JPH01129176A - Device testing apparatus - Google Patents

Abstract

PURPOSE:To eliminate the necessity for providing a voltage judge means at every device and to obtain a small-scale device testing apparatus, by judging whether a plurality of devices have good quality by measuring the terminal voltages of a plurality of the devices in common. CONSTITUTION:A CPU 900b controls the registers 3 of device testing apparatuses 500b, 600b, 700b, 800b to control the whole of a system. The terminal voltage of a device 100A measured by the voltage measuring part 2 of the apparatus 500b to judge the quality of the device 100A and the code of the next device 100B is set to the register 3 of the apparatus 500b. The terminal voltage of a device 200A measured by the voltage measuring part 2 of the apparatus 600b is read to judge the quality of the device 200A and the code of the next device 200B is set to the register 3 of the apparatus 600b. By this method, it becomes unnecessary to provide voltage judge means at every devices 100A, 100B, 200A, 200B and a small-scale device testing apparatus is obtained.

Description

DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a device testing apparatus used in a memory testing system or the like.

Conventional technology FIG. 3 shows a conventional device testing apparatus 10. As shown in FIG.

In FIG. 3, IOA, IOB, IOc, and IOD each supply current to one device (not shown), and 2OA, 20B, and 20CX20D respectively,
The current supply unit 10A is a voltage measurement unit that measures the terminal voltage of a device to which current is supplied by the IOB, IOC, and IOD.

Current supply section 10A and voltage measurement section 20AXIOB and 20B
.

10C° and 20C, and IOD and 20D constitute current supply voltage measurement units 11, 12, 13, and 14, respectively, which supply current to one device and measure the terminal voltage. Therefore, this device testing apparatus 10 can test a total of four devices.

(capital) is the current supply voltage measuring section 11.1 that starts the measurement.
This is a register that specifies 2.13.14.

FIG. 4 shows a device testing device 500 as 600as 700a1 having the same configuration as the device testing device IO described above.
800A in parallel, total of 16 devices 100A
~100D, 200A~200D, 300A~3
00D.

A device testing system for testing 400A to 400D is shown, and 900a is a device testing apparatus 500a.

600 a % 700 a % 800 C that controls the entire system by controlling register addition of a
PU (Central Processing Unit).

Next, with reference to FIG. 5, we will explain the operation of the above system, especially the CP
The operation of U 900a will be explained.

In step 51, devices 100A to 100
D.

200A~200D, 300A~300D, 4
The condition setting mode is set to test 00A to 400D, and the conditions (supply current, output voltage, etc.) are set in step 52.
Once set, in steps 53, 54, 55, and 56, the device test apparatuses 500a, 60, respectively
Activate each register addition of 0a, 700B, and 800a.

Each register I has current supply units 10A to IO shown in FIG.
Devices 100A to 100D are started up in sequence.

200A~200D, 300A~300D, 400
A to 400D are supplied with the set current.

Next, in steps 57 to 60, the terminal voltages measured by the voltage measuring sections 20A to 20D of the device testing apparatus 500a are read and compared with the set voltages to determine whether the devices 100A to 100D are good or bad.

Hereinafter, similarly, device test equipment 6QOa, 700a
.

The terminal voltage measured by the voltage measurement unit 2OA-20D of the device 800a is read and compared with the set voltage.
0 A~200D, 300A~300D, 400A
- Determine the quality of 400D.

Therefore, in the conventional example described above, a large number of devices can be tested by providing a plurality of device testing apparatuses 10 in parallel.

Problems to be Solved by the Invention However, in the conventional device testing apparatus described above, the current supply voltage measuring section 11 and the like are provided for each device to be tested. There are problems in that it is large and expensive.

SUMMARY OF THE INVENTION In view of the above problems, it is an object of the present invention to provide a device testing apparatus that can reduce the size of the computer hardware and is therefore inexpensive.

Means for Solving the Problems In order to solve the above problems, the present invention uses a plurality of current supply means for supplying current to each device, and commonly measures the terminal voltages of the plurality of devices supplied with current. A voltage measuring means is provided, current is supplied to each of the plurality of devices, and the terminal voltages of the plurality of devices are read in a time-division manner to determine the quality of each device.

According to the present invention, with the above configuration, it is possible to judge the quality of a plurality of devices by commonly measuring the terminal voltages of the plurality of devices, thereby eliminating the need to provide a voltage measuring means for each device. Therefore, a small and inexpensive device testing apparatus can be realized.

EXAMPLES Hereinafter, the present invention will be described in detail with reference to the drawings. FIG. 1 is a schematic block diagram showing an embodiment of a device testing apparatus according to the present invention, and FIG. 2 is a flowchart for explaining the operation of a device testing system using the device testing apparatus of FIG. 1. .

