JPH01170860A - Testing device for printed circuit board - Google Patents
Testing device for printed circuit boardInfo
- Publication number
- JPH01170860A JPH01170860A JP62328384A JP32838487A JPH01170860A JP H01170860 A JPH01170860 A JP H01170860A JP 62328384 A JP62328384 A JP 62328384A JP 32838487 A JP32838487 A JP 32838487A JP H01170860 A JPH01170860 A JP H01170860A
- Authority
- JP
- Japan
- Prior art keywords
- printed wiring
- resistor
- insulation resistance
- wiring board
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 46
- 238000009413 insulation Methods 0.000 claims abstract description 61
- 238000005259 measurement Methods 0.000 claims abstract description 15
- 238000001514 detection method Methods 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Abstract
Description
【発明の詳細な説明】
〔概要〕
短い測定時間で、精度よく絶縁抵抗を測定するプリント
配線板の試験装置（布線試験機）に関し、２５０■の印
加電圧をもって、比較的大きな静電容量を有する半導体
装置の絶縁抵抗を測定する場合にも、測定時間が増大せ
ず、しかも、精度よく測定することが可能なプリント配
線板の試験装置（布線、試験機）を提供することを目的
とし、“−圧印加手段と、この電圧印加手段の一方の端
子に直列に接続され、回路を並列に二分する回路切り替
え手段と、この回路切り替え手段の一方の出力端子に接
続され、１００Ω程度の小さな抵抗値を有する高速充電
用抵抗器と、前記回路切り替え手段の他方の出力端子に
接続され、１００にΩ〜ＩＭΩ程度の大きな抵抗値を有
する、絶縁抵抗測定用抵抗器と、この絶縁抵抗測定用抵
抗器と前記高速充電用抵抗器と、の並列回路に接続され
、プリント配線板の−゛方の端子に接続される、プリン
ト配線板試験用端子と、前記電圧印加手段の他方の端子
に接続される端子に接続され、プリント配線板の他方の
端子に接続される、プリント配線板試験用端子と、前記
試験用端子と試験用端子との間に発生する電圧が飽和値
に達したことを検出し、前記回路切り替え手段の前記高
速充電用抵抗器側から前記絶縁抵抗測定用抵抗器側に切
り替える切り替え信号を送出する印加電圧検出手段と、
前記絶縁抵抗測定用抵抗器に発生する電圧を測定して、
前記プリント配線板の絶縁抵抗を算出する絶縁紙□
抗算出手段とをもって構成される。[Detailed Description of the Invention] [Summary] Regarding a printed wiring board testing device (wiring tester) that accurately measures insulation resistance in a short measurement time, a relatively large capacitance can be measured with an applied voltage of 250μ. The purpose of the present invention is to provide a printed wiring board testing device (wiring, testing machine) that can measure the insulation resistance of a semiconductor device without increasing the measurement time and with high accuracy. , "-voltage applying means, circuit switching means connected in series to one terminal of this voltage applying means and dividing the circuit into two in parallel, and connected to one output terminal of this circuit switching means, with a small resistance of about 100Ω. a high-speed charging resistor having a resistance value; a resistor for measuring insulation resistance connected to the other output terminal of the circuit switching means and having a large resistance value of about 100Ω to IMΩ; A printed wiring board test terminal connected to the parallel circuit of the resistor and the high-speed charging resistor, and connected to the -' side terminal of the printed wiring board, and connected to the other terminal of the voltage application means. A printed wiring board test terminal that is connected to the other terminal of the printed wiring board, and that the voltage generated between the test terminal and the test terminal has reached a saturation value. applied voltage detection means for detecting and sending a switching signal for switching from the high-speed charging resistor side to the insulation resistance measuring resistor side of the circuit switching means;
Measuring the voltage generated in the insulation resistance measuring resistor,
Insulating paper to calculate the insulation resistance of the printed wiring board □
and a resistance calculation means.
、 〔産業上の利用分野〕
短い測定時間で、精度よく絶縁抵抗を測定する□ プ
リント配線板の試験装置（布線試験機）に関する。, [Industrial field of application] □ Concerning printed wiring board testing equipment (wiring testing machine) that accurately measures insulation resistance in a short measurement time.
