JPH01257347A - Gripping apparatus - Google Patents

Gripping apparatus

Info

Publication number
JPH01257347A
JPH01257347A JP63084005A JP8400588A JPH01257347A JP H01257347 A JPH01257347 A JP H01257347A JP 63084005 A JP63084005 A JP 63084005A JP 8400588 A JP8400588 A JP 8400588A JP H01257347 A JPH01257347 A JP H01257347A
Authority
JP
Japan
Prior art keywords
gripping
parts
claw
signal
gripping body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63084005A
Other languages
Japanese (ja)
Inventor
Keiichi Shibata
圭一 柴田
Hisashi Nishigaki
寿 西垣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP63084005A priority Critical patent/JPH01257347A/en
Publication of JPH01257347A publication Critical patent/JPH01257347A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To surely execute a gripping operation and to prevent an accident due to a drop during a transfer by a method wherein a heating part is installed at a laminated body at least on one out of a first gripping body and a second gripping body, the heating part is controlled by a signal from a sensor used to detect a gap between claw parts during a gripping action and a curvature amount of the gripping body is controlled. CONSTITUTION:A first gripping body 9 where claw parts 3a, 3b have been installed at its tip parts and a second gripping body 10 where a claw part 3c has been installed at its tip part in the same manner are coupled to a main body 6. At least one out of the first and second gripping bodies 9, 10 is a laminated body of two or more metals; heating parts 14a, 14b are installed at the laminated body. In addition, the following are provided: sensors 13a, 13b used to detect a gap between the claw parts 3a-3c during a gripping action; a control means used to control a curvature amount of the first and second gripping bodies 9, 10 by controlling the heating parts 14a, 14b. On the basis of a signal from the sensors 13a, 13b, the first and second gripping bodies 9, 10 follow a deformation of the claw parts 3a-3c and execute a gripping operation surely. By this setup, an object to be gripped can be gripped without being dropped during a transfer.

Description

【発明の詳細な説明】 [発明の目的] (産業上の利用分野) 本発明は例えば半導体ウェハ等の基板を把持する把持装
置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Object of the Invention] (Field of Industrial Application) The present invention relates to a gripping device for gripping a substrate such as a semiconductor wafer.

(従来の技術) 半導体技術の分野を例にとって説明すると、いわゆるウ
ェハプロセスでは半導体ウェハ(以下、基板と略す)は
各種工程に搬送され種々の処理を受ける。上記搬送にお
いて、ラックに垂直状態に収納された複数枚の基板を一
枚ずつ取出し、ベルトコンベアに移載する場合では、主
として真空吸着形式の把持装置が使われていた。この把
持装置は構造が簡単であるという利点はあるが、吸着方
向に直交する剪断力に対して著しく弱いために、把持し
ていた基板が落下してしまうことがしばしば生じ、把持
の信頼性に問題があった。これを解決するために、第7
図に示すような把持袋Wl(1)が提案され、使われて
いる。すなわち上記把持装置は、コ字状に分れた一対の
指部(2a) 、 (2b)を有しそれらの先端部に鼓
状の小ローラからなる爪部(la) 、(lb)を対象
位置に設けた第1の把持体(4)と、指部(2a) −
(2b)の間に位置しかつこれら指部の方向に沿って同
一面で進退自在になり、その先端部に上記爪部(3a)
 、(3b)と同形の爪部(3C)を設けた第2の把持
体(5〉と、上記第1.第2の把持体を収め第2の把持
体(5)の進退機構(図示せず)および第1の把持体(
4)用の緩衝機構(図示せず)とを内設した本体(6)
とを主要素として構成され、本体(8)をロボットアー
ム等に取付け、上記進退機構をロボットアームとともに
制御駆動し、各爪部(3a) 、 (3B) 、 (3
c)で図中−点鎖線で示す基板(7)の外側部をほぼ等
角度に把持して基板の移載を行うようにしている。とこ
ろで、把持装置(1)は、処理炉において不純物拡散や
、酸化膜生成等の高温処理を受けた後のボートに立てて
並べられた基板(7)の移載にも用いている。
(Prior Art) Taking the field of semiconductor technology as an example, in a so-called wafer process, a semiconductor wafer (hereinafter referred to as a substrate) is transported to various processes and subjected to various treatments. In the above-mentioned conveyance, when a plurality of substrates stored vertically in a rack are taken out one by one and transferred to a belt conveyor, a vacuum suction type gripping device is mainly used. Although this gripping device has the advantage of a simple structure, it is extremely weak against shearing forces perpendicular to the suction direction, which often causes the substrate it is gripping to fall, resulting in poor gripping reliability. There was a problem. In order to solve this problem, the seventh
A gripping bag Wl(1) as shown in the figure has been proposed and is in use. That is, the above-mentioned gripping device has a pair of finger parts (2a) and (2b) divided into a U-shape, and targets claw parts (la) and (lb) consisting of small drum-shaped rollers at their tips. The first grip body (4) provided at the position and the finger portion (2a) -
(2b) and can move forward and backward on the same plane along the direction of these finger parts, and the claw part (3a) is located at the tip of the finger part.
, (3b) and a second gripping body (5) provided with a claw portion (3C) having the same shape as that of (3b), and a movement mechanism (not shown) for the second gripping body (5) that accommodates the first and second gripping bodies. ) and the first gripper (
A main body (6) equipped with a buffer mechanism (not shown) for 4).
The main body (8) is attached to a robot arm, etc., and the advance/retreat mechanism is controlled and driven together with the robot arm, and each claw part (3a), (3B), (3
In c), the outer part of the substrate (7) indicated by the dashed line in the figure is gripped at approximately equal angles to transfer the substrate. Incidentally, the gripping device (1) is also used to transfer substrates (7) that are lined upright on a boat after being subjected to high-temperature treatments such as impurity diffusion and oxide film formation in a processing furnace.

