JPH01215056A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPH01215056A
JPH01215056A JP63039488A JP3948888A JPH01215056A JP H01215056 A JPH01215056 A JP H01215056A JP 63039488 A JP63039488 A JP 63039488A JP 3948888 A JP3948888 A JP 3948888A JP H01215056 A JPH01215056 A JP H01215056A
Authority
JP
Japan
Prior art keywords
active layer
channel mosfet
cmos
channel
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63039488A
Other languages
Japanese (ja)
Inventor
Takemitsu Kunio
國尾 武光
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
National Institute of Advanced Industrial Science and Technology AIST
Original Assignee
Agency of Industrial Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agency of Industrial Science and Technology filed Critical Agency of Industrial Science and Technology
Priority to JP63039488A priority Critical patent/JPH01215056A/en
Publication of JPH01215056A publication Critical patent/JPH01215056A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To shorten the time of a design by a method wherein field-effect type transistors having different conductivity type are provided to two active layers, a CMOS circuit is constituted, blocks are assigned to the circuit by one functions, functional blocks are laminated, one functional blocks composed of the two active layers being a unit, so that a large functional block is organized. CONSTITUTION:An n channel MOSFET 2 is manufactured into an Si substrate, employing the Si substrate, etc., as an active layer 1, and a p channel MOSFET 4 is prepared into an active layer 3. These n channel MOSFET and p channel MOSFET are connected by a wiring 5, thus manufacturing a CMOS circuit. A CMOS.SRAM is constructed to the active layer 1 and an active layer 2 as functional blocks at that time. An n channel MOSFET 7 is prepared into an active layer 6 on the active layer 3, and a p channel MOSFET 9 is manufactured into an active layer 8 on the active layer 6. These both channel MOSFETs are connected by a wiring 10 and a CMOS circuit is constituted, and an arithmetic operation unit(ALU) is produced. Since the CMOS.SRAM and the CMOS ALU are connected by a wiring 11 at that time, a small-sized microprocessor is organized.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は半導体集積回路に関する。[Detailed description of the invention] (Industrial application field) The present invention relates to semiconductor integrated circuits.

(従来の技術) 近来、半導体回路において、半導体素子を含む能動層を
積層化した半導体素子、いわゆる3次元回路素子が提案
、試作されている。その代表的な例として、出端らによ
る1986インタナシ會ナル エレクトロン デバイセ
ス ミーティング テクニカル ダイジェスト(Int
ernational Electron Devic
esMeeting Technical Diges
t) 435ページから438ページに掲載された論文
がある。この例においては、0MO8−SRAMを1つ
の能動層中に作製し、それを′2層積層化した半導体回
路を作製している。
(Prior Art) Recently, in semiconductor circuits, semiconductor elements in which active layers including semiconductor elements are laminated, so-called three-dimensional circuit elements, have been proposed and prototyped. A typical example is the 1986 International Electron Devices Meeting Technical Digest (Int.
ernational Electron Device
esMeeting Technical Diges
t) There are papers published on pages 435 to 438. In this example, a 0MO8-SRAM is fabricated in one active layer, and a semiconductor circuit is fabricated in which two layers are laminated.

(発明が解決しようとする課題) 之の回路構成では、2つの能動層にそれぞれ0MO8−
8RAMを配置しているため、1層CMO8−8RAM
で必要とする作製プロセスの期間の約2倍が必要となり
、プロセス期間は長くなる。さらに、マスク枚数も2倍
になるなどの問題点がある。
(Problem to be solved by the invention) In this circuit configuration, each of the two active layers has 0 MO8-
Since 8 RAM is arranged, 1 layer CMO 8-8 RAM
This requires about twice the period of the manufacturing process required in the previous example, and the process period becomes longer. Furthermore, there are other problems such as the number of masks being doubled.

本発明の目的は多層、積層化した半導体素子の作製プロ
セス期間の短縮及び設計時間の短縮を可能とする半導体
回路の構成方法を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a method for configuring a semiconductor circuit, which makes it possible to shorten the manufacturing process period and design time for a multilayered or stacked semiconductor element.

