasma CVD method applies a specific AC bias to the substrate.
The carbon film is formed at a high speed, and this speed can be maintained even if the film formation continues for a long time. Furthermore, depending on the AC bias application conditions, an amorphous hard carbon film (i-carbon, etc.) and a highly crystalline carbon film (diamond-like carbon film) can be produced as required.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は、本発明の方法に用いることのできる高周波プ
ラズマCVD装置の一例を示す模式第2図は、本発明の
方法に用いることのできるECRプラズマCVD装置の
一例を示す模式第3図は、高周波プラズマCVD装置に
おける高周波またはマイクロ波の出力の一例を示す図、 第4図および第5図は、本発明の方法におけるバイアス
印加方法の例を示す図である。 1・・・・・・高周波コイル 2・・・・・・高周波電
源5・・・・・・基体     6・・・・・・基体ホ
ルダー7・・・・・・交流バイアス電源 9・・・・・・マイクロ波電源
FIG. 1 is a schematic diagram showing an example of a high frequency plasma CVD apparatus that can be used in the method of the present invention. FIG. 2 is a schematic diagram showing an example of an ECR plasma CVD apparatus that can be used in the method of the present invention. FIG. 4 and FIG. 5 are diagrams showing an example of the bias application method in the method of the present invention. 1...High frequency coil 2...High frequency power supply 5...Base 6...Base holder 7...AC bias power supply 9...・Microwave power supply

Claims (1)

【特許請求の範囲】  炭素化合物系ガスを、高周波プラズマまたはマイクロ
波電子サイクロトロン共鳴プラズマにより分解して基体
上に膜を形成する炭素膜の製造方法において、 前記基体に交流バイアスを印加し、かつ前記高周波出力
または前記マイクロ波出力を交流バイアスの正または負
と同期させて出力することを特徴とする炭素膜の製造方
法。
[Claims] A method for producing a carbon film, in which a carbon compound gas is decomposed by high-frequency plasma or microwave electron cyclotron resonance plasma to form a film on a substrate, comprising: applying an alternating current bias to the substrate; A method for producing a carbon film, characterized in that the high frequency output or the microwave output is output in synchronization with positive or negative AC bias.
JP63128459A 1988-05-27 1988-05-27 Manufacture of carbon film Pending JPH01298165A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63128459A JPH01298165A (en) 1988-05-27 1988-05-27 Manufacture of carbon film

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63128459A JPH01298165A (en) 1988-05-27 1988-05-27 Manufacture of carbon film

Publications (1)

Publication Number Publication Date
JPH01298165A true JPH01298165A (en) 1989-12-01

Family

ID=14985235

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63128459A Pending JPH01298165A (en) 1988-05-27 1988-05-27 Manufacture of carbon film

Country Status (1)

Country Link
JP (1) JPH01298165A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5427827A (en) * 1991-03-29 1995-06-27 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Deposition of diamond-like films by ECR microwave plasma
JP2002012972A (en) * 2000-02-17 2002-01-15 Applied Materials Inc Method for depositing amorphous carbon layer
WO2003016149A1 (en) * 2001-08-16 2003-02-27 Mitsubishi Shoji Plastics Corporation System for producing dlc film coated plastic container and method for producing the same

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5427827A (en) * 1991-03-29 1995-06-27 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Deposition of diamond-like films by ECR microwave plasma
JP2002012972A (en) * 2000-02-17 2002-01-15 Applied Materials Inc Method for depositing amorphous carbon layer
WO2003016149A1 (en) * 2001-08-16 2003-02-27 Mitsubishi Shoji Plastics Corporation System for producing dlc film coated plastic container and method for producing the same

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