(発明が解決しようとする課届) 上記把持装置(1)は、基板(7)が室温状態の場合に
は把持、移載上特に問題はないが、高温処理を受けた直
後の基板の把持には次のような問題が起きた。すなわち
、基板は薄く、また、酸化膜生成等により両面の線膨脹
率に差が生じ、片方に反ったり、あるいは不定形に変形
し、所定間隔で把持するように制御された各爪部(3a
) 、 (3b) 、 (3c)の内、特に中央の爪部
(3C)と基板(7)の外側部との間が開いてしまい、
十分な把持ができなかった。
(Certification to be Solved by the Invention) The above-mentioned gripping device (1) has no particular problem in gripping and transferring the substrate (7) when it is at room temperature, but it is difficult to grip the substrate (7) immediately after it has been subjected to high-temperature treatment. The following problems occurred. That is, the substrate is thin, and due to oxide film formation, etc., there is a difference in linear expansion coefficient on both sides, causing it to warp to one side or deform into an irregular shape.
), (3b), and (3c), especially the gap between the central claw part (3C) and the outer part of the board (7),
I couldn't grasp it enough.

このため、移載中基板を落とし、歩留り低下の一因とな
っていた。本発明はこのような事情に鑑みなされたもの
で、熱処理によって変形した基板等の把持物を、移載中
落下することなく把持可能な把持装置を提供することを
目的とする。
For this reason, the substrates were dropped during transfer, which caused a decrease in yield. The present invention was made in view of the above circumstances, and an object of the present invention is to provide a gripping device that can grip an object to be gripped, such as a substrate that has been deformed by heat treatment, without falling during transfer.

[発明の構成] (課届を解決するための手段と作用) 薄板状部材の外側部の少なくとも2点を支持する第1の
把持体と、この第1の把持体とで上記薄板状部材の外側
部の少なくとも3点を支持する第2の把持体と、これら
第1、第2の把持体の少なくとも一方は熱膨張係数の異
なる複数の金属の積層体になり、この積層体に設けられ
た加熱部と、上記第1、第2の把持体の少なくとも一方
に設けられ把持動作時における上記薄板状部材との間隙
を検出するセンサと、このセンサからの信号で上記加熱
部を制御して上記第1、第2の把持体の反り量を制御す
る制御手段とを備えた構成とし、センサからの信号で第
1、第2の把持体が薄板状部材の変形に沿うように変形
し、この変形した薄板状部材をか確実に把持する。
[Structure of the invention] (Means and effects for solving the problem) A first gripping body that supports at least two points on the outer side of the thin plate-like member, and a first gripping body that supports the thin plate-like member at least A second gripping body supporting at least three points on the outer side and at least one of the first and second gripping bodies are a laminate of a plurality of metals having different coefficients of thermal expansion, and the laminate is provided with a sensor provided on at least one of the first and second gripping bodies to detect a gap between the heating section and the thin plate member during a gripping operation; The configuration includes a control means for controlling the amount of warpage of the first and second gripping bodies, and the first and second gripping bodies are deformed to follow the deformation of the thin plate member in response to a signal from the sensor. To securely grip a deformed thin plate member.

