JPH0119548B2 - - Google Patents

Info

Publication number
JPH0119548B2
JPH0119548B2 JP56173855A JP17385581A JPH0119548B2 JP H0119548 B2 JPH0119548 B2 JP H0119548B2 JP 56173855 A JP56173855 A JP 56173855A JP 17385581 A JP17385581 A JP 17385581A JP H0119548 B2 JPH0119548 B2 JP H0119548B2
Authority
JP
Japan
Prior art keywords
signal
under test
device under
current
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP56173855A
Other languages
English (en)
Japanese (ja)
Other versions
JPS5875075A (ja
Inventor
Hitoshi Noguchi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Priority to JP17385581A priority Critical patent/JPS5875075A/ja
Publication of JPS5875075A publication Critical patent/JPS5875075A/ja
Publication of JPH0119548B2 publication Critical patent/JPH0119548B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP17385581A 1981-10-30 1981-10-30 サンプリング積分形容量あるいは他のパラメ−タの測定装置 Granted JPS5875075A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17385581A JPS5875075A (ja) 1981-10-30 1981-10-30 サンプリング積分形容量あるいは他のパラメ−タの測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17385581A JPS5875075A (ja) 1981-10-30 1981-10-30 サンプリング積分形容量あるいは他のパラメ−タの測定装置

Publications (2)

Publication Number Publication Date
JPS5875075A JPS5875075A (ja) 1983-05-06
JPH0119548B2 true JPH0119548B2 (enrdf_load_stackoverflow) 1989-04-12

Family

ID=15968392

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17385581A Granted JPS5875075A (ja) 1981-10-30 1981-10-30 サンプリング積分形容量あるいは他のパラメ−タの測定装置

Country Status (1)

Country Link
JP (1) JPS5875075A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010054229A (ja) * 2008-08-26 2010-03-11 Hioki Ee Corp 静電容量測定装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5676063A (en) * 1979-11-26 1981-06-23 Nippon Telegr & Teleph Corp <Ntt> Evaluation of semiconductor element

Also Published As

Publication number Publication date
JPS5875075A (ja) 1983-05-06

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