In Figure 1, LA, IB, IC, and LD are each
a current supply unit that supplies current to one device (not shown);
2 is a voltage measurement unit that commonly measures the terminal voltage of four devices supplied with current by the current supply units IA, IBl 1C11D;
C, ID and the voltage measuring section 2 constitute a current supply voltage measuring device that supplies current to four devices and commonly measures the terminal voltage.

3 is a current supply unit IA that starts measurement of four devices.
, IB, IC1ID, and a register for specifying the voltage measuring section 2. These members constitute a device testing apparatus l that determines the quality of four devices.

As shown in FIG. 4, device testing apparatuses 500b and 600b have the same configuration as the device testing apparatus 1 described above.

By providing 700b and 800b in parallel, a total of 16 devices 100A to 100D and 200A to 2
00D.

A device test system can be configured to test 300A to 300D and 400A to 400D.

In addition, 900b is a device testing apparatus 500b,
600b.

This is a CPU (central processing unit) that controls the entire system by controlling register 3 of 700.800b.

Next, the operation of the device testing system according to the above configuration, particularly the operation of the CPU 900b, will be explained with reference to FIG.

In step 21, devices 100A-100D.

200A~200D, 300A~300D, 400
When the condition setting mode for testing A to 400D is set and the conditions (supply voltage, output voltage, etc.) are set in step n, the device test apparatuses 500b, 600b, and
Codes of devices 100A, 200A, 300A, and 40OA are set for each register 3 of 700b and 5oob.

Each register 3 starts the current supply unit 1 shown in FIG.
.

400A is supplied with the set current.

In the next step, the terminal voltage of the device 100A measured by the voltage measuring section 2 of the device testing apparatus 500b is read to determine its acceptability, and then, in the step group, the next device is sent to the register 3 of the device testing apparatus 500b. Set a 100B code.

Similarly, in step 4, the device test equipment 600
The terminal voltage of the device 200A measured by the voltage measurement unit 2 of b is read to determine its acceptability, and the next device 200A is sent to the register 3 of the device testing device 600b.
Set the code for B.

Further, in step 31.32, the device test equipment 70
Device 300A measured by voltage measurement unit 2 of 0b
reads the terminal voltage of the device 30 to determine whether it is good or bad.
0B code is set, and in the same way, in Step A and San, the terminal voltage of the device 400A measured by the voltage measuring section 2 of the device testing equipment 800b is read to determine its acceptability, and the code is stored in the register 3 of the device testing equipment 800b. The code of the next device 400B is set for the next device 400B.

Hereinafter, in step A and subsequent steps, 16 devices can be tested by commonly measuring the voltages of the devices to which current is supplied and determining their acceptability.

DETAILED DESCRIPTION OF THE INVENTION As described in detail, the present invention provides a plurality of current supply means for supplying current to each device, and a voltage measurement means for commonly measuring the terminal voltage of a plurality of devices supplied with current. Since current is supplied to each device and the terminal voltage of multiple devices is read in a time-sharing manner to determine the acceptability of each device, there is no need to provide voltage measurement means for each device. , it is possible to realize a small and inexpensive device testing apparatus.

[Brief explanation of the drawing]

FIG. 1 is a schematic block diagram showing an embodiment of a device testing apparatus according to the present invention, and FIG. 2 is a flowchart for explaining the operation of a device testing system using the device testing apparatus of FIG. 1. , FIG. 3 is a schematic block diagram showing a conventional device testing apparatus, FIG. 4 is a schematic block diagram of a device testing system composed of the device testing apparatuses shown in FIGS. 1 and 3, and FIG. , is a flowchart for explaining the operation of a device testing system using the device testing apparatus of FIG. 3. ■, 500b, 600b, 600b, 600b・
...Device test equipment, LA, IB, IC, LD...
Current supply section, 2... Voltage measurement section, 3... Register,
1oOA~100D, 200A~200D, 3
00A to 300D, 400A to 400D...device, 900b...CPU (central processing unit). Name of agent: Patent attorney Toshio Nakao and 1 other person No. 1
Figure 2 Figure 3 Figure 4

Claims (1)

[Claims] a plurality of current supply means for supplying current to each device; a voltage measurement means for commonly measuring terminal voltages of the plurality of devices supplied with the current; and a plurality of current supply means for supplying current to each of the plurality of devices. control the means;
A device testing apparatus comprising: means for time-divisionally reading the terminal voltages of a plurality of devices measured by the voltage measuring means, and determining the quality of each device based on this voltage.