(実施例) 以下、実施例を示す図面に基づいて本発明を説明する。(Example) EMBODIMENT OF THE INVENTION Hereinafter, the present invention will be described based on drawings showing examples.

なお、第7図と共通する部分には同一符号を付して説明
する。第1図において、(8)は把持装置で、コ字状に
分れた指部(9a) 、 (9b)を有しこれらの先端
部に爪部(3a) 、(3b)を設けた第1の把持体(
9)と、同じく、先端部に爪部(3C)を設けた第2の
把持体(lO)とを本体(6)に係合した構成になって
いる。上記第1、第2の把持体は本発明ではともに加熱
制御によって片側に反るようになっているが、構造的に
は同じ原理であり、説明の都合上、第2の把持体(10
)について説明する。
Note that parts common to those in FIG. 7 will be described with the same reference numerals. In Fig. 1, (8) is a gripping device, which has U-shaped finger parts (9a) and (9b), and has claw parts (3a) and (3b) at the tips of these fingers. 1 gripper (
9) and a second gripping body (lO) having a claw portion (3C) at the tip thereof are engaged with the main body (6). In the present invention, the first and second gripping bodies are both bent to one side by heating control, but they are structurally based on the same principle, and for convenience of explanation, the second gripping body (10
) will be explained.

すなわち、第2の把持体(10)において、本体(6)
から外部に出ている部分の長さは進退箇所を含めて約2
50mmで、爪部(3C)が設けられている先端部から
100麿−は3層構造の積層体になっている。すなわち
、幅10mm、厚さ1■で、材料がPe−Ni (36
%)合金からなり、本体(6)から通じている部材(1
1)と、この部材(11)の両面に接合され、幅および
厚さとも同寸で材料がN1(74%)−Cr(20%)
−Fe(6%)合金からなる部材(12a) 、 (1
2b)とで構成されている。したがって、爪部(3C)
は一方の部材(12a)上に設けられている。この爪部
(3C)の設けられた部材(12a)側において、爪部
(3C)に近接した箇所に受光した光量の変化を電気信
号に変換する光センサ1 (13a)が設けられ、爪部
(3c)から約50mm離れた箇所に同じく光センサ(
13b)が設けられている。反りのない標準の基板を爪
部(3a) 、 (3b) 、 (3c)間で把持した
ときの基板と、部材(13a)および光センサ1 、 
2 (13a)、(13b)との間の距離は約1mff
1となっている。また、この部材(12a)と他方の部
材(L2b)にはヒータ1 (14a)およびヒータ2
 (14b)がそれぞれ埋設されている。さらに、部材
(12a)、(12b)の先端部にはそれぞれ熱電対A
(15a)、B(15b)(図示せず)が取付けられて
いる。光センサ1 、 2 (13a)、 (13b)
とヒータ(14a) 、 (14b)および熱電対A 
、  B (15a) 、 (15b)はそれぞれのリ
ード線を介して制御回路部(I6)に接続されている。
That is, in the second gripping body (10), the main body (6)
The length of the part protruding from the outside is approximately 2
The length is 50 mm, and the length 100 mm from the tip where the claw part (3C) is provided is a laminate with a three-layer structure. That is, the width is 10 mm, the thickness is 1 cm, and the material is Pe-Ni (36
%) alloy and is connected to the main body (6) (1
1) is joined to both sides of this member (11), the width and thickness are the same, and the material is N1 (74%)-Cr (20%).
- Member (12a) made of Fe (6%) alloy, (1
2b). Therefore, the claw part (3C)
is provided on one member (12a). On the side of the member (12a) where the claw portion (3C) is provided, an optical sensor 1 (13a) that converts changes in the amount of light received into an electrical signal is provided at a location close to the claw portion (3C). The same optical sensor (
13b) is provided. A standard board with no warpage is gripped between the claws (3a), (3b), and (3c), the member (13a), and the optical sensor 1,
2 The distance between (13a) and (13b) is approximately 1mff
It is 1. Additionally, heater 1 (14a) and heater 2 are connected to this member (12a) and the other member (L2b).
(14b) are buried respectively. Further, thermocouples A are provided at the tips of the members (12a) and (12b), respectively.
(15a) and B (15b) (not shown) are attached. Optical sensors 1, 2 (13a), (13b)
and heaters (14a), (14b) and thermocouple A
, B (15a), and (15b) are connected to the control circuit section (I6) via respective lead wires.

