JPH01231046A - Method for developing photoresist - Google Patents

Method for developing photoresist

Info

Publication number
JPH01231046A
JPH01231046A JP5600488A JP5600488A JPH01231046A JP H01231046 A JPH01231046 A JP H01231046A JP 5600488 A JP5600488 A JP 5600488A JP 5600488 A JP5600488 A JP 5600488A JP H01231046 A JPH01231046 A JP H01231046A
Authority
JP
Japan
Prior art keywords
master disk
developer
master
washing
water
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP5600488A
Other languages
Japanese (ja)
Inventor
Hiroshi Komata
小俣 宏志
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP5600488A priority Critical patent/JPH01231046A/en
Publication of JPH01231046A publication Critical patent/JPH01231046A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26Processing photosensitive materials; Apparatus therefor
    • G03F7/30Imagewise removal using liquid means
    • G03F7/3021Imagewise removal using liquid means from a wafer supported on a rotating chuck

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Manufacturing Optical Record Carriers (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To prevent the generation of defects due to a residual developer in the following step by washing the developer adhered to the surface and back faces of a master disk with a water after developing it to remove the developer, followed by drying the plate. CONSTITUTION:The master disk 1 having an exposed photoresist film on the surface of the disk is mounted and fixed on a turn table 2, and a water is jetted on the master disk from a washing nozzle 3 and a back face washing nozzle 5 provided facing to the surface and back faces of the master disk respectively, while rotating the master disk 1, thereby removing the developer existing round about the surface and back faces of the master disk. Next, a dry air or a nitrogen gas coming from a dry nozzle 4 is sprayed towards from the center of the master disk 1 to the outer circumference thereof to dry the master disk, and at the same time, similarly, the back face of the disk 1 is dried by the back face dry nozzle 6. Thus, as the residue of the developer is not carried over to a following step, the generation of the defects in the following step is reduced.

Description

【発明の詳細な説明】 [産業上の利用分野コ 本発明は、ビデオディスク等の光学的記録再生装置に使
用する光ディスクの原盤の製作に用いるフォトレジスト
の現像方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a method for developing a photoresist used in the production of master discs for optical discs used in optical recording and reproducing devices such as video discs.

[従来の技術] 従来、光デイスク用原盤の現像工程は、パターンを形成
する表面を上向きにしてターンテーブル上に固定し、回
転させながら現像・水洗・乾燥処理か行われていた。特
に、原盤の表面の欠陥を減少させるために、はねかえり
防止板を用いたり、また水洗水の水温を制御する対策か
取られて来た。これにより現像工程における欠陥の発生
は減少した。
[Prior Art] Conventionally, in the development process of an optical disk master, the surface on which the pattern is to be formed is fixed on a turntable with the surface facing upward, and development, washing, and drying processes are performed while rotating the disc. In particular, measures have been taken to reduce defects on the surface of master discs, such as using splash prevention plates and controlling the temperature of the washing water. This reduced the occurrence of defects during the development process.

[発明か解決しようとする課題] しかしながら、上記従来例ては、第3図および第4図に
示す様に、原盤1の表面に形成されたレジスト面側だけ
の水洗、乾燥が行なわれているために、原!!!ilの
表面のみか積極的に水洗、乾燥されていた。この場合に
は、原盤1の裏面にまわり込んだ現像液は除去されない
でそのまま残り、仮に水洗水か裏面にまわり込んでも完
全に水洗することができなかった。当然、この状態で原
盤をオーブンに入れて乾燥すれば、現像液の残渣か粉束
状になって乾燥し、オーブンたけでなく後工程のすべて
の装置を汚染することになる。従って、原盤1の裏面の
現像液の残渣を放置すれば、現像工程での欠陥発生はな
くても最終的には後工程での欠陥発生を誘発することに
なる。
[Problem to be solved by the invention] However, in the above conventional example, as shown in FIGS. 3 and 4, only the resist surface side formed on the surface of the master 1 is washed and dried. For you, Hara! ! ! Only the surface of the il was actively washed and dried. In this case, the developing solution that had gotten around to the back side of the master 1 was not removed and remained as it was, and even if the washing water had gotten around to the back side, it could not be completely washed away. Naturally, if the original disc is placed in an oven and dried in this state, the residue of the developer will dry in the form of a powder bundle, contaminating not only the oven but also all the equipment used in subsequent processes. Therefore, if the developer residue on the back surface of the master 1 is left, even if no defects occur in the developing process, it will eventually induce defects in the subsequent process.

