JPH01140750U - - Google Patents
Info
- Publication number
- JPH01140750U JPH01140750U JP3533088U JP3533088U JPH01140750U JP H01140750 U JPH01140750 U JP H01140750U JP 3533088 U JP3533088 U JP 3533088U JP 3533088 U JP3533088 U JP 3533088U JP H01140750 U JPH01140750 U JP H01140750U
- Authority
- JP
- Japan
- Prior art keywords
- cable
- tester
- pair
- printed board
- group
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 10
- 239000004020 conductor Substances 0.000 claims 1
- 238000010894 electron beam technology Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3533088U JPH066443Y2 (ja) | 1988-03-18 | 1988-03-18 | 電子ビームプローバにおける試料装着機構 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3533088U JPH066443Y2 (ja) | 1988-03-18 | 1988-03-18 | 電子ビームプローバにおける試料装着機構 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH01140750U true JPH01140750U (enExample) | 1989-09-27 |
| JPH066443Y2 JPH066443Y2 (ja) | 1994-02-16 |
Family
ID=31261985
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3533088U Expired - Lifetime JPH066443Y2 (ja) | 1988-03-18 | 1988-03-18 | 電子ビームプローバにおける試料装着機構 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH066443Y2 (enExample) |
-
1988
- 1988-03-18 JP JP3533088U patent/JPH066443Y2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JPH066443Y2 (ja) | 1994-02-16 |
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