この制御回路部(16)の構成は第3図に示すように、
上記光センサからの増幅された検出信号の大小を判定し
、大の信号だけを通し、その信号が光センサ1 (13
a)の場合には(+)、光センサ2 (13b)の場合
にはクー)の判別を付加した検出値として出力する判別
回路(17)と、設定値回路(18)からの設定値が入
力され、この設定値と上記判別された検出信号とを比較
する比較器(19)と、上記の比較で(+)および(−
)の信号に変換するA/D変換器(20)と、このA/
D変換器(20)からの信号に基づいてヒータ1,2の
いずれか一方を通電する電力供給制御部(21)と、A
/D変換器(20)の上記信号を入力し、熱電対A 、
  B (15a) 、 (15b)からの信号に基イ
テ電力供給制御部(21)のヒータ1.2に対する通電
をオン・オフする開閉制御部(22)とからなっている
The configuration of this control circuit section (16) is as shown in FIG.
The magnitude of the amplified detection signal from the optical sensor is determined, only the large signal is passed through, and the signal is transmitted to the optical sensor 1 (13
The set value from the set value circuit (18) and the set value from the set value circuit (18) and the set value are output from the set value circuit (18). A comparator (19) compares the set value that is input and the detected detection signal determined above, and (+) and (-
), the A/D converter (20) converts the signal into a signal of
a power supply control unit (21) that energizes either the heaters 1 or 2 based on the signal from the D converter (20);
Input the above signal of /D converter (20), thermocouple A,
It consists of an opening/closing control section (22) that turns on/off the power supply to the heater 1.2 of the power supply control section (21) based on the signals from B (15a) and (15b).

ここで設定値回路(18)では、第2の把持体(lO)
の上記挿入後の把持した状態で、反りのない標準の基板
を把持したときの光センサ1 、 2 (13a)、(
13b)の検出値が設定値として記憶されている。比較
器(19)テハ第1.第2の把持体(4) 、(10)
(7)上記把持動作の開始信号(25)が別経路で比較
器(19)に送られ、上記各設定値と検出値とが比較さ
れる。
Here, in the set value circuit (18), the second gripping body (lO)
Optical sensors 1, 2 (13a), (
The detected value of 13b) is stored as a set value. Comparator (19) Teha 1st. Second gripping body (4), (10)
(7) The grasping operation start signal (25) is sent to the comparator (19) via a separate route, and the respective set values and detected values are compared.

この比較において、差がない場合は比較器(19)から
はA/D変換器(20)には指令出力は零となり、光セ
ンサ1の検出値が光センサ2の検出値よりも大の場合は
、A/D変換器(20)より(+)の変位としてヒータ
1 (14a)が通電され、逆の場合は、A/D変換器
(20)より(−)の変位としてヒータ2(14b)通
電されるように処理する構成になっている。
In this comparison, if there is no difference, the command output from the comparator (19) to the A/D converter (20) will be zero, and if the detected value of optical sensor 1 is greater than the detected value of optical sensor 2. In this case, heater 1 (14a) is energized as a (+) displacement from the A/D converter (20), and in the opposite case, heater 2 (14b) is energized as a (-) displacement from the A/D converter (20). ) The configuration is such that the device is energized.