本発明は、この様な従来の欠点を改善するためになされ
たものであり、表面に露光処理されたフォトレジスト膜
を有する原盤を回転させながら、現像・水洗・乾燥処理
を行う現像工程において、現像後の原盤の表面のみなら
ず裏面に付着している現像液を完全に水洗して除去し、
残存する現像液による次工程での欠陥の発生を防止する
フォトレジストの現像方法を提供することを目的とする
ものである。
The present invention has been made in order to improve such conventional drawbacks, and in the development process in which development, washing, and drying are performed while rotating a master having a photoresist film exposed to light on the surface, After development, the developing solution adhering not only to the front surface but also to the back surface of the master disc is completely removed by washing with water.
It is an object of the present invention to provide a photoresist developing method that prevents defects from occurring in the next step due to remaining developer.

[課題を解決するための手段] 即ち、本発明は、表面に露光処理されたフォトレジスト
膜を有する原盤を回転させながら、現像・水洗・乾燥処
理を行う現像工程において、現像後に原盤の表面および
裏面に付着している現像液を水洗して除去し、次いて乾
燥処理することな特徴とするフォトレジストの現像方法
に係わるものである。
[Means for Solving the Problems] That is, the present invention provides a method for developing a master having a photoresist film exposed to light on its surface in a developing process in which development, water washing, and drying are performed while rotating a master having a photoresist film exposed to light on the surface. This invention relates to a method for developing a photoresist, which is characterized in that the developing solution adhering to the back surface is removed by washing with water, and then a drying process is performed.

本発明において、現像後に原盤の表面および裏面に付着
している現像液を水洗して除去する方法としては、回転
している原盤の表面および裏面に対向して設けられたノ
ズルから水を噴射して現像液を除去する方法か好ましい
In the present invention, the method of washing and removing the developing solution adhering to the front and back surfaces of the master after development involves spraying water from nozzles provided opposite to the front and back surfaces of the rotating master. It is preferable to remove the developer using a method.

[作用コ 本発明によれば、原盤の表面を水洗する水洗ノズルだけ
てなく原盤の裏面を水洗する裏面水洗ノズルを設け、現
像後の原盤を水洗することにより、!盤の裏面にまわり
込んだ現像液を原盤の表面と同様に完全に除去し、次い
で表面および裏面乾燥ノズルを用いて原盤の表面および
裏面を完全に乾燥することによって後工程への現像液の
残渣等のゴミの持込みを防止し、後工程ての欠陥の発生
を抑えられる。
[Function] According to the present invention, not only a water washing nozzle for washing the front surface of the master disc but also a back washing nozzle for washing the back surface of the master disc is provided, and the master disc after development is washed with water! The developer that has gotten around to the back side of the disc is completely removed in the same way as the front surface of the master disc, and then the front and back sides of the master disc are completely dried using the front and back drying nozzles, thereby removing the developer residue from the subsequent process. This prevents foreign matter from being brought in, and reduces the occurrence of defects in post-processing.

[実施例] 以下、実施例を示し本発明をさらに具体的に説明する。[Example] Hereinafter, the present invention will be explained in more detail with reference to Examples.

実施例1 第1図は本発明のフォトレジストの現像方法における水
洗処理工程を示す説明図および第2図は乾燥処理工程を
示す説明図である。同図ににおいて、3は水洗ノズル、
5は裏面水洗ノズルである。
Example 1 FIG. 1 is an explanatory diagram showing a water washing process in the photoresist developing method of the present invention, and FIG. 2 is an explanatory diagram showing a drying process. In the same figure, 3 is a water washing nozzle;
5 is a back side water washing nozzle.

ターンテーブル2上に、表面に露光処理されたフォトレ
ジスト膜を有するg盤1を載置して固定し、該原盤1を
回転させながら、TX盤の表面および裏面に対向して設
けられた水洗ノズル3および裏面水洗ノズル5から水を
噴射し、原盤lの表面および裏面にまわり込んだ現像液
を除去する。
A G disk 1 having an exposed photoresist film on its surface is placed and fixed on a turntable 2, and while the master disk 1 is rotated, water washers provided opposite to the front and back surfaces of the TX disk are placed and fixed. Water is injected from the nozzle 3 and the back washing nozzle 5 to remove the developer that has gotten around to the front and back surfaces of the master l.

