JP7837990B2 - 推定方法、推定プログラム及び推定装置 - Google Patents

推定方法、推定プログラム及び推定装置

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Publication number
JP7837990B2
JP7837990B2 JP2023548152A JP2023548152A JP7837990B2 JP 7837990 B2 JP7837990 B2 JP 7837990B2 JP 2023548152 A JP2023548152 A JP 2023548152A JP 2023548152 A JP2023548152 A JP 2023548152A JP 7837990 B2 JP7837990 B2 JP 7837990B2
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JP
Japan
Prior art keywords
electrical signal
photoelectrons
estimation
likelihood function
probability density
Prior art date
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JP2023548152A
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English (en)
Japanese (ja)
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JPWO2023042554A5 (https=
JPWO2023042554A1 (https=
Inventor
勝大 中本
寿也 保高
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
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Hamamatsu Photonics KK
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Publication of JPWO2023042554A5 publication Critical patent/JPWO2023042554A5/ja
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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
JP2023548152A 2021-09-15 2022-07-29 推定方法、推定プログラム及び推定装置 Active JP7837990B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021150031 2021-09-15
JP2021150031 2021-09-15
PCT/JP2022/029355 WO2023042554A1 (ja) 2021-09-15 2022-07-29 推定方法、推定プログラム及び推定装置

Publications (3)

Publication Number Publication Date
JPWO2023042554A1 JPWO2023042554A1 (https=) 2023-03-23
JPWO2023042554A5 JPWO2023042554A5 (https=) 2024-06-05
JP7837990B2 true JP7837990B2 (ja) 2026-03-31

Family

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Family Applications (1)

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JP2023548152A Active JP7837990B2 (ja) 2021-09-15 2022-07-29 推定方法、推定プログラム及び推定装置

Country Status (5)

Country Link
US (1) US20240361375A1 (https=)
EP (1) EP4358533A4 (https=)
JP (1) JP7837990B2 (https=)
CN (1) CN117941369A (https=)
WO (1) WO2023042554A1 (https=)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007147472A (ja) 2005-11-29 2007-06-14 Nec Corp 光子検出デバイスの特性測定のためのデータ処理方法および装置とそれを利用した光子受信器
JP2009174880A (ja) 2008-01-21 2009-08-06 Nec Corp 光子検出装置、光子検出方法および光子検出プログラム
US20110210262A1 (en) 2006-06-12 2011-09-01 Radiation Watch Limited Apparatus and method for detecting high-energy radiation
JP2013024792A (ja) 2011-07-25 2013-02-04 Sony Corp 情報処理装置、情報処理方法、プログラム及び蛍光スペクトルの強度補正方法
JP2013511854A (ja) 2010-11-12 2013-04-04 株式会社東芝 光子検出器
JP2016518747A (ja) 2013-03-15 2016-06-23 イェール ユニバーシティーＹａｌｅ Ｕｎｉｖｅｒｓｉｔｙ センサー依存性ノイズを有する画像化データを処理するための技術
JP2020524422A (ja) 2017-01-30 2020-08-13 パーデュー・リサーチ・ファウンデーションPurdue Research Foundation イメージングノイズ低減システムおよび方法
JP2020167728A (ja) 2017-11-24 2020-10-08 浜松ホトニクス株式会社 フォトンカウンティング装置およびフォトンカウンティング方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007147472A (ja) 2005-11-29 2007-06-14 Nec Corp 光子検出デバイスの特性測定のためのデータ処理方法および装置とそれを利用した光子受信器
US20110210262A1 (en) 2006-06-12 2011-09-01 Radiation Watch Limited Apparatus and method for detecting high-energy radiation
JP2009174880A (ja) 2008-01-21 2009-08-06 Nec Corp 光子検出装置、光子検出方法および光子検出プログラム
JP2013511854A (ja) 2010-11-12 2013-04-04 株式会社東芝 光子検出器
JP2013024792A (ja) 2011-07-25 2013-02-04 Sony Corp 情報処理装置、情報処理方法、プログラム及び蛍光スペクトルの強度補正方法
JP2016518747A (ja) 2013-03-15 2016-06-23 イェール ユニバーシティーＹａｌｅ Ｕｎｉｖｅｒｓｉｔｙ センサー依存性ノイズを有する画像化データを処理するための技術
JP2020524422A (ja) 2017-01-30 2020-08-13 パーデュー・リサーチ・ファウンデーションPurdue Research Foundation イメージングノイズ低減システムおよび方法
JP2020167728A (ja) 2017-11-24 2020-10-08 浜松ホトニクス株式会社 フォトンカウンティング装置およびフォトンカウンティング方法

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
木谷恵一、 林孝，アバランシェフォトダイオードを用いた光子計数法による可視および赤外極微弱光の検出，光学，日本，日本光学会，1984年04月，第１３巻第２号，p. 131-139

Also Published As

Publication number Publication date
EP4358533A1 (en) 2024-04-24
EP4358533A4 (en) 2025-05-21
WO2023042554A1 (ja) 2023-03-23
US20240361375A1 (en) 2024-10-31
JPWO2023042554A1 (https=) 2023-03-23
CN117941369A (zh) 2024-04-26

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