従来技術に係るプリント配線板の試験装置（布線試験機
）は、第２図に示すように、電圧印加手段Ｅが発生する
電圧Ｖ、を、１００ＫΩ〜１ＭΩの抵抗を有する絶縁抵
抗測定用抵抗器Ｒ８を介して、プリント配線板Ｐに印加
し、絶縁抵抗測定用抵抗器Ｒｓ （抵抗値ｒｓ）中に
発生する電圧降下Ｖ２を測定し、Ｉ−Ｖ、の関係からプ
リント配線板ＰＳ
■１
に流れる電流Ｉを算出し、Ｒ−一−ｒ、の関係からプリ
ント配線板Ｐの絶縁抵抗Ｒを算出するものである。As shown in FIG. 2, the conventional printed wiring board testing device (wiring testing device) converts the voltage V generated by the voltage applying means E into an insulation resistance measuring resistor having a resistance of 100 KΩ to 1 MΩ. The voltage drop V2 generated in the insulation resistance measuring resistor Rs (resistance value rs) is measured, and from the relationship IV, the printed wiring board PS ■1 The current I flowing through is calculated, and the insulation resistance R of the printed wiring board P is calculated from the relationship R-1-r.
（発明が解決しようとする問題点〕
ところで、かつては、電圧印加手段Ｅの印加電圧Ｖ、と
してＩＯＶが使用されており、プリント配線板Ｐの絶縁
抵抗はＩＭΩ以上あれば良いとされてきた。ところが、
ＩＯＶの印加電圧に対しては、十分な絶縁が保たれてい
るが、印加電圧を更に上げると、絶縁が破壊されるよう
な微小な欠陥が、しばしば検出されるようになったので
、プリント配線板の信頼性を高めるため、印加電圧ｖＩ
を２５０Ｖに高め、１００ＭΩという高絶縁抵抗まで測
定することが必要になった。(Problems to be Solved by the Invention) In the past, IOV was used as the applied voltage V of the voltage applying means E, and it was considered that the insulation resistance of the printed wiring board P should be IMΩ or more. However,
Sufficient insulation is maintained against the applied voltage of IOV, but when the applied voltage is further increased, minute defects that can break down the insulation are often detected, so printed wiring To increase the reliability of the board, the applied voltage vI
It became necessary to increase the voltage to 250V and measure insulation resistance as high as 100MΩ.
プリント配線板Ｐに２５０■を印加して、プリント配線
板Ｐの絶縁抵抗１００ＭΩを測定する場合、絶縁抵抗測
定用抵抗器Ｒ８の抵抗値ｒ、を０と仮定しても、プリン
ト配線板Ｐに流れる電流は、２．５Ｘ１０−６Ａと極め
て小さな値となる。この小電流を精度よく測定するには
、絶縁抵抗測定用抵抗器Ｒ５の抵抗値ｒ３を大きくする
必要があるが、例えば絶縁抵抗測定用抵抗器Ｒ５の抵抗
値ｒ、をＩＭΩとずれば絶縁抵抗測定用抵抗器Ｒ８に発
生する電圧は２．５Ｖとなり、精度よく測定することが
できる。前記のように、この電圧からプリント配線板Ｐ
に流れる電流■を算出し、プリント配線板Ｐの絶縁抵抗
Ｒを算出することができる。When measuring the insulation resistance of 100MΩ of the printed wiring board P by applying 250μ to the printed wiring board P, even if it is assumed that the resistance value r of the insulation resistance measuring resistor R8 is 0, the printed wiring board P The flowing current is an extremely small value of 2.5×10 −6 A. In order to accurately measure this small current, it is necessary to increase the resistance value r3 of the insulation resistance measuring resistor R5. For example, if the resistance value r of the insulation resistance measuring resistor R5 is different from IMΩ, the insulation resistance The voltage generated across the measurement resistor R8 is 2.5V, allowing accurate measurement. As mentioned above, from this voltage the printed wiring board P
The insulation resistance R of the printed wiring board P can be calculated by calculating the current ■ flowing through the circuit.
一方、集積回路の集積度が著しく向上してきたため、プ
リント配線板内の配線相互間のキャパシタンスが増大し
てきた。On the other hand, as the degree of integration of integrated circuits has significantly improved, the capacitance between wirings within a printed wiring board has increased.
