JPH01295339A - Automatic selection system for test item - Google Patents

Abstract

PURPOSE:To omit a deciding part that decides whether the test items should be carried out for each test program or not by securing such a constitution where a processor changes the test items set on a test item execution table into the items necessary for test of the function of a device to be tested based on the instruction of a change instruction program. CONSTITUTION:A processor 1 checks whether or not the test items set on a test item execution table 12 are coincident with those test items necessary for the relevant test and obtained from the function information received from a device 7 to be tested based on the display of a change means 13 of a memory 3. Then the test items of the table 12 are not changed when the coincidence is obtained between said test items. While the function of the device 7 is changed into the test item necessary for test when no coincidence is obtained between those test items. Thus it is possible to omit a deciding part which decides whether the test items should be carried out or not for each test program. Then the manhour and the quantity are decreased for production of a test program for improvement of the economical properties.

Description

[Detailed Description of the Invention] [Table of Contents] Overview Industrial Application Fields Conventional Technology Problems to be Solved by the Invention Means for Solving the Problems Action Examples Effects of the Invention [Summary] Testing using multiple test programs Regarding the test item automatic selection method that enables test equipment to automatically select and execute only the required test program from multiple test programs for each device under test with different functions. The purpose is to reduce the man-hours and amount of program creation and make it economical, as well as improve the processing speed of the test equipment. In order to test, multiple test programs created for each test item and a test item execution table that instructs the order in which the multiple test programs are executed are used, and the test programs are sequentially executed in the order specified by the test item execution table. The test required to test the device under test from among multiple test programs based on the functional information that notifies the difference in the functions of the device under test. A means is provided to change the contents of the test item execution table so that only the program is selected, and when starting a test of the device under test, the function information is read from the device under test and the contents of the test item execution table are changed. After that, the selected test program is executed in the order specified by the changed test item execution table to test the device under test.

[Industrial application field]

The present invention relates to a test device that tests a device under test using a plurality of test programs created for each test item. The present invention relates to an automatic test item selection method that makes it possible to automatically select and execute only the test programs to be tested.

When testing an information processing device, a test device is used that tests the device under test by having a processor execute a plurality of test programs created for each test item. This kind of test equipment connects devices under test with different functions and tests the test items that match each function, so it is necessary to select one of the multiple test programs created to test all functions. It is designed to run a test program.

It is necessary that the test program supplied to such a test device is economical and that the test program execution time of the test device is short.

[Conventional technology]

FIG. 5 is a block diagram illustrating a conventional technique.

The processor 1 of the test device operates by reading the initial setting program stored in the ROM 2, and for example, reads the test item execution table 8, the initial setting program 9, and the test item program stored in the disk 5 via the disk control circuit 4. The group 10 and the termination processing program 11 are stored in the memory 3.

The processor refers to the test item execution table 8 stored in the memory 3 and tests the device under test 7 via the interface circuit 6 according to the instructions.

FIG. 6 is a diagram showing an example of the test item execution table.

The test item execution table 8 includes initial setting items that instruct the initial settings required to start the test, and test items that allow testing of all functions in response to multiple devices under test with different functions. Items from Test A to Test) N that specify all test programs created for each test, and a termination process item that instructs processing associated with the end of the test are specified.

Since the initial setting is specified at the head of the test item execution table 8, the processor I first reads and executes the initial setting program 9 stored in the memory 3. That is, data is given to the firmware of the device under test 7 via the interface circuit 6 to start up the firmware and send out functional information necessary for executing the test program. That is, for example, it is functional information for selecting necessary test items for each function of the device under test 7.

Next, the processor 1 reads a test program from the test item program group 1 (12) stored in the memory 3 in order to execute test l-A of the test item specified in the test item execution table 8. , start running this test program.

FIG. 7 is a diagram showing an example of the test item program group.

In the test item program group 10, test programs ■ to test programs ■ are stored in the memory 3 as shown in ■ to ■, corresponding to the test items A to N of the test item execution table 8. .

This test program (2) has a determining section (2) that determines whether or not execution of the test program A (2) is necessary, depending on the function of the device under test 7.

