JPH01268028A - Development processor for substrate - Google Patents

Development processor for substrate

Info

Publication number
JPH01268028A
JPH01268028A JP9663488A JP9663488A JPH01268028A JP H01268028 A JPH01268028 A JP H01268028A JP 9663488 A JP9663488 A JP 9663488A JP 9663488 A JP9663488 A JP 9663488A JP H01268028 A JPH01268028 A JP H01268028A
Authority
JP
Japan
Prior art keywords
substrate
developer
spin chuck
development
developing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP9663488A
Other languages
Japanese (ja)
Inventor
Masaru Kitagawa
勝 北川
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Dainippon Screen Manufacturing Co Ltd
Original Assignee
Dainippon Screen Manufacturing Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Dainippon Screen Manufacturing Co Ltd filed Critical Dainippon Screen Manufacturing Co Ltd
Priority to JP9663488A priority Critical patent/JPH01268028A/en
Publication of JPH01268028A publication Critical patent/JPH01268028A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To store a developer onto a substrate without using a sealing medium while removing contacts with other members of the developer at the time of development, and to develop the substrate with excellent yield by installing specific spin chuck, development pan, nozzle and moving mechanism. CONSTITUTION:A substrate development processor developing and treating a positive type resist on a substrate 1 has a spin chuck 2 holding the substrate 1 at a horizontal attitude, a development pan 4, which surrounds the outer circumferential section of the substrate 1 held onto the spin chuck 2, is mounted under the state in which there are fine clearances to the periphery of the underside of the substrate 1 and stores a developer on the top face of the substrate 1, a nozzle 3 supplying the upper section of the substrate 1 held onto the spin chuck 2 with the developer, and a moving mechanism relatively moving the development pan 4 and the spin chuck 2 between said state in which there are the fine clearances and the state in which the developer is left onto the substrate 1 by surface tension while separated from the fine clearances. An electric motor 6 is installed to an ascending and descending housing 9 by an air cylinder 8, and the spin chuck 2 is lifted and lowered and shifted.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は、例えば、半導体基板やフォトマスク用ガラス
基板などの各種基板のフォトレジスト工程において、基
板上のポジ型レジストを現像処理する基板現像装置に関
する。
[Detailed Description of the Invention] <Industrial Application Field> The present invention relates to a substrate development process for developing a positive resist on a substrate, for example, in a photoresist process for various substrates such as semiconductor substrates and glass substrates for photomasks. Regarding equipment.

〈従来の技術〉 ポジ型レジストの現像処理は、ネガ型レジストの現像処
理の場合に比べて現像速度が遅く、かつ、供給する現像
液の圧力によって現像パターンが劣化しやすいため、基
板上に現像液を貯留しT:、穏やかに現像させることが
必要である。
<Prior art> The development process for positive resists has a slower development speed than that for negative resists, and the developed pattern is likely to deteriorate due to the pressure of the supplied developer. It is necessary to store the solution and develop it gently.

このような要求を満たす従来の基板現像装置としては、
従来、特開昭57−45232号公報に開示されたもの
が知られている。
Conventional substrate development equipment that meets these requirements includes:
Conventionally, one disclosed in Japanese Unexamined Patent Publication No. 57-45232 is known.

この従来例では、基板を吸着保持する基板載置台に環状
の枠体を接゛合して、基板載置台と枠体とで基板よりひ
と回り大きい現像液貯留用の凹部を形成し、この凹部に
現像液を供給貯留し、現像処理が完了すれば基板R百合
と枠4とを上下に分離して処理済み現像液を流出するよ
・うに構成されている。
In this conventional example, an annular frame is joined to a substrate mounting table that holds the substrate by suction, and the substrate mounting table and the frame form a recess for storing a developer that is slightly larger than the substrate. The developer is supplied and stored, and when the development process is completed, the substrate R and the frame 4 are vertically separated and the processed developer is discharged.