この結果、大きなキャパシタンスを有するプリント配線
板に、大きな抵抗値を有する絶縁抵抗測定用抵抗器Ｒｓ
を介して２５０■の電圧を印加すると、キャパシタンス
に充電電流が流れるため、プリント配線板試験用端子Ｔ
１とＴ２の間に発生する電圧は、ゆっくり上昇して飽和
値に達する。換言すれば、第３図のタイムチャートに示
すように、電圧が印加されてから、電流はゆっくり上昇
し、しばらくして、図にＸをもって示す時点において、
はじめて、プリント配線板の絶縁抵抗の測定が可能にな
ることから、測定に時間を要し、支障をきたすようにな
った。As a result, an insulation resistance measuring resistor Rs with a large resistance value is placed on a printed wiring board with a large capacitance.
When a voltage of 250μ is applied through the capacitance, a charging current flows through the capacitance, so the terminal T
The voltage developed between T1 and T2 slowly rises to reach its saturation value. In other words, as shown in the time chart of Fig. 3, after the voltage is applied, the current rises slowly, and after a while, at the point indicated by X in the figure,
For the first time, it became possible to measure the insulation resistance of printed wiring boards, but measurements became time consuming and troublesome.
本発明の目的は、この欠点を解消することにあリ、２５
０■の印加電圧をもって絶縁抵抗を測定する場合にも、
測定時間が増大せず、しかも、精度よく測定可能なプリ
ント配線板の試験装置（布線試験機）を提供することに
ある。The purpose of the present invention is to eliminate this drawback.
Even when measuring insulation resistance with an applied voltage of 0■,
To provide a printed wiring board testing device (wiring testing device) that does not increase measurement time and can measure with high accuracy.
上記の目的は、電圧印加手段（Ｅ）と、この電圧印加手
段（Ｅ）の一方の端子に直列に接続され、回路を並列に
二分する回路切り替え手段（Ｓ）と、この回路切り替え
手段（Ｓ）の一方の出力端子に接続され、１００Ω程度
の小さな抵抗値を有する高速充電用抵抗器（Ｒ１りと、
前記回路切り替え手段（Ｓ）の他方の出力端子に接続さ
れ、１００にΩ〜ＩＭΩ程度の大きな抵抗値を有する、
絶縁抵抗測定用抵抗器（Ｒｓ）と、この絶縁抵抗測定用
抵抗器（Ｒｓ）と前記高速充電用抵抗器（Ｒｅ−）と、
の並列回路に接続され、プリント配線板（Ｐ）の一方の
端子に接続される、プリント配線板試験用端子（Ｔ１）
と、前記電圧印加手段（Ｅ）の他方の端子に接続される
端子に接続され、プリント配線板（Ｐ）の他方の端子に
接続される、プリント配線板試験用端子（Ｔ２）と、前
記試験用端子（Ｔ、）と試験用端子（Ｔ２）との間に発
生する電圧が飽和値に達したことを検出し、前記回路切
り替え手段（Ｓ）の前記高速充電用抵抗器（Ｒｅ）側か
ら前記絶縁抵抗測定用抵抗器（Ｒｓ）側に切り替える切
り替え信号を送出する印加電圧検出手段（ＶＤ）と、前
記絶縁抵抗測定用抵抗器（Ｒｓ）に発生する電圧を測定
して、前記プリント配線板（Ｐ）の絶縁抵抗を算出する
絶縁抵抗算出手段（Ｖ）とを設けたプリント配線板の試
験装置（布線試験機）とによって達成される。The above purpose is to provide a voltage applying means (E), a circuit switching means (S) connected in series to one terminal of the voltage applying means (E) and dividing the circuit into two in parallel, and a circuit switching means (S) connected in series to one terminal of the voltage applying means (E) to divide the circuit into two in parallel. ) is connected to one output terminal of the high-speed charging resistor (R1 and
connected to the other output terminal of the circuit switching means (S) and having a large resistance value of about 100Ω to IMΩ;
a resistor for measuring insulation resistance (Rs), the resistor for measuring insulation resistance (Rs), and the high-speed charging resistor (Re-);
A printed wiring board test terminal (T1) connected to the parallel circuit of and connected to one terminal of the printed wiring board (P).