Therefore, based on the function information sent by the device under test 7 via the interface circuit 6, the processor 1 causes the determination unit 2 to determine whether execution is necessary, and determines whether or not to execute the test program A2.

When the determining unit (■) determines that test program A (80) needs to be executed, the processor 1 executes the test instructed by the test program (A) to the device under test 7 via the interface circuit (6).
However, if it is determined that the execution of test program A■ is unnecessary, the execution of test program A■ is stopped, and the test item execution table 8 is referred to, and the test item specified next to test I-A is executed. In order to execute test B of the test item shown in FIG.

This test program (2) has a determining section (2) that determines whether or not execution of the test program B (2) is necessary, depending on the function of the device under test 7.

Therefore, based on the function information sent by the device under test 7 via the interface circuit 6, the processor 1 causes the determining unit 2 to determine whether execution is necessary, and determines whether or not to execute the test program B (13).

Then, if execution of test program B■ is necessary, the test instructed by test program B■ is executed on the device under test 7 in the same manner as described above, but if it is determined that it is not necessary, test program B■ to stop the execution of test item program group 1 and execute the test item specified next to test B by referring to test item execution table 8.
The test program next to test program (1) is read out of (12) and the execution of this test program is started.

By repeating these operations, processor l executes test N specified at the end of the test items in test item execution table 8, so processor l executes test item program group 1 (12).
The test program ■ is successively outputted from among the test programs ■, and the execution of this test program ■ is started.

This test program (2) has a determining section (2) that determines whether or not the test program N (2) needs to be executed in accordance with the function of the device under test 7.

Therefore, based on the function information sent by the device under test 7 via the interface circuit 6, the processor 1 causes the determining section 2 to determine whether execution is necessary, and determines whether or not to execute the test program N2.

In this way, the processor 1 executes the test programs ■ to ■ corresponding to all test items Test l-A to Test N specified in the test item execution table 8, and then executes the test programs Refer to the termination process,
The termination processing program 11 is read and termination processing such as totaling the test results is performed.

[Problem to be solved by the invention]

As mentioned above, when the conventional test equipment connects and tests the devices under test 7 with different functions, it selects the test program from among the multiple test programs Φ to In order to test only the functions provided by the device 7, the necessary test programs are selected and executed, but the judgment units ■ to ■ that determine whether or not they need to be executed are assigned to each test program ■ to ■, respectively. Since this is a provision, even unnecessary test programs are started to be executed, and it is determined whether to execute them to the end or not based on the determination results of the determination units (1) to (2).

Therefore, the processor l of the test equipment performs a wasteful operation of reading out unnecessary test programs, which reduces the processing speed of the test equipment, and also causes the processing speed of each test program to decrease.
There is a problem in that the number of man-hours required to create the test programs increases because the judgment units (■ to ■) are provided in the test programs (1) to (2), and the amount of test programs (6) to (3) to be created also increases, making it uneconomical.

In view of these problems, the present invention changes the test item execution table 8 based on the function information sent by the device under test 7 when the initial setting program 9 is executed, and deletes unnecessary test items. , When processor 1 refers to this modified test item execution table, test programs corresponding to unnecessary test items are not read, eliminating unnecessary operations of processor 1, and executing each test program ■ to ■. By deleting the determination sections (1) to (13), the purpose is to reduce the number of steps and amount of test program creation to make it economical, and to also improve the processing speed of the test device.

[Means to solve the problem]

FIG. 1 is a block diagram of the principle of the present invention.

The same reference numerals as in FIG. 5 indicate the same functions. The processor 1 uses the test item execution table 12 stored in the memory 3.
The device under test 7 is tested via the interface circuit 6 in accordance with the instructions.

The test item execution table 12 includes initial setting items for instructing the initial settings necessary to start a test, test items for selecting a test program to perform tests suitable for devices under test that are frequently connected, and A termination processing item that instructs processing associated with the termination of the test is set as an initial value.

Since the initial settings are specified at the beginning of the test item execution table 12, the processor 1 first reads and executes the initial setting program 9 stored in the memory 3. That is, data is given to the firmware of the device under test 7 via the interface circuit 6 to start it up, and send out functional information necessary for executing the eggplant 1 program. That is, it is functional information etc. for selecting necessary test items for each function of the test bag W7.