(課題を解決するための手段) 本発明は半導体素子を含む能動層が複数層積層された半
導体集積回路において、第1伝導をの電界効果型トラン
ジスタを第1の半導体素子能動層に、第2伝導型の電界
効果型トランジスタを前記第1の半導体素子能動層上に
積層された第2の半導体素子能動層上に配置されてなる
相補型−半導体集積回路に1つの機能ブロックを構成し
、これら積層化された機能ブロックを単位として、順次
積層化していくことを特徴とする半導体集積回路である
(Means for Solving the Problems) The present invention provides a semiconductor integrated circuit in which a plurality of active layers including semiconductor elements are laminated, in which a field effect transistor of a first conductivity is placed in a first semiconductor element active layer and a second One functional block is configured in a complementary semiconductor integrated circuit in which a conduction type field effect transistor is arranged on a second semiconductor element active layer laminated on the first semiconductor element active layer, and these This is a semiconductor integrated circuit characterized by sequentially stacking stacked functional blocks as units.

(作用) 1つの能動層中にpチャネルトランジスタ(またはnチ
ャネルトランジスタ)を配置し、その上に存在する能動
層中にnチャネルトランジスタ(またはpチャネルトラ
ンジスタ)を配置し、それらの2つの能動層を用いて0
M08回路を構成すると、ウェル形成イオン注入やチャ
ネルドープイオン注入用のマスクが不要となるため前述
の文献で示した例よりもマスク枚数が減り、作製プロセ
スの期間も短縮できる。さらに、2つの能動層で構成さ
れた0M08回路を用いて同じ層内で1つの機能ブロッ
クを構成し、それを積層化し、さらに大きな機能ブロッ
クを構成して行けば、多数の能動層全体で一つの機能を
有するように設計する場合よりも、設計に要する時間を
短縮することが可能である。
(Function) A p-channel transistor (or n-channel transistor) is placed in one active layer, an n-channel transistor (or p-channel transistor) is placed in the active layer above it, and these two active layers 0 using
When configuring the M08 circuit, masks for well formation ion implantation and channel doping ion implantation are not required, so the number of masks can be reduced compared to the example shown in the above-mentioned literature, and the period of the manufacturing process can also be shortened. Furthermore, if you construct one functional block within the same layer using the 0M08 circuit composed of two active layers, and then stack them to construct a larger functional block, it is possible to create a single functional block across multiple active layers. It is possible to reduce the time required for design compared to designing with one function.

(実施例) 以下に、第1図に示した実施例を参照・して詳細に説明
する。
(Example) Hereinafter, a detailed explanation will be given with reference to the example shown in FIG.

第1図において、Si基板などを第1の能動層1として
、その中にnチャネルMO8FET2を作製する。その
後、レーザアニール技術やEBアニール技術を用いてS
OI (8i1icon on In5ulator)
技術を用いて、第2の能動層3中にpチャネルMO8F
ET4を作製する。これらのnチャネルMO8FETと
PチャネルMO8FETを選択タングステンCVD法を
用いて作製した配線5によって結線することにより、0
M08回路を作製する。このとき、第1の能動層1と第
2の能動層2に、第1の機能ブロックとして0MO8−
SRAMを構成す、゛る。次に、第2の能動層3上の第
3の能動層6中にnチャネルMO8FET7を作製し、
さらに第3の能動層6上の第4の能動層8中にpチャネ
ルMO8FET9を作製する。これらの両チャネルMO
8FETを配線10によって結線することにより0M0
8回路を構成し、第2の機能ブロックとして算術演算ユ
ニット(ALU)を作製する。、このとき、第1の機能
ブロックCMO8・SRAMと第2の機能ブロックCM
O8−ALUは配線11で結線されているため、2つの
機能ブロック、例えば小型マイクロプロセッサが構成さ
れている。
In FIG. 1, a Si substrate or the like is used as a first active layer 1, and an n-channel MO8FET 2 is fabricated therein. After that, using laser annealing technology and EB annealing technology, S
OI (8i1icon on In5ulator)
Using technology, p-channel MO8F in the second active layer 3
Create ET4. By connecting these n-channel MO8FET and P-channel MO8FET with wiring 5 made using selective tungsten CVD method, 0
Create the M08 circuit. At this time, the first active layer 1 and the second active layer 2 are provided with 0MO8- as the first functional block.
Configure SRAM. Next, an n-channel MO8FET 7 is fabricated in the third active layer 6 on the second active layer 3,
Further, a p-channel MO8FET 9 is fabricated in the fourth active layer 8 on the third active layer 6. Both these channels MO
0M0 by connecting 8FETs with wiring 10
Eight circuits are constructed, and an arithmetic operation unit (ALU) is created as the second functional block. , At this time, the first functional block CMO8/SRAM and the second functional block CM
Since the O8-ALU is connected by the wiring 11, two functional blocks, such as a small microprocessor, are configured.