, a printed wiring board test terminal (T2) connected to a terminal connected to the other terminal of the voltage application means (E) and connected to the other terminal of the printed wiring board (P), and the test terminal detecting that the voltage generated between the test terminal (T,) and the test terminal (T2) has reached a saturation value, and an applied voltage detection means (VD) that sends a switching signal to switch to the insulation resistance measurement resistor (Rs), and a voltage that is generated in the insulation resistance measurement resistor (Rs) and measures the voltage generated in the insulation resistance measurement resistor (Rs) to detect the printed wiring board. This is achieved by a printed wiring board testing device (wiring testing machine) provided with insulation resistance calculation means (V) for calculating the insulation resistance of (P).
′絶縁抵抗測定開始にあたっては、まず、回路切り替え
手段Ｓを高速充電用抵抗器Ｒｅ側に接続して、電圧印加
手段Ｅの電圧を１００Ω程度の低抵抗を有する高速充電
用抵抗器Ｒｅを介して、抵抗とキャパシタンスとからな
るプリン士配線板Ｐに電圧印加手段Ｅが発生する電圧２
５０■を印加するので、第４図のタイムチャートに示す
ように、短時間にプリント配線板Ｐの充電が完了する（
第４図にＹをもって示す）。充電が完了したことを印加
電圧検出手段ＶＤによって検出し、回路切り替え手段Ｓ
を高速充電用抵抗器Ｒｅから１００Ｋ〜ＩＭΩの高抵抗
を有する絶縁抵抗測定用抵抗器Ｒ８側に切り替え、電圧
印加手段Ｅの電圧を絶縁抵抗測定用抵抗器Ｒ５側に印加
して、プリント配線板Ｐの絶縁抵抗を測定するので、短
時間に、しかも、高精度の絶縁抵抗測定が可能である。'To start measuring insulation resistance, first connect the circuit switching means S to the fast charging resistor Re side, and apply the voltage of the voltage applying means E through the fast charging resistor Re having a low resistance of about 100Ω. , a voltage 2 generated by the voltage applying means E on the printer wiring board P consisting of a resistance and a capacitance.
50■ is applied, charging of the printed wiring board P is completed in a short time as shown in the time chart of Fig. 4 (
(Indicated by Y in Figure 4). The applied voltage detection means VD detects that charging is completed, and the circuit switching means S
is switched from the fast charging resistor Re to the insulation resistance measuring resistor R8 having a high resistance of 100K to IMΩ, and the voltage of the voltage applying means E is applied to the insulation resistance measuring resistor R5, and the printed wiring board Since the insulation resistance of P is measured, it is possible to measure the insulation resistance in a short time and with high accuracy.
換言すれば、図にＺをもって示す時点において、絶縁抵
抗測定が可能となる。In other words, insulation resistance measurement becomes possible at the point indicated by Z in the figure.
以下、図面を参照しつ一１本発明の一実施例に係るプリ
ント配線板の試験装置について説明する。DESCRIPTION OF THE PREFERRED EMBODIMENTS A printed wiring board testing apparatus according to an embodiment of the present invention will be described below with reference to the drawings.
第１図参照
Ｅは電圧印加手段であり、２５０ｖの直流電源と開閉器
とよりなる。Referring to FIG. 1, reference numeral E denotes a voltage applying means, which consists of a 250V DC power source and a switch.
Ｒｏは高速充電用抵抗器であり、１００Ω程度の低い抵
抗値を有する。Ro is a fast charging resistor and has a low resistance value of about 100Ω.
Ｒ３は絶縁抵抗測定用抵抗器であり、１００にΩ〜ＩＭ
Ωの高い抵抗値を有する。R3 is a resistor for measuring insulation resistance, 100Ω to IM
It has a high resistance value of Ω.
Ｓは回路切り替え手段である。S is a circuit switching means.
ＶＤは印加電圧検出手段であり、図にＴ１ ・Ｔ２をも
って示すプリント配線板試験用端子間の電圧Ｖ
を検出し、時間に対する電圧の変化率ｄｔが０になった
ことを検出し、回路切り替え手段Ｓに切り替え信号を出
力する。VD is applied voltage detection means, which detects the voltage V between the printed wiring board test terminals shown as T1 and T2 in the figure, detects that the rate of change in voltage with respect to time dt has become 0, and detects the voltage V between the printed wiring board test terminals shown as T1 and T2 in the figure. A switching signal is output to S.
Ｐは被測定体であるプリント配線板である。P is a printed wiring board which is an object to be measured.