Based on the instructions from the changing means 13 of the memory 3, the processor 1 determines whether the test items set in the test item execution table 12 match the test items necessary for the test obtained from the functional information sent from the test bag W7. Find out if it is. If they match, the test items in the test item execution table 12 are not changed, but if they do not match, the test items are changed to those necessary for testing the functions of the device under test 7.

The processor I then reads the test items set in the test item execution table 12, and successively executes test programs corresponding to these test items from the test item program group 1 (12) stored in the memory 3. do. After executing the test programs corresponding to all the test items set in the test item execution table 12, the processor 1 reads and executes the termination processing program 11.3 Next, when the device under test 14 is connected, Referring to the test item execution table 12, since the initial setting is specified at the beginning, the initial setting program 9 in the memory 3 is read out and executed, data is given to the firmware of the device under test 14 via the interface circuit 6, and the device under test is started up. The function information necessary to execute the test program is transmitted.

Then, based on the instructions from the changing means 13, as described above, the test items set in the test item execution table 12 match the test items necessary for the test obtained from the functional information sent by the device under test 14. Find out if there are any. If they match, the test items in the test item execution table 12 are not changed, but if the functions of the device under test 7 and the device under test 14 are different and the test items set in the test item execution table 12 do not match. is changed to the test items necessary for testing the functions of the device under test 14.

Then, the changed test items in the test item execution table 12 are read out and the test on the device under test 14 is executed in the same manner as described above.

[Effect]

With the above configuration, the processor 1 can change the test items set in the test item execution table 12 to the test items necessary for testing the functions of the device under test in response to instructions from the changing means 13. , there is no need for a determination unit that determines whether to execute each test program.
In addition to reducing the man-hours and amount of test program creation to make it more economical, the processor 1
Since the unnecessary operation of reading out unnecessary test programs from O is unnecessary, the processing speed of the test equipment can also be improved.

〔Example〕

FIG. 2 is a block diagram of a circuit showing an embodiment of the present invention.
FIG. 3 is a flowchart for explaining the operation of FIG. 2, and FIG. 4 is a diagram for explaining the operation of FIG. 2.

The same reference numerals as in FIG. 5 indicate the same functions. The processor 1 reads and operates the initial setting program stored in the ROM 2, and passes through the disk control circuit 4 to the test item execution table 12, the initial setting program 9, the test item program group 10, and the termination process stored in the disk 5. The program 11 is stored in the memory 3.

Then, as shown in FIG. 3, the processor 1 refers to the test item execution table 12 stored in the memory 3 and tests the device under test 7 via the interface circuit 6 in accordance with the instructions. This device under test 7 is a device that is frequently connected, and the test item pattern is A as shown in test bag W7 in FIG. 4 (al).

Assume that they are B, C, E, and G.

The test item execution table 12 includes initial setting items for instructing the initial settings necessary to start a test, test items for selecting a test program to perform tests suitable for devices under test that are frequently connected, and Since the termination processing items that instruct the processing associated with the end of the test are set as initial values, the initial settings, test A, test B, test C, test E1, test G, and termination processing are set as shown in the 4th opening). has been done.

Since the initial setting is specified at the head of the test item execution table 12, the processor 1 first reads and executes the initial setting program 9 stored in the memory 3, as shown in FIG. That is, data is given to the firmware of the device under test 7 via the interface circuit 6 to start up the firmware and send out functional information necessary for executing the test program.

That is, it is functional information etc. for selecting necessary test items for each function of the device under test 7.

Based on the instructions from the change instruction program 15 in the memory 3, the processor l checks whether the test items set in the test item execution table 12 match the test items necessary for the test obtained from the functional information sent by the device under test 7. Check whether it is correct as shown in Figure 3.

In this case, since they match, test item execution table 12
Do not change the test items.

The processor 1 then reads out the test items set in the test item execution table 12, and reads out the test items stored in the memory 3 as shown in FIG.
A test program corresponding to this test item is read out from the test item program group 1 (12) as shown in d) and executed. That is, test program A corresponding to test A shown in (4th opening) is read out and executed, test program B corresponding to test B is read out and executed, and test program C is read out and executed.
reads and executes a test program C corresponding to test E; reads and executes test program E corresponding to test E;
A test program G corresponding to test G is read and executed. Then, the termination processing program 11 is read out and executed.

