JPH01171356U - - Google Patents

Info

Publication number
JPH01171356U
JPH01171356U JP6856588U JP6856588U JPH01171356U JP H01171356 U JPH01171356 U JP H01171356U JP 6856588 U JP6856588 U JP 6856588U JP 6856588 U JP6856588 U JP 6856588U JP H01171356 U JPH01171356 U JP H01171356U
Authority
JP
Japan
Prior art keywords
polarizing plates
optical waveguide
inspection device
optical
inspected
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6856588U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6856588U priority Critical patent/JPH01171356U/ja
Publication of JPH01171356U publication Critical patent/JPH01171356U/ja
Pending legal-status Critical Current

Links

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図及び第２図は本考案の実施例を示す側面
図である。 １…被検査物、２…固定偏光円板、３…鋭敏色
円板、４…ガラス円板、５…回転用偏光円板、６
…調節ねじ、７…支柱、８…顕微鏡、９…ステー
ジ、１０…検査器、１１…レンズ系、１２…ラン
プ、１３…ミラー。 1 and 2 are side views showing an embodiment of the present invention. 1... Inspection object, 2... Fixed polarizing disc, 3... Sensitive color disc, 4... Glass disc, 5... Rotating polarizing disc, 6
...adjustment screw, 7...support, 8...microscope, 9...stage, 10...inspection device, 11...lens system, 12...lamp, 13...mirror.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] ２枚の偏光板を対向させ一方の該偏光板を板面
内で回転可能に組立ててあり、両前記偏光板間に
検査対象の光導波路を配置して光学式顕微鏡の試
料載置用ステージ上に載置可能な構造を有するこ
とを特徴とする光導波路を検査器。 Two polarizing plates are assembled to face each other and one of the polarizing plates can be rotated within the plane of the plate, and an optical waveguide to be inspected is arranged between both polarizing plates and placed on a sample mounting stage of an optical microscope. An optical waveguide inspection device characterized by having a structure that can be placed on an optical waveguide.
JP6856588U 1988-05-23 1988-05-23 Pending JPH01171356U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6856588U JPH01171356U (en) 1988-05-23 1988-05-23

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6856588U JPH01171356U (en) 1988-05-23 1988-05-23

Publications (1)

Publication Number Publication Date
JPH01171356U true JPH01171356U (en) 1989-12-05

Family

ID=31293876

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6856588U Pending JPH01171356U (en) 1988-05-23 1988-05-23

Country Status (1)

Country Link
JP (1) JPH01171356U (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6088919A (en) * 1983-10-21 1985-05-18 Mitsubishi Heavy Ind Ltd Sample position adjusting method of polarization microscope
JPS6348444A (en) * 1986-08-19 1988-03-01 Narumi China Corp Method and device for automatic inspection of surface of glass substrate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6088919A (en) * 1983-10-21 1985-05-18 Mitsubishi Heavy Ind Ltd Sample position adjusting method of polarization microscope
JPS6348444A (en) * 1986-08-19 1988-03-01 Narumi China Corp Method and device for automatic inspection of surface of glass substrate

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