JPS5875075A - サンプリング積分形容量あるいは他のパラメ−タの測定装置 - Google Patents

サンプリング積分形容量あるいは他のパラメ−タの測定装置

Info

Publication number
JPS5875075A
JPS5875075A JP17385581A JP17385581A JPS5875075A JP S5875075 A JPS5875075 A JP S5875075A JP 17385581 A JP17385581 A JP 17385581A JP 17385581 A JP17385581 A JP 17385581A JP S5875075 A JPS5875075 A JP S5875075A
Authority
JP
Japan
Prior art keywords
signal
sampling
current
delay time
time
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP17385581A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0119548B2 (enrdf_load_stackoverflow
Inventor
Hitoshi Noguchi
仁 野口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Priority to JP17385581A priority Critical patent/JPS5875075A/ja
Publication of JPS5875075A publication Critical patent/JPS5875075A/ja
Publication of JPH0119548B2 publication Critical patent/JPH0119548B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
JP17385581A 1981-10-30 1981-10-30 サンプリング積分形容量あるいは他のパラメ−タの測定装置 Granted JPS5875075A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17385581A JPS5875075A (ja) 1981-10-30 1981-10-30 サンプリング積分形容量あるいは他のパラメ−タの測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17385581A JPS5875075A (ja) 1981-10-30 1981-10-30 サンプリング積分形容量あるいは他のパラメ−タの測定装置

Publications (2)

Publication Number Publication Date
JPS5875075A true JPS5875075A (ja) 1983-05-06
JPH0119548B2 JPH0119548B2 (enrdf_load_stackoverflow) 1989-04-12

Family

ID=15968392

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17385581A Granted JPS5875075A (ja) 1981-10-30 1981-10-30 サンプリング積分形容量あるいは他のパラメ−タの測定装置

Country Status (1)

Country Link
JP (1) JPS5875075A (enrdf_load_stackoverflow)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010054229A (ja) * 2008-08-26 2010-03-11 Hioki Ee Corp 静電容量測定装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5676063A (en) * 1979-11-26 1981-06-23 Nippon Telegr & Teleph Corp <Ntt> Evaluation of semiconductor element

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5676063A (en) * 1979-11-26 1981-06-23 Nippon Telegr & Teleph Corp <Ntt> Evaluation of semiconductor element

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010054229A (ja) * 2008-08-26 2010-03-11 Hioki Ee Corp 静電容量測定装置

Also Published As

Publication number Publication date
JPH0119548B2 (enrdf_load_stackoverflow) 1989-04-12

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