Then, it is checked whether the test is completed, and if it is not completed and the device under test 14 is connected, the routine returns to refer to the test item execution table 12, and the processor 1 returns to the test item execution table 12.
See 2. Since the initial setting is specified at the beginning, the initial setting program 9 in the memory 3 is read out and executed, data is given to the firmware of the device under test 14 via the interface circuit 6, the firmware is started up, and the test program is executed. The necessary function information is sent on the above.

Similarly to the above, based on the instructions from the change instruction program 15, the processor 1 determines whether the test items set in the test item execution table 12 can be obtained from the function information sent by the device under test 14, as shown in FIG. Check whether the test items match the test items required for the given test.

Bag to be tested! The 14 test item patterns are A, B, D, and E as shown in the device under test 14 in FIG. 4 (al).

F, H, the device under test 7 and the device under test 1
4 have different functions, and the test items set in the test item execution table 12 do not match. Therefore, processor I
changes the contents of the test item execution table 12 to test items necessary for testing the functions of the device under test 14 based on instructions from the change instruction program I5.

That is, as shown in FIG. 4(e), the content shown in FIG. 4(b) is changed, tests C and G are deleted, and test D is changed.
and add test F and test H.

Here, the processor 1 reads the test items set in the test item execution table 12, and reads the fourth test item stored in the memory 3.
A test program corresponding to this test item is read and executed from the test item program group 1 (12) as shown in FIG.
Read and execute test program A corresponding to test B, read and execute test program B corresponding to test B,
Read and execute test program D corresponding to test D, read and execute test program E corresponding to test E, read and execute test program F corresponding to test F, and read test program H corresponding to test H. Read and execute. Then, the termination processing program 11 is read out and executed.

Then, it is checked whether the test is completed, and if the test is completed, the operation is terminated.

〔Effect of the invention〕

As explained above, the present invention allows the processor to change the test items set in the test item execution table to the test items necessary for testing the functions of the device under test according to instructions from the change instruction program. This eliminates the need for a judgment unit that determines whether or not to execute each test program, reducing the number of steps and amount of test program creation and making it more economical. Since unnecessary reading operations are not necessary, the processing speed of the test device can be improved.

[Brief explanation of the drawing]

FIG. 1 is a principle block diagram of the present invention, FIG. 2 is a block diagram of a circuit showing an embodiment of the present invention, FIG. 3 is a flowchart explaining the operation of FIG. 2, and FIG.
The figure is a diagram explaining the operation of Figure 2, Figure 5 is a block diagram explaining the conventional technology, Figure 6 is a diagram showing an example of a test item execution table, and Figure 7 is an example of a test item program group. FIG. In the figure, l is the processor, 2 is the ROM, 3 is the memory, 4 is the disk control circuit, 5 is the disk, 6 is the interface circuit, 7.14 is the device under test, 8.12 is the test item execution table, 9 is the initial stage 10 is a test item program group; 11 is a termination processing program; 13 is a change means; and 15 is a change instruction program. Kaya 2nd prisoner's Sukaishita and 3rd'F! flow 'rv-1
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Claims (1)

[Claims] In order to test each function of a connected device under test (7) from among a plurality of devices under test (7) (14) having different functions, a plurality of devices created for each test item are used. Test program (
10) and a test item execution table (12) that instructs the order in which the plurality of test programs (10) are executed, the plurality of test programs (10) are executed in the order specified by the test item execution table (12). A test device that tests the device under test (7) by sequentially executing the plurality of test programs (10) based on function information that notifies the difference in functionality of the device under test (7). The test item execution table (
A means (13) for changing the contents of the device under test (7) and (14) is provided, and when starting a test of the device under test (7) and (14), the function information is read from the device under test (7) and (14). After changing the contents of the test item execution table (12), the device under test (7) is executed by executing the selected test program in the order specified by the changed test item execution table (12). (14) A test item automatic selection method characterized by conducting the test.