〈発明が解決しようとする課題〉 しかしながら、このような従来構成によれば、現像液貯
留用の凹部を形成するために、基板載置台と枠体とを密
着するために0−リングなどのシール材を用いており、
このシール材が経時的に劣化するに伴ってシール材表面
から微粉物が刊離して現像液中に混入し、この微粉物が
基板の回路パターンに付着して回路のショートや断線な
どを発生する欠点があった。
<Problems to be Solved by the Invention> However, according to such a conventional configuration, in order to form a recess for storing developer, a seal such as an O-ring is used to bring the substrate mounting table and the frame into close contact. It uses materials,
As this sealing material deteriorates over time, fine particles are separated from the surface of the sealing material and mixed into the developer, and these fine particles adhere to the circuit pattern on the board, causing circuit shorts and disconnections. There were drawbacks.

本発明は、このような事情に漏みてなされたものであっ
て、シール材を用いずに基板上に現像液を貯留するとと
もに現像時における現像液と他部材との接触を無くして
、歩留り良く現像できるようにすることを目的とする。
The present invention was developed in view of the above circumstances, and it is possible to store a developer on a substrate without using a sealing material, and to eliminate contact between the developer and other components during development, thereby improving the yield. The purpose is to enable development.

く課題を解決するための手段〉 本発明は、このような目的を達成するために、基板上の
ポジ型レジストを現像処理する基板現像装置であって、 前記基板を水平姿勢で保持するスピンチャック前記スピ
ンチャック上に保持された前記基板の外周部を囲み、基
板の下面周辺に対して微小間隙がある状態で設けられ、
基板の上面に現像液を貯留する現像皿と、 前記スピンチャック上に保持された前記基板上に現像液
を供給するノズルと、 前記現像皿と前記スピンチャックとを、前記微小間隙が
ある状態とそれより離間して基板上に表面張力により現
像液を残す状態とにわたって相対的に移動する移動if
lとを備えて構成する。。
Means for Solving the Problems> In order to achieve the above objects, the present invention provides a substrate developing apparatus for developing a positive resist on a substrate, comprising: a spin chuck for holding the substrate in a horizontal position; surrounding the outer periphery of the substrate held on the spin chuck, and provided with a minute gap around the bottom surface of the substrate;
a developing dish that stores a developer on the upper surface of the substrate; a nozzle that supplies the developer onto the substrate held on the spin chuck; and a state in which the developing dish and the spin chuck have the minute gap. A movement that moves relative to a state in which the developer is left on the substrate due to surface tension at a distance from it.
1. .

〈作用〉 上記構成によれば、スピンチャックと現像皿とを、互い
に接触せずに両者間に微少間隙を有する状態に接近させ
、その状態でノズルから基板上に現像液を供給し、現像
液を現像皿および基板上に貯留し、しかる後、所定量の
現像液が貯留された状態で、スピンチャックと現像皿と
を大きく離間し、基板上全面に所定厚さの現像液の層を
表面張力によって形成し、この状態を維持して現像を行
なお、現像が完了した後には、スピンチャックを回転さ
せ、基板上の現像液を飛散除去してから洗浄処理に移行
する。
<Operation> According to the above configuration, the spin chuck and the developing plate are brought close to each other with a small gap between them without contacting each other, and in this state, the developing solution is supplied from the nozzle onto the substrate, and the developing solution is After that, with a predetermined amount of developer stored, the spin chuck and the developer tray are separated by a large distance, and a layer of developer of a predetermined thickness is deposited on the entire surface of the substrate. The substrate is formed under tension and developed while maintaining this state. After the development is completed, the spin chuck is rotated to scatter and remove the developer on the substrate, and then the cleaning process begins.

〈実施例〉 以下、本発明の実施例を図面に基づいて詳細に説明する
<Example> Hereinafter, an example of the present invention will be described in detail based on the drawings.

第1図は、半導体基板のポジ型レジストを現像処理する
基板現像装置の縦断面図、第2図は、−部を切欠いた平
面図である。
FIG. 1 is a longitudinal cross-sectional view of a substrate developing apparatus for developing a positive resist on a semiconductor substrate, and FIG. 2 is a plan view with the minus portion cut away.