また、開閉制御部(22)には部材(11)と(12a
) 、部材(11)と(12b)との組合わせをそれぞ
れバイメタルとし、片持ばりに支持されたときの自由端
の垂直変化dから温度差Δtを設定する機能が備えられ
ている。その設定のために、上記機能にΔ1−dh/k
l   (ただし、hは板厚、1はバイメタル部分の長
さ、kはわん曲係数)の計算式が組込まれている。
The opening/closing control section (22) also includes members (11) and (12a).
), the combination of members (11) and (12b) is each made of bimetal, and a function is provided to set the temperature difference Δt from the vertical change d of the free end when supported by a cantilever. For that setting, Δ1-dh/k is added to the above function.
A calculation formula for 1 (where h is the plate thickness, 1 is the length of the bimetallic part, and k is the curvature coefficient) is incorporated.

一方、第1の把持体(9)では指部(9a) 、 (9
b)を繋ぐ共通部(9c)の部分が第1の把持体(10
)の上記3層構造と同様の積層体になり、矢印X方向に
おいて紙面垂直方向に反る構成になっている。すなわち
、電力供給制御部(21)から出力され、第2の把持体
(10)とは別系統の回路線(30)が設けられ、第1
の把持体(9)に組込まれているヒータ3.4(ともに
図示せず)が第2の把持体(10)と同方向に反るよう
に上記回路線(30)が選択されて加熱される。なお、
この第1の把持体(9)においても、温度制御用に熱電
対等のセンサが用いられ第2の把持体と同様に反り量が
所定値に保たれるようになっている。
On the other hand, in the first gripping body (9), the fingers (9a), (9
The common part (9c) that connects the first gripping body (10
) has a laminate similar to the above-mentioned three-layer structure, and is warped in the direction of arrow X in a direction perpendicular to the plane of the paper. That is, the power is output from the power supply control unit (21), a circuit line (30) of a separate system from the second gripping body (10) is provided, and the first
The circuit wire (30) is selected and heated so that the heater 3.4 (both not shown) incorporated in the second gripper (9) warps in the same direction as the second gripper (10). Ru. In addition,
In this first gripping body (9) as well, a sensor such as a thermocouple is used for temperature control so that the amount of warpage is maintained at a predetermined value similarly to the second gripping body.

上記構成の作用について次に説明する。第4図は処理炉
から引出され、ボード上約4.81ピツチで載置された
直径4インチへ基板(7a)乃至(7n)で、この処理
において例えば断面が円弧状に反った場合、いわゆる矢
高で表わせられる変形量は平均して0.5〜1.0II
llllで、2mm程度変形する場合もある。
The operation of the above configuration will be explained next. Figure 4 shows substrates (7a) to (7n) with a diameter of 4 inches pulled out from the processing furnace and placed on the board at approximately 4.81 pitches. The amount of deformation expressed by arrow height is 0.5 to 1.0 II on average
In some cases, it may be deformed by about 2 mm.

これら基板群に対して把持装置(9)がロボットアーム
等で所定位置に移動され把持動作が開始される。把持動
作において、例えば変形量dが1.Oma+の基板(7
a)を把持するとして、第5図に示すように把持時の光
センサ1 、 2 (13a)、(13b)との間の距
離がその変形fa(lam)に応じた光量として検出さ
れ、増幅器(図示せず)を経て判別回路(17)に入力
される。基板(7a)は断面が円弧状に反っているので
、光センサ1の検出値が光センサ2の検出値より大とし
て算出され、判別回路(17)より(+)の信号として
比較器(19)に入力される。比較器(19)では設定
値と上記算出された検出値とが比較され、その差信号が
A/D変換器(20)に送られる。
A gripping device (9) is moved to a predetermined position by a robot arm or the like, and a gripping operation is started for these substrate groups. In the gripping operation, for example, the amount of deformation d is 1. Oma+ board (7
As shown in FIG. (not shown) and is input to the discrimination circuit (17). Since the board (7a) has an arcuate cross section, the detection value of the optical sensor 1 is calculated as being larger than the detection value of the optical sensor 2, and the discrimination circuit (17) sends the comparator (19) as a (+) signal. ) is input. The comparator (19) compares the set value and the calculated detection value, and sends the difference signal to the A/D converter (20).