本発明の実施例では、ALUとSRAMはそれぞれ2つ
の能動層内に形成するように設計を行なうので、ALU
とSRAMを4層の能動層にまたがって設計する場合に
比較し煩雑さがなくなり、半分あるいはそれ以下の時間
で設計が完了する。
In the embodiment of the present invention, the ALU and SRAM are designed to be formed in two active layers, so the ALU
Compared to designing an SRAM across four active layers, the complexity is reduced and the design can be completed in half or less time.

以上の実施例では、第1及び第3の能動層にnチャネル
MO8FETを、第2及び第4の能動層にpチャネルM
O8FETを配置したが、これは逆になってもよい。ま
た、電界効果型トランジスタはMO8FET以外のもの
でもよい。また、能動層の材質はSi以外の半導体でも
よい。
In the above embodiment, n-channel MO8FETs are used in the first and third active layers, and p-channel MO8FETs are used in the second and fourth active layers.
Although an O8FET has been placed, this may be reversed. Further, the field effect transistor may be other than MO8FET. Further, the material of the active layer may be a semiconductor other than Si.

(発明の効果) 以上のように本発明を用いれば、2つの能動層に異なる
伝導型の電界効果型トランジスタを配置し、それらによ
り0M08回路を構成し、この回路に1つの機能でブロ
ックを割り当てる。その後、2つの能動層で構成された
1つの機能ブロックを単位として、順次積層していき、
大きな機能ブロックを構成する。この方法を用いれば、
半導体素子の作製プロセス期間の短縮及び設計時間の短
縮が可能となる。
(Effects of the Invention) As described above, by using the present invention, field effect transistors of different conductivity types are arranged in two active layers, a 0M08 circuit is configured by them, and a block is assigned to this circuit with one function. . After that, one functional block composed of two active layers is sequentially stacked,
Constitutes a large functional block. Using this method,
It is possible to shorten the manufacturing process period and design time of semiconductor elements.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の実施例を示す構成図である。 1・・・第1の能動層 2.7−nチャネルMO8FET 3・・・第2の能動層 4.9・・・pチャネルMO8FET 5、10.11・・・配線 6・・・第3の能動層 8・・・第4の能動層 工業技術院長 飯塚幸三 FIG. 1 is a block diagram showing an embodiment of the present invention. 1...first active layer 2.7-n channel MO8FET 3...Second active layer 4.9...p channel MO8FET 5, 10.11...Wiring 6...Third active layer 8...Fourth active layer Kozo Iizuka, Director of the Institute of Industrial Science and Technology

Claims (1)

【特許請求の範囲】[Claims] (1)半導体素子を含む能動層が複数層積層された半導
体集積回路において、第1伝導型の電界効果型トランジ
スタを第1の半導体素子能動層に、第2伝導型の電界効
果型トランジスタを前記第1の半導体素子能動層上に積
層された第2の半導体素子能動層上に配置されてなる相
補型半導体集積回路で1つの機能ブロックを構成し、こ
れら積層化された機能ブロックを単位として、順次積層
化していくことを特徴とする半導体集積回路。
(1) In a semiconductor integrated circuit in which a plurality of active layers including semiconductor elements are laminated, a field effect transistor of a first conductivity type is used as the first semiconductor element active layer, and a field effect transistor of the second conductivity type is used as the active layer of the first semiconductor element. Complementary semiconductor integrated circuits arranged on a second semiconductor element active layer stacked on a first semiconductor element active layer constitute one functional block, and these stacked functional blocks are used as a unit, A semiconductor integrated circuit characterized by successive stacking.
JP63039488A 1988-02-24 1988-02-24 Semiconductor integrated circuit Pending JPH01215056A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63039488A JPH01215056A (en) 1988-02-24 1988-02-24 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63039488A JPH01215056A (en) 1988-02-24 1988-02-24 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPH01215056A true JPH01215056A (en) 1989-08-29

Family

ID=12554439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63039488A Pending JPH01215056A (en) 1988-02-24 1988-02-24 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPH01215056A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012216776A (en) * 2011-03-31 2012-11-08 Sony Corp Semiconductor device and method of manufacturing the same

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62145850A (en) * 1985-12-20 1987-06-29 Fujitsu Ltd Semiconductor device

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS62145850A (en) * 1985-12-20 1987-06-29 Fujitsu Ltd Semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012216776A (en) * 2011-03-31 2012-11-08 Sony Corp Semiconductor device and method of manufacturing the same

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