基板現像装置は、基板1を水平姿勢で保持するスピンチ
ャック2と、基板1上に現像液を供給するノズル3と、
現像液を基板1との協働により受は止めて貯留する現像
皿4と、基板1の横外周部を囲むように設けられた処理
液飛散防止用のカップ5とを備えている。
The substrate developing device includes a spin chuck 2 that holds the substrate 1 in a horizontal position, a nozzle 3 that supplies a developer onto the substrate 1,
It includes a developing tray 4 that receives and stores the developing solution in cooperation with the substrate 1, and a cup 5 provided to surround the lateral outer periphery of the substrate 1 to prevent scattering of the processing solution.

スピンチャック2は、電動モータ6によって駆動される
回転軸7の上端に取り付けられ、そして、図示しないが
、スピンチャック2の上面には、吸引装W(図示せず)
に連通接続された吸引口が付設されていて、基板1を吸
着保持できるように構成されている。
The spin chuck 2 is attached to the upper end of a rotating shaft 7 driven by an electric motor 6, and although not shown, a suction device W (not shown) is provided on the upper surface of the spin chuck 2.
A suction port connected to the substrate 1 is attached, and the substrate 1 is configured to be able to be held by suction.

また、電動モータ6は、エアシリンダ8によって昇降自
在な支持枠9に取り付けられ、エアシリンダ8の伸縮に
より、支持枠9に連接されたガイド部材10を、装置フ
レーム11に立設されたガイドレール12に沿って案内
させながら昇降し、第1図に示すように、カップ5内の
現像処理位置と、カップ5の上方の基板を搬入または搬
出する位置とにわたってスピンチャック2を昇降移動す
るように構成されている。
Further, the electric motor 6 is attached to a support frame 9 that can be raised and lowered by an air cylinder 8, and the expansion and contraction of the air cylinder 8 moves a guide member 10 connected to the support frame 9 to a guide rail provided upright on the device frame 11. As shown in FIG. It is configured.

現像液供給用のノズル3は、電動モータ13によって鉛
直軸芯周りで駆動回転される支軸14に片持ち状に支持
され、電動モータ13の回転により、円弧軌跡を描(よ
うに水平方向に移動できるように構成されている。
The developer supply nozzle 3 is supported in a cantilevered manner on a support shaft 14 that is driven and rotated around a vertical axis by an electric motor 13, and as the electric motor 13 rotates, it draws an arcuate trajectory (horizontally It is configured to be mobile.

現像皿4は、その内径が基板1のオリエンテーシ式ンフ
ラットよりも小径の開口を有する環状に構成され、その
現像皿4が、筒軸15の上端に連接された複数本の放射
状のステー16(第2図参照)に連結支持されている。
The developing tray 4 is formed into an annular shape having an opening whose inner diameter is smaller than that of the orientated flat of the substrate 1. (See Figure 2).

筒軸15は、装置フレーム11に固定された軸受ボス1
7に回転可能に取り付けられ、かつ、筒軸15の下端に
取り(1けた従動プーリー18と電動モータ19によっ
て駆動回転可能な駆動プーリー20とが伝動ベルト21
を介して連動連結されている。
The cylindrical shaft 15 has a bearing boss 1 fixed to the device frame 11.
A drive pulley 20 is rotatably attached to the shaft 7 and is attached to the lower end of the cylindrical shaft 15.
are interlocked and connected via.

処理液飛散防止用のカップ5は、上下に分離可能な上カ
ップ5aと下カップ5bとから構成され、その全体が、
処理液を回収する受皿部22aおよび排液口22bを備
えた平面視矩形状の外側カップ22内に設けられている
The cup 5 for preventing scattering of the processing liquid is composed of an upper cup 5a and a lower cup 5b that can be separated into upper and lower parts, and the entire cup 5 has the following structure.
It is provided in an outer cup 22 that is rectangular in plan view and includes a saucer portion 22a for collecting the processing liquid and a drain port 22b.