プリント配線板Ｐの絶縁抵抗を測定するにあたり、第４
図のタイムチャートに示すように、まず、プリント配線
板Ｐの被測定回路の両端を、それぞれ試験用端子Ｔ１と
Ｔ２とに接続し、回路切り替え手段Ｓを高速充電用抵抗
器Ｒｅ側に接続し、電圧印加手段Ｅが発生する電圧Ｖｌ
（２５０Ｖ）をプリント配線板Ｐに印加する。プリン
ト配線板Ｐはキャパシタンスと抵抗とよりなっているた
め、充電に時間を要するが、高速充電用抵抗器Ｒｃの抵
抗値が上記のとおり１００Ω程度と小さいので、充置時
間が短く、プリント配線板試験用端子Ｔ、とＴ２との間
の電圧は第４図に示すように比較的早く上昇する。In measuring the insulation resistance of the printed wiring board P, the fourth
As shown in the time chart in the figure, first, both ends of the circuit under test on the printed wiring board P are connected to the test terminals T1 and T2, respectively, and the circuit switching means S is connected to the fast charging resistor Re side. , the voltage Vl generated by the voltage applying means E
(250V) is applied to the printed wiring board P. Since the printed wiring board P consists of capacitance and resistance, it takes time to charge it, but since the resistance value of the fast charging resistor Rc is as small as about 100Ω as mentioned above, the charging time is short and the printed wiring board The voltage between the test terminals T and T2 rises relatively quickly, as shown in FIG.
印加電圧検出手段ＶＤによって、前記プリント配線板試
験用端子Ｔ１とＴ２との間に発生する電Ｖ
圧の変化率１〒がＯになった時点、すなわち、第４図に
Ｙをもって示す時点を検出し、その出力信号に応答して
、回路切り替え手段Ｓを、高速充電用抵抗器Ｒ６側から
絶縁抵抗測定用抵抗器Ｒｓ側に切り替える。The applied voltage detection means VD detects the time when the rate of change of the voltage V generated between the printed wiring board test terminals T1 and T2 becomes O, that is, the time indicated by Y in FIG. In response to the output signal, the circuit switching means S is switched from the fast charging resistor R6 side to the insulation resistance measuring resistor Rs side.
前記回路切り替え手段Ｓの切り替え時に、プリント配線
板Ｐの゛試験用端子Ｔ１とＴ２との間の電圧は、第４図
に示すように、瞬時低下するが、切り替え後直ちに第４
図にＺをもって示す時点で飽和状態に復帰する。Ｚの時
点以降において、絶縁抵抗測定用抵抗器Ｒｓの両端の電
圧■２を電圧側プリント配線板Ｐに流れる電流■を算出
し、Ｒ＝Ｖｌ 、３の関係からプリント配線板Ｐの
絶縁紙抗Ｒを算出する。When the circuit switching means S is switched, the voltage between the test terminals T1 and T2 of the printed wiring board P drops instantaneously, as shown in FIG.
The state returns to saturation at the point indicated by Z in the figure. After time Z, calculate the voltage (2) across the insulation resistance measuring resistor Rs and the current (2) flowing through the voltage side printed wiring board P, and from the relationship R=Vl, 3, the insulation paper resistance of the printed wiring board P Calculate R.
絶縁抵抗測定用抵抗器Ｒｓの抵抗値ｒ、は十分大きいの
で、絶縁抵抗測定用抵抗器Ｒ５の両端に発生する電圧■
２も十分大きくなり電圧■２を精度よく測定することが
でき、したがって、プリント配線板Ｐを流れる電流■を
精度よく測定することができ、その結果、プリント配線
板Ｐの絶縁抵抗Ｒを精度よく、しかも、短時間に、測定
することができる。Since the resistance value r of the insulation resistance measuring resistor Rs is sufficiently large, the voltage generated across the insulation resistance measuring resistor R5 is
2 becomes sufficiently large, voltage 2 can be measured with high accuracy, and therefore, current 2 flowing through the printed wiring board P can be measured with high accuracy, and as a result, the insulation resistance R of the printed wiring board P can be measured with high accuracy. Moreover, it can be measured in a short time.
