JPS5816532U - Reflector for spectrophotometer - Google Patents
Reflector for spectrophotometerInfo
- Publication number
- JPS5816532U JPS5816532U JP10919281U JP10919281U JPS5816532U JP S5816532 U JPS5816532 U JP S5816532U JP 10919281 U JP10919281 U JP 10919281U JP 10919281 U JP10919281 U JP 10919281U JP S5816532 U JPS5816532 U JP S5816532U
- Authority
- JP
- Japan
- Prior art keywords
- spectrophotometer
- reflector
- sample
- degrees
- reflection device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000010586 diagram Methods 0.000 description 4
Landscapes
- Spectrometry And Color Measurement (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1図は試料に対する入射角θ°が小さい従来例の反射
装置説明図、第2図は試料に対する入射角θ°が大きい
従来例の反射装置説明図、第3図は本考案実施例の試料
に対して入射角度を可変できる反射装置説明図である。
゛ 1・・・・・・光源室、2・・・・・・試料室、3
・・・・・・分光器室、4・・・・・・平面鏡、5・・
・・・・凹面鏡、6・・・・・・平面鏡、7・・・・・
・試料、12・・・・・・平面鏡、13・・・・・・回
転中心。Fig. 1 is an explanatory diagram of a conventional reflecting device with a small incident angle θ° to the sample, Fig. 2 is an explanatory diagram of a conventional reflecting device with a large incident angle θ° to the sample, and Fig. 3 is a diagram of a sample according to an embodiment of the present invention. FIG. 2 is an explanatory diagram of a reflection device that can change the incident angle with respect to the light beam.゛ 1...Light source chamber, 2...Sample chamber, 3
... Spectrometer room, 4 ... Plane mirror, 5 ...
... Concave mirror, 6 ... Plane mirror, 7 ...
・Sample, 12...Plane mirror, 13...Rotation center.
Claims (1)
入射角を約15度から約80度まで、可変可能にし、さ
らに、試料面と平面鏡反射面の交点を回転中心として一
体化した事を特徴とする分光光度計用反射装置。A reflection device used in a spectrophotometer is characterized in that the angle of incidence on the sample can be varied from about 15 degrees to about 80 degrees, and is further integrated with the intersection of the sample surface and the plane mirror reflection surface as the center of rotation. Reflection device for spectrophotometer.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10919281U JPS5816532U (en) | 1981-07-24 | 1981-07-24 | Reflector for spectrophotometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10919281U JPS5816532U (en) | 1981-07-24 | 1981-07-24 | Reflector for spectrophotometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5816532U true JPS5816532U (en) | 1983-02-01 |
Family
ID=29903574
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP10919281U Pending JPS5816532U (en) | 1981-07-24 | 1981-07-24 | Reflector for spectrophotometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5816532U (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60123372U (en) * | 1984-01-30 | 1985-08-20 | 片岡 芳郎 | Cardboard for packaging and filing |
JPS62228923A (en) * | 1986-03-31 | 1987-10-07 | Asahi Optical Co Ltd | Reflector for spectrophotometer |
JPS62228922A (en) * | 1986-03-31 | 1987-10-07 | Asahi Optical Co Ltd | Spectrophotometer |
-
1981
- 1981-07-24 JP JP10919281U patent/JPS5816532U/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS60123372U (en) * | 1984-01-30 | 1985-08-20 | 片岡 芳郎 | Cardboard for packaging and filing |
JPS62228923A (en) * | 1986-03-31 | 1987-10-07 | Asahi Optical Co Ltd | Reflector for spectrophotometer |
JPS62228922A (en) * | 1986-03-31 | 1987-10-07 | Asahi Optical Co Ltd | Spectrophotometer |
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