上カップ5aおよび下カップ5bは、それぞれエアシリ
ンダ23a、23bによって各別に昇降される支柱24
a、24bの上端に、連結金具25a、25bおよび支
持アーム26a、26bを介して連結されている。なお
、支柱24a、24bは、その移動を固定ガイドレール
27a、27bによって案内されるように構成されてい
る。
The upper cup 5a and the lower cup 5b are each supported by support columns 24 that are raised and lowered by air cylinders 23a and 23b, respectively.
a, 24b via connecting fittings 25a, 25b and support arms 26a, 26b. The pillars 24a and 24b are configured to be guided in their movement by fixed guide rails 27a and 27b.

また、外カップ22の上面には、上カップ5aが上昇し
て下カップ5bから分離した状態において、基板1の上
方へ洗浄用の純水を噴出供給する基板洗浄用上部ノズル
2日と、現像皿4上に洗浄用の純水を噴出供給する現像
皿洗浄用ノズル30が設けられている。
Further, on the upper surface of the outer cup 22, an upper nozzle for cleaning the substrate 2 which sprays pure water for cleaning above the substrate 1 when the upper cup 5a is raised and separated from the lower cup 5b, and a developing nozzle 2 are provided. A developing plate cleaning nozzle 30 is provided for spraying and supplying pure water for cleaning onto the plate 4.

また、基板洗浄用下部ノズル29(第2図参照)は、基
板1の下方から基板1の裏面へ向けて洗浄用の純水を噴
出供給するためのノズルであり、前記現像用ノズル3と
同様に鉛直軸芯周りで駆動回転される支軸によって、円
弧軌跡を描くように水平方向に移動できる。
Further, the lower substrate cleaning nozzle 29 (see FIG. 2) is a nozzle for jetting and supplying purified water for cleaning toward the back surface of the substrate 1 from below the substrate 1, and is similar to the developing nozzle 3. The support shaft is driven and rotated around the vertical axis, allowing it to move horizontally in a circular arc.

以上の構成により、基板1に現像処理を行うようになっ
ており、次に、その現像処理動作につき、第3図ないし
第5図を用いて説明する。
With the above configuration, the substrate 1 is subjected to development processing.Next, the development processing operation will be explained using FIGS. 3 to 5.

先ず、第3図の要部の側面図に示すように、基板1を、
基板搬入機構(図示せず)によって外カップ22の中央
開口部の真上に搬入し、次いで、エアシリンダ8を伸長
作動してスピンチャック2を上昇し、搬入された基板1
.を下面から吸着保持する。
First, as shown in the side view of the main part of FIG. 3, the substrate 1 is
The substrate 1 is loaded directly above the central opening of the outer cup 22 by a substrate loading mechanism (not shown), and then the air cylinder 8 is extended and the spin chuck 2 is raised to lift the loaded substrate 1.
.. is held by suction from the bottom.

その後、エアシリンダ8を短縮作動してスピンチャック
2を下降し、現像皿4と基板1の下面周辺との間に微小
間隙を残す位置で停止する。
Thereafter, the spin chuck 2 is lowered by shortening the air cylinder 8 and stopped at a position where a minute gap is left between the developing plate 4 and the periphery of the lower surface of the substrate 1.

次に、第4図の要部の側面図に示すように、上カップ5
aを上昇し、現像液供給ノズル3を揺動して基板1の上
方で水平方向に移動させ、現像液36を現像皿4内すな
わち基板1上に供給する。
Next, as shown in the side view of the main part in FIG.
a is raised, the developer supply nozzle 3 is oscillated and moved horizontally above the substrate 1, and the developer 36 is supplied into the developer tray 4, that is, onto the substrate 1.