A/D変換器(20)から(+)の変位指令信号が出力
される。この変位指令信号はヒータ1 (14a)を通
電するとともに、第1の把持体(9)側の同方向に反る
ように選択されたヒータ(3または4)を通電し、さら
に開閉制御部(22)に送られる。この開閉制御部(2
2)では光センサ1 (13a)の検出値に基づいた開
閉動作が行われる。すなわち、上記の例では、基板(7
a)の先端部と光センサ1 (13a)との間の距離は
実際には2mmであるが、変形量はl■として検出され
、上記通電により第2の把持体(10)はバイメタルの
原理で基板(7a)に沿って変形される。この場合、通
電による加熱温度すなわち、温度差は上記式から約23
度と計算され、この温度が保たれように制御される。以
上の制御動作で第6図に示すように、変形した基板も第
2の把持体(10)がその変形に沿うように変形され、
同時に第1の把持体(9)も同じように反って変形させ
たので、爪部(3c)に基板が確実に把持されるように
なった。
A (+) displacement command signal is output from the A/D converter (20). This displacement command signal energizes the heater 1 (14a), energizes the heater (3 or 4) selected to warp in the same direction on the first gripping body (9) side, and further energizes the opening/closing control unit ( 22). This opening/closing control section (2
In 2), the opening/closing operation is performed based on the detected value of the optical sensor 1 (13a). That is, in the above example, the substrate (7
Although the distance between the tip of a) and the optical sensor 1 (13a) is actually 2 mm, the amount of deformation is detected as l■, and the second gripping body (10) is deformed along the substrate (7a). In this case, the heating temperature due to energization, that is, the temperature difference, is approximately 23
temperature is calculated and controlled to maintain this temperature. With the above control operation, as shown in FIG. 6, the deformed substrate is also deformed so that the second gripping body (10) follows the deformation,
At the same time, the first gripping body (9) was also warped and deformed in the same way, so that the substrate was reliably gripped by the claws (3c).

なお、上記実施例では光センサ1 (13a)との間が
開くように変形した基板の例を説明したが、光センサ1
 (13a)との間が微少で光センサ2 (13b)と
の間が開くように変形した場合は、光センサ2(Hb)
の検出値に基づいて上記実施例に準じて第2の把持体(
10)が制御される。また、変形のために3層構造とし
たが、2層構造にして一方のみに反るようにしてもよい
In addition, in the above embodiment, an example of the substrate deformed so that there is a gap between the optical sensor 1 (13a) and the optical sensor 1 (13a) was explained.
(13a) is slightly deformed so that the gap with optical sensor 2 (13b) opens, optical sensor 2 (Hb)
Based on the detected value of the second gripper (
10) is controlled. Moreover, although the three-layer structure is used for deformation, it may be made to have a two-layer structure so that only one side is warped.

[発明の効果] 把持が確実となり、移送中の落下事故が解消されるよう
になったので、生産性および歩留り向上に寄与すること
ができた。
[Effects of the Invention] Gripping became reliable and falling accidents during transportation were eliminated, contributing to improved productivity and yield.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す平面図、第2図は第1
図の要部を示す斜視図、第3図は制御回路部を示すブロ
ック図、第4図は熱処理後のボード上の基板を示す断面
図、第5図は変形制御前の把持状態を示す図、第6図は
変形制御後の端状態を示す図、第7図は従来例を示す平
面図である。 (3a)、(3B>、(3c)・・・爪部(4)・・・
第1の把持体 (10)・・・第2の把持体 (11)、(12a)、(12b) −−、部材(13
a)  争・・光センサ1 (13b)  ・・ψ光センサ2 (tea) ・・・ヒータ1(加熱部)(14b)  
・・・ヒータ2(加熱部)(te)・・・制御回路部(
制御手段)第1図 第 2 図 爵九拳九 電電 封対 A 第3図 114  rA
Fig. 1 is a plan view showing one embodiment of the present invention, and Fig. 2 is a plan view showing an embodiment of the present invention.
FIG. 3 is a block diagram showing the control circuit, FIG. 4 is a sectional view showing the substrate on the board after heat treatment, and FIG. 5 is a diagram showing the gripping state before deformation control. , FIG. 6 is a diagram showing the end state after deformation control, and FIG. 7 is a plan view showing a conventional example. (3a), (3B>, (3c)...Claw part (4)...
First gripping body (10)...Second gripping body (11), (12a), (12b) --, member (13
a) Competition... Optical sensor 1 (13b)... ψ optical sensor 2 (tea)... Heater 1 (heating part) (14b)
... Heater 2 (heating section) (te) ... Control circuit section (
Control means) Figure 1 Figure 2 Figure 3 114 rA