〔発明１の効果〕
以上説明せるとおり、本発明に係るプリント配線板の試
験装置（布線試験機）においては、低抵抗の高速充電用
抵抗器を介してプリント配線板を短時間に充電し、その
後、高抵抗の絶縁抵抗測定用抵抗器に切り替えて、プリ
ント配線板の絶縁抵抗を測定すること＼されているため
、２５０■の印加電圧をもって１００ＭΩ程度の高絶縁
抵抗を測定する場合にも、短時間に、しかも、精度よく
絶縁抵抗を測定することができる。[Effects of Invention 1] As explained above, in the printed wiring board testing device (wiring testing machine) according to the present invention, the printed wiring board can be charged in a short time via the low-resistance high-speed charging resistor. After that, the insulation resistance of the printed wiring board is measured by switching to a high-resistance resistor for measuring insulation resistance, so even when measuring a high insulation resistance of about 100MΩ with an applied voltage of 250μ, , it is possible to measure insulation resistance in a short time and with high accuracy.
第１図は、本発明の一実施例に係るプリント配線板の試
験装置の回路図である。
第２図は、従来技術に係るプリント配線板の試験装置（
布線試験機）の回路図である。
第３図は、従来技術に係るプリント配線板の試験装置（
布線試験機）を使用して絶縁抵抗を測定する時に、プリ
ント配線板試験用端子Ｔ、とＴ２との間に発生する電圧
の時間経過を示す曲線である。
第４図は、本発明の一実施例に係るプリント配線板の試
験装置（布線試験機）を使用して絶縁抵抗を測定する時
に、プリント配線板試験用端子Ｔ１とＴ２との間に発生
する電圧の時間経過を示す曲線である。
Ｅ・・・電圧印加手段、
Ｓ・・・回路切り替え手段、
Ｒ９・・・高速充電用抵抗器（抵抗値ｒｃ）、Ｒ３・・
・絶縁抵抗測定用抵抗器（抵抗値ｒｓ）、■・・・電圧
測定手段、
ＶＤ・・・印加電圧検出手段、
Ｐ・・・プリント配線板、
■１ ・・・印加電圧、
■２ ・・・絶縁抵抗測定用抵抗器Ｒ８に発生する電圧
、
■・・・プリント配線板に流れる電流、Ｔ、・・・プリ
ント配線板試験用端子、Ｔ２ ・・・プリント配線板試
験用端子。FIG. 1 is a circuit diagram of a printed wiring board testing apparatus according to an embodiment of the present invention. Figure 2 shows a printed wiring board testing device according to the prior art (
It is a circuit diagram of a wiring tester). Figure 3 shows a printed wiring board testing device according to the prior art (
This is a curve showing the time course of the voltage generated between printed wiring board test terminals T and T2 when measuring insulation resistance using a wiring tester. FIG. 4 shows a phenomenon occurring between printed wiring board test terminals T1 and T2 when measuring insulation resistance using a printed wiring board testing device (wiring tester) according to an embodiment of the present invention. This is a curve showing the voltage over time. E...Voltage application means, S...Circuit switching means, R9...Resistor for high-speed charging (resistance value rc), R3...
・Resistor for insulation resistance measurement (resistance value rs), ■... Voltage measuring means, VD... Applied voltage detecting means, P... Printed wiring board, ■1... Applied voltage, ■2... - Voltage generated in resistor R8 for insulation resistance measurement, ■... Current flowing through the printed wiring board, T,... Terminal for printed wiring board testing, T2... Terminal for printed wiring board testing.
