JPH0129247B2 - - Google Patents
Info
- Publication number
- JPH0129247B2 JPH0129247B2 JP7186982A JP7186982A JPH0129247B2 JP H0129247 B2 JPH0129247 B2 JP H0129247B2 JP 7186982 A JP7186982 A JP 7186982A JP 7186982 A JP7186982 A JP 7186982A JP H0129247 B2 JPH0129247 B2 JP H0129247B2
- Authority
- JP
- Japan
- Prior art keywords
- alloy
- atomic
- temperature
- measured
- electrical resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 229910045601 alloy Inorganic materials 0.000 claims description 17
- 239000000956 alloy Substances 0.000 claims description 17
- 229910001281 superconducting alloy Inorganic materials 0.000 claims description 9
- 239000000463 material Substances 0.000 claims description 3
- 229910052735 hafnium Inorganic materials 0.000 claims description 2
- 239000000203 mixture Substances 0.000 claims description 2
- 229910052758 niobium Inorganic materials 0.000 claims description 2
- 229910052715 tantalum Inorganic materials 0.000 claims description 2
- 229910052719 titanium Inorganic materials 0.000 claims description 2
- 229910052720 vanadium Inorganic materials 0.000 claims description 2
- 229910052726 zirconium Inorganic materials 0.000 claims description 2
- 238000002425 crystallisation Methods 0.000 claims 1
- 230000008025 crystallization Effects 0.000 claims 1
- 239000010409 thin film Substances 0.000 claims 1
- 230000007704 transition Effects 0.000 description 8
- 229910000808 amorphous metal alloy Inorganic materials 0.000 description 7
- 238000001514 detection method Methods 0.000 description 6
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 229910000679 solder Inorganic materials 0.000 description 3
- 239000002775 capsule Substances 0.000 description 2
- 229920006332 epoxy adhesive Polymers 0.000 description 2
- 239000000945 filler Substances 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 239000000523 sample Substances 0.000 description 2
- 230000035939 shock Effects 0.000 description 2
- 229910016006 MoSi Inorganic materials 0.000 description 1
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 238000005553 drilling Methods 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000005339 levitation Methods 0.000 description 1
- 238000002844 melting Methods 0.000 description 1
- 230000008018 melting Effects 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000005300 metallic glass Substances 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 239000009719 polyimide resin Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/006—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using superconductive elements
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Superconductor Devices And Manufacturing Methods Thereof (AREA)
- Containers, Films, And Cooling For Superconductive Devices (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7186982A JPS58189528A (ja) | 1982-04-28 | 1982-04-28 | 極低温用温度計 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7186982A JPS58189528A (ja) | 1982-04-28 | 1982-04-28 | 極低温用温度計 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS58189528A JPS58189528A (ja) | 1983-11-05 |
JPH0129247B2 true JPH0129247B2 (enrdf_load_stackoverflow) | 1989-06-08 |
Family
ID=13472948
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7186982A Granted JPS58189528A (ja) | 1982-04-28 | 1982-04-28 | 極低温用温度計 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS58189528A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2523130B2 (ja) * | 1987-06-04 | 1996-08-07 | 住友電気工業株式会社 | 超伝導体を用いた温度コントロ−ラ |
JP5331649B2 (ja) * | 2009-10-22 | 2013-10-30 | ジャパンスーパーコンダクタテクノロジー株式会社 | 超電導マグネット装置およびその超電導コイルの初期冷却方法 |
-
1982
- 1982-04-28 JP JP7186982A patent/JPS58189528A/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPS58189528A (ja) | 1983-11-05 |
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