次いで、乾燥ノズル4から乾燥エアーまたは窒素ガスを
原i1の中心から外周に向って吹きつけて乾燥を行うと
同時に原盤1の裏面も裏面乾燥ノズル6により乾燥を行
なう。
Next, drying air or nitrogen gas is blown from the drying nozzle 4 from the center to the outer periphery of the original i1 to dry it, and at the same time, the back side of the original 1 is also dried using the back side drying nozzle 6.

実施例2 水洗処理時において、原盤lとターンテーブル2のある
現像チャンバー内を水洗水で満たし、原i1を水洗水中
に沈めて水洗を行うことによっても実施例1と同様の効
果が得られる。
Example 2 During the washing process, the same effect as in Example 1 can also be obtained by filling the developing chamber in which the master l and turntable 2 are located with washing water, and submerging the original i1 in the washing water to perform washing.

[発明の効果] 以上説明した様に、本発明によれば、後工程への現像液
の残渣の持込みが無くなったことにより、後工程での欠
陥の発生が減少したたけでなく、ターンテーブルに付着
していた現像液も除去されるために現像工程終了後の現
像チャンバー内の水洗が不必要になり、作業の簡略化か
可能となった。
[Effects of the Invention] As explained above, according to the present invention, since developer residue is no longer carried into the post-process, not only the occurrence of defects in the post-process is reduced, but also the turntable is improved. Since the adhering developer is also removed, there is no need to wash the inside of the development chamber with water after the development process is completed, making it possible to simplify the work.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明のフォトレジストの現像方法における水
洗処理工程を示す説明図、第2図はその乾燥処理工程を
示す説明図、第3図は従来のフォトレジストの現像方法
における水洗処理工程を示す説明図および第4図はその
乾燥処理工程を示す説明図である。 1・・・原盤      2・・・ターンテーブル3・
・・水洗ノズル   4・・・乾燥ノズル°5・・・裏
面水洗ノズル 6・・・裏面乾燥ノズル第1図 第2図 第3図 第4図
FIG. 1 is an explanatory diagram showing the water washing process in the photoresist developing method of the present invention, FIG. 2 is an explanatory diagram showing the drying process, and FIG. 3 is an explanatory diagram showing the water washing process in the conventional photoresist developing method. The illustrated diagram and FIG. 4 are explanatory diagrams showing the drying process. 1...Master disc 2...Turntable 3.
...Water washing nozzle 4...Drying nozzle °5...Back washing nozzle 6...Back drying nozzle Fig. 1 Fig. 2 Fig. 3 Fig. 4

Claims (2)

【特許請求の範囲】[Claims] (1)表面に露光処理されたフォトレジスト膜を有する
原盤を回転させながら、現像・水洗・乾燥処理を行う現
像工程において、現像後に原盤の表面および裏面に付着
している現像液を水洗して除去し、次いで乾燥処理する
ことを特徴とするフォトレジストの現像方法。
(1) In the development process in which development, washing, and drying are performed while rotating the master having a photoresist film that has been exposed to light on the surface, the developing solution adhering to the front and back surfaces of the master is washed with water after development. A method for developing a photoresist, which comprises removing and then drying.
(2)回転している原盤の表面および裏面に対向して設
けられたノズルから水を噴射して現像液を除去する請求
項1記載のフォトレジストの現像方法。
(2) The photoresist developing method according to claim 1, wherein the developer is removed by jetting water from nozzles provided opposite to the front and back surfaces of the rotating master.
JP5600488A 1988-03-11 1988-03-11 Method for developing photoresist Pending JPH01231046A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5600488A JPH01231046A (en) 1988-03-11 1988-03-11 Method for developing photoresist

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5600488A JPH01231046A (en) 1988-03-11 1988-03-11 Method for developing photoresist

Publications (1)

Publication Number Publication Date
JPH01231046A true JPH01231046A (en) 1989-09-14

Family

ID=13014916

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5600488A Pending JPH01231046A (en) 1988-03-11 1988-03-11 Method for developing photoresist

Country Status (1)

Country Link
JP (1) JPH01231046A (en)

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