このとき、スピンチャック2と現像皿4とを同方向に極
めて低い同速で回転し、現像液36の供給の開始直後か
ら基板1の全面が、より一層均−かつ迅速に現像液に接
するようにしても良い。
At this time, the spin chuck 2 and the developing plate 4 are rotated in the same direction at the same extremely low speed so that the entire surface of the substrate 1 comes into contact with the developer more evenly and quickly immediately after the start of supply of the developer 36. You can also do it.

そして、基板1上に所定量の現像液を供給したところで
現像液の供給を停止し、その後に、第5図の要部の側面
図に示すように、スピンチャック2を少し玉算させ、表
面張力によって、所定厚さの現像液36を基板1上の全
面に残留させ、その状態で所定時間静止して現像する。
Then, the supply of the developer is stopped when a predetermined amount of the developer has been supplied onto the substrate 1, and then, as shown in the side view of the main part of FIG. Due to the tension, a predetermined thickness of the developer 36 remains on the entire surface of the substrate 1, and the substrate 1 remains stationary for a predetermined period of time for development.

現像を完了するに伴い、スピンチャック2を更に上昇さ
せ、上部ノズル28、および、噴出口が基板1の裏面へ
向かう位置へ移動させた下部ノズル29から純水を基板
1の上面および下面に噴出供給するとともにスピンチャ
ック2を回転し、基板1を回転して現像処理の済んだ処
理済み液を飛散しながら洗浄(リンス)する。
As the development is completed, the spin chuck 2 is further raised, and pure water is jetted onto the top and bottom surfaces of the substrate 1 from the upper nozzle 28 and the lower nozzle 29, which has been moved to a position where the jet nozzle faces the back surface of the substrate 1. At the same time as the supply, the spin chuck 2 is rotated, and the substrate 1 is rotated to scatter and wash (rinse) the developed solution.

また、これと同時に、現像皿洗浄用ノズル30から純水
を供給しながら現像皿4を高速回転し、現像皿4を洗浄
する。
At the same time, the developing plate 4 is rotated at high speed while supplying pure water from the developing plate cleaning nozzle 30 to wash the developing plate 4.

洗浄完了後、下カップ5bを上昇させ、基板1を高速回
転することにより回転乾燥し、その次に、スピンチャッ
ク2を外側カップ22の上方にまで上昇させ、その現像
処理の済んだ基板1を基板搬出機構(図示せず)によっ
て搬出する。
After cleaning is completed, the lower cup 5b is raised, and the substrate 1 is rotated and dried by high speed rotation.Then, the spin chuck 2 is raised above the outer cup 22, and the substrate 1 that has undergone the development process is dried. It is carried out by a substrate carrying-out mechanism (not shown).

以上のような動作を1回ないし複数回繰り返して行うこ
とにより、基板1を順次供給しながら、その上のポジ型
レジストを現像して行くのである。
By repeating the above-mentioned operation once or a plurality of times, the positive resist on the substrate 1 is developed while sequentially supplying the substrate 1.

上記実施例では、基板1上に現像液36の層を形成する
のに、スピンチャック2を」−昇して基板1を上昇する
ように構成しているが、現像皿4を下降するようにして
も良く、それらの基板1と現像皿4とを相対的に移動す
る構成をして移動機構と総称する。
In the above embodiment, in order to form a layer of the developer 36 on the substrate 1, the spin chuck 2 is raised to raise the substrate 1, but the developing plate 4 is lowered. The structure for relatively moving the substrate 1 and the developing plate 4 is collectively referred to as a moving mechanism.

また、現像皿4の形状は、基板1の形状に応じて、四角
形などの角形やその他任意の形状に設定できる。
Further, the shape of the developing tray 4 can be set to a rectangular shape such as a quadrangle or any other arbitrary shape depending on the shape of the substrate 1.