Claims (1)

【特許請求の範囲】[Claims]  薄板状部材の外側部の少なくとも2点を支持する第1
の把持体と、この第1の把持体とで上記薄板状部材の外
側部の少なくとも3点を支持する第2の把持体と、これ
ら第1、第2の把持体の少なくとも一方は熱膨脹係数の
異なる複数の金属の積層体になり、この積層体に設けら
れた加熱部と、上記第1、第2の把持体の少なくとも一
方に設けられ把持動作時における上記薄板状部材との間
隙を検出するセンサと、このセンサからの信号で上記加
熱部を制御して上記第1、第2の把持体の反り量を制御
する制御手段とを備えたことを特徴とする把持装置。
A first support member supporting at least two points on the outer side of the thin plate member.
a second gripping body that supports at least three points on the outer side of the thin plate-like member with the first gripping body; and at least one of the first and second gripping bodies has a coefficient of thermal expansion. A laminate of a plurality of different metals is formed, and a gap between a heating section provided on the laminate and the thin plate member provided on at least one of the first and second gripping bodies during a gripping operation is detected. A gripping device comprising: a sensor; and a control means for controlling the heating section using a signal from the sensor to control the amount of warpage of the first and second gripping bodies.
JP63084005A 1988-04-07 1988-04-07 Gripping apparatus Pending JPH01257347A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63084005A JPH01257347A (en) 1988-04-07 1988-04-07 Gripping apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63084005A JPH01257347A (en) 1988-04-07 1988-04-07 Gripping apparatus

Publications (1)

Publication Number Publication Date
JPH01257347A true JPH01257347A (en) 1989-10-13

Family

ID=13818484

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63084005A Pending JPH01257347A (en) 1988-04-07 1988-04-07 Gripping apparatus

Country Status (1)

Country Link
JP (1) JPH01257347A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5980187A (en) * 1997-04-16 1999-11-09 Kla-Tencor Corporation Mechanism for transporting semiconductor-process masks
JP2007067334A (en) * 2005-09-02 2007-03-15 Denso Corp Manufacturing method of semiconductor device and manufacturing device used for executing the same
JP2007266221A (en) * 2006-03-28 2007-10-11 Future Vision:Kk Substrate support member, substrate baking furnace, substrate conveyer, and substrate processing method
JP2010129674A (en) * 2008-11-26 2010-06-10 Shin Etsu Polymer Co Ltd Substrate storage container, clamp hand, and method of taking out substrate
JP2014032992A (en) * 2012-08-01 2014-02-20 Mitsuboshi Diamond Industrial Co Ltd Substrate holding ring gripping mechanism
CN106113077A (en) * 2016-07-29 2016-11-16 苏州高通机械科技有限公司 A kind of crawl mechanical hand with sub-arm

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5980187A (en) * 1997-04-16 1999-11-09 Kla-Tencor Corporation Mechanism for transporting semiconductor-process masks
JP2007067334A (en) * 2005-09-02 2007-03-15 Denso Corp Manufacturing method of semiconductor device and manufacturing device used for executing the same
JP4652177B2 (en) * 2005-09-02 2011-03-16 株式会社デンソー Manufacturing method of semiconductor device and manufacturing apparatus used for carrying out the manufacturing method
JP2007266221A (en) * 2006-03-28 2007-10-11 Future Vision:Kk Substrate support member, substrate baking furnace, substrate conveyer, and substrate processing method
JP4571089B2 (en) * 2006-03-28 2010-10-27 株式会社フューチャービジョン Substrate support member, substrate baking furnace, substrate transfer apparatus, and substrate processing method
JP2010129674A (en) * 2008-11-26 2010-06-10 Shin Etsu Polymer Co Ltd Substrate storage container, clamp hand, and method of taking out substrate
JP2014032992A (en) * 2012-08-01 2014-02-20 Mitsuboshi Diamond Industrial Co Ltd Substrate holding ring gripping mechanism
CN106113077A (en) * 2016-07-29 2016-11-16 苏州高通机械科技有限公司 A kind of crawl mechanical hand with sub-arm

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