Claims (1)
回路を並列に二分する回路切り替え手段（Ｓ）と、 該回路切り替え手段（Ｓ）の一方の出力端子に接続され
、小さな抵抗値を有する高速充電用抵抗器（Ｒ＿ｃ）と
、 前記回路切り替え手段（Ｓ）の他方の出力端子に接続さ
れ、大きな抵抗値を有する、絶縁抵抗測定用抵抗器（Ｒ
＿ｓ）と、 該絶縁抵抗測定用抵抗器（Ｒ＿ｓ）と前記高速充電用抵
抗器（Ｒ＿ｃ）と、の並列回路に接続され、プリント配
線板（Ｐ）の一方の端子に接続される、プリント配線板
試験用端子（Ｔ＿１）と、 前記電圧印加手段（Ｅ）の他方の端子に接続される端子
に接続され、プリント配線板（Ｐ）の他方の端子に接続
される、プリント配線板試験用端子（Ｔ＿２）と、 前記試験用端子（Ｔ＿１）と試験用端子（Ｔ＿２）との
間に発生する電圧が飽和値に達したことを検出し、前記
回路切り替え手段（Ｓ）の前記高速充電用抵抗器（Ｒ＿
ｃ）側から前記絶縁抵抗測定用抵抗器（Ｒ＿ｓ）側に切
り替える切り替え信号を送出する印加電圧検出手段（Ｖ
Ｄ）と、 前記絶縁抵抗測定用抵抗器（Ｒ＿ｓ）に発生する電圧を
測定して、前記プリント配線板（Ｐ）の絶縁抵抗を算出
する絶縁抵抗算出手段（Ｖ）とを具備してなることを特
徴とするプリント配線板の試験装置。[Claims] A voltage applying means (E), connected in series to one terminal of the voltage applying means (E),
a circuit switching means (S) that divides the circuit into two in parallel; a high-speed charging resistor (R_c) connected to one output terminal of the circuit switching means (S) and having a small resistance value; and the circuit switching means ( A resistor for insulation resistance measurement (R
_s), a printed wiring connected to a parallel circuit of the insulation resistance measuring resistor (R_s) and the high-speed charging resistor (R_c), and connected to one terminal of the printed wiring board (P). A board test terminal (T_1); A printed wiring board test terminal connected to the terminal connected to the other terminal of the voltage application means (E) and connected to the other terminal of the printed wiring board (P). (T_2), and detects that the voltage generated between the test terminal (T_1) and the test terminal (T_2) has reached a saturation value, and the high-speed charging resistor of the circuit switching means (S) Vessel (R_
c) applied voltage detection means (V
D); and insulation resistance calculating means (V) for calculating the insulation resistance of the printed wiring board (P) by measuring the voltage generated in the insulation resistance measuring resistor (R_s). A printed wiring board testing device featuring:
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62328384A JPH0827307B2 (en) | 1987-12-26 | 1987-12-26 | Printed wiring board test equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP62328384A JPH0827307B2 (en) | 1987-12-26 | 1987-12-26 | Printed wiring board test equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01170860A true JPH01170860A (en) | 1989-07-05 |
| JPH0827307B2 JPH0827307B2 (en) | 1996-03-21 |
Family
ID=18209645
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP62328384A Expired - Fee Related JPH0827307B2 (en) | 1987-12-26 | 1987-12-26 | Printed wiring board test equipment |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0827307B2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010066050A (en) * | 2008-09-09 | 2010-03-25 | Hioki Ee Corp | Apparatus and method for insulation test |
| WO2012073836A1 (en) * | 2010-11-29 | 2012-06-07 | Ｊｘ日鉱日石エネルギー株式会社 | Ground fault detection device, ground fault detection method, solar energy generator system, and ground fault detection program |
| WO2014148050A1 (en) * | 2013-03-19 | 2014-09-25 | Nidec-Read Corporation | Insulation inspection method and insulation inspection apparatus |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61100664A (en) * | 1984-10-23 | 1986-05-19 | Nec Corp | Insulation resistance tester for automatically changing over instantaneous charge measuring mode |
-
1987
- 1987-12-26 JP JP62328384A patent/JPH0827307B2/en not_active Expired - Fee Related
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS61100664A (en) * | 1984-10-23 | 1986-05-19 | Nec Corp | Insulation resistance tester for automatically changing over instantaneous charge measuring mode |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2010066050A (en) * | 2008-09-09 | 2010-03-25 | Hioki Ee Corp | Apparatus and method for insulation test |
| WO2012073836A1 (en) * | 2010-11-29 | 2012-06-07 | Ｊｘ日鉱日石エネルギー株式会社 | Ground fault detection device, ground fault detection method, solar energy generator system, and ground fault detection program |
| JP2012119382A (en) * | 2010-11-29 | 2012-06-21 | Jx Nippon Oil & Energy Corp | Ground fault detection device, ground fault detection method, photovoltaic power generation system, and ground fault detection program |
| WO2014148050A1 (en) * | 2013-03-19 | 2014-09-25 | Nidec-Read Corporation | Insulation inspection method and insulation inspection apparatus |
| JP2014181977A (en) * | 2013-03-19 | 2014-09-29 | Nidec-Read Corp | Insulation inspection method and insulation inspection device |
| US10197616B2 (en) | 2013-03-19 | 2019-02-05 | Nidec-Read Corporation | Insulation inspection method and insulation inspection apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0827307B2 (en) | 1996-03-21 |
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