〈発明の効果〉 以上説明したように、本発明の基板現像装置によれば、
シール材を用いずに基板上に現像液を供給貯留するから
、シール材の劣化に起因する回路パターンのシq−トや
断線発生を防止でき、しかも、表面張力を利用して現像
液を基板上に残し、現像皿と接触させない状態で現像す
るから、現像皿側から不純物が基板上に移行することも
防止でき、基板の上面全体に現像液の層を安定的に形成
して、基板上にポジ型レジストを歩留り良く現像できる
<Effects of the Invention> As explained above, according to the substrate developing device of the present invention,
Since the developer is supplied and stored on the substrate without using a sealant, it is possible to prevent circuit pattern sheets and disconnections caused by deterioration of the sealant, and moreover, the developer is applied to the substrate using surface tension. Since impurities are left on top of the substrate and developed without contacting the developing plate, it is possible to prevent impurities from transferring onto the substrate from the developing plate side, and a layer of developer is stably formed on the entire upper surface of the substrate. Positive resist can be developed with high yield.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は、本発明に係る基板現像装置の実施例を示し、第
1図は、本発明の基板現像装置の実施例を示す全体縦断
面図、第2図は、その一部切欠き平面図、第3図は、基
板搬入工程を示す要部の側面図、第4図は、現像液供給
工程を示す要部の側面図、第5図は、現像工程を示す要
部の側面図である。 1・・・基板 2・・・スピンチャック 4・・・現像皿 8・・・エアシリンダ
The drawings show an embodiment of the substrate developing device according to the present invention, FIG. 1 is an overall vertical sectional view showing the embodiment of the substrate developing device of the present invention, FIG. 2 is a partially cutaway plan view thereof, FIG. 3 is a side view of the main parts showing the substrate carrying process, FIG. 4 is a side view of the main parts showing the developer supply process, and FIG. 5 is a side view of the main parts showing the developing process. 1...Substrate 2...Spin chuck 4...Developing plate 8...Air cylinder

Claims (1)

【特許請求の範囲】 1)基板上のポジ型レジストを現像処理する基板現像装
置であって、 前記基板を水平姿勢で保持するスピンチャックと、 前記スピンチャック上に保持された前記基板の外周部を
囲み、基板の下面周辺に対して微小間隙がある状態で設
けられ、基板の上面に現像液を貯留する現像皿と、 前記スピンチャック上に保持された前記基板上に現像液
を供給するノズルと、 前記現像皿と前記スピンチャックとを、前記微小間隙が
ある状態とそれより離間して基板上に表面張力により現
像液を残す状態とにわたって相対的に移動する移動機構
とを備えたことを特徴とする基板現像装置。
[Scope of Claims] 1) A substrate developing device for developing a positive resist on a substrate, comprising: a spin chuck that holds the substrate in a horizontal position; and an outer peripheral portion of the substrate held on the spin chuck. a developing plate that surrounds the substrate and is provided with a minute gap around the bottom surface of the substrate and stores a developer on the top surface of the substrate; and a nozzle that supplies the developer onto the substrate held on the spin chuck. and a moving mechanism for relatively moving the development plate and the spin chuck between a state where the microgap is present and a state where the developing solution is left on the substrate due to surface tension at a distance from the microgap. Features of the substrate development device.
JP9663488A 1988-04-19 1988-04-19 Development processor for substrate Pending JPH01268028A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP9663488A JPH01268028A (en) 1988-04-19 1988-04-19 Development processor for substrate

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP9663488A JPH01268028A (en) 1988-04-19 1988-04-19 Development processor for substrate

Publications (1)

Publication Number Publication Date
JPH01268028A true JPH01268028A (en) 1989-10-25

Family

ID=14170265

Family Applications (1)

Application Number Title Priority Date Filing Date
JP9663488A Pending JPH01268028A (en) 1988-04-19 1988-04-19 Development processor for substrate

Country Status (1)

Country Link
JP (1) JPH01268028A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100341009B1 (en) * 1996-04-09 2002-11-29 동경 엘렉트론 주식회사 Apparatus for treating a substrate with resist and resist-treating method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100341009B1 (en) * 1996-04-09 2002-11-29 동경 엘렉트론 주식회사 Apparatus for treating a substrate with resist and resist-treating method

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