JPH01110383U - - Google Patents
Info
- Publication number
- JPH01110383U JPH01110383U JP581488U JP581488U JPH01110383U JP H01110383 U JPH01110383 U JP H01110383U JP 581488 U JP581488 U JP 581488U JP 581488 U JP581488 U JP 581488U JP H01110383 U JPH01110383 U JP H01110383U
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- under test
- signal
- measurement probe
- circuit under
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 5
- 239000000523 sample Substances 0.000 claims description 3
- 238000007689 inspection Methods 0.000 claims description 2
- 238000012360 testing method Methods 0.000 claims 3
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Tests Of Electronic Circuits (AREA)
Description
第１図はこの考案の一実施例によるロジツク・
アナライザを示す簡略構成図、第２図は従来のロ
ジツク・アナライザを示す簡略構成図である。
１はロジツク・アナライザ本体、１ａは入力部
、１ｂは測定データ用メモリ、１ｅは印加信号用
メモリ（記憶部）、１ｆは出力部、２ａ〜２ｃは
プローブ（測定用探針）、３ａは被検査回路、４
は操作パネル、４ａは表示部、４ｂは操作部。な
お、図中、同一符号は同一、又は相当部分や示す
。
Figure 1 shows a logic diagram according to an embodiment of this invention.
A simplified configuration diagram showing an analyzer. FIG. 2 is a simplified configuration diagram showing a conventional logic analyzer. 1 is the logic analyzer main body, 1a is the input section, 1b is the memory for measurement data, 1e is the memory for applied signals (storage section), 1f is the output section, 2a to 2c are the probes (measurement tips), and 3a is the target Inspection circuit, 4
4 is an operation panel, 4a is a display section, and 4b is an operation section. In addition, in the figures, the same reference numerals indicate the same or corresponding parts.
Claims (1)
を入力するようにした回路検査装置において、被
検査回路に印加する信号に関する情報を記憶する
記憶部と、この記憶部に記憶された情報に基づき
印加信号を測定用探針に出力する出力部とを備え
たことを特徴とする回路検査装置。 A circuit testing device that inputs measurement data from a circuit under test via a measurement probe includes a storage section that stores information regarding a signal to be applied to the circuit under test, and A circuit inspection device comprising: an output section that outputs an applied signal to a measurement probe.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP581488U JPH01110383U (en) | 1988-01-20 | 1988-01-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP581488U JPH01110383U (en) | 1988-01-20 | 1988-01-20 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01110383U true JPH01110383U (en) | 1989-07-25 |
Family
ID=31209513
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP581488U Pending JPH01110383U (en) | 1988-01-20 | 1988-01-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01110383U (en) |
-
1988
- 1988-01-20 JP JP581488U patent/JPH01110383U/ja active Pending
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