CN117941369A - 推定方法、推定程序及推定装置 - Google Patents

推定方法、推定程序及推定装置 Download PDF

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Publication number
CN117941369A
CN117941369A CN202280062364.5A CN202280062364A CN117941369A CN 117941369 A CN117941369 A CN 117941369A CN 202280062364 A CN202280062364 A CN 202280062364A CN 117941369 A CN117941369 A CN 117941369A
Authority
CN
China
Prior art keywords
likelihood function
photoelectrons
estimation
probability density
pixels
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202280062364.5A
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English (en)
Chinese (zh)
Inventor
中本胜大
保高寿也
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Publication of CN117941369A publication Critical patent/CN117941369A/zh
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/02—Details
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2632—Circuits therefor for testing diodes
    • G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/772—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters
    • H04N25/773—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising A/D, V/T, V/F, I/T or I/F converters comprising photon counting circuits, e.g. single photon detection [SPD] or single photon avalanche diodes [SPAD]

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Optics & Photonics (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
CN202280062364.5A 2021-09-15 2022-07-29 推定方法、推定程序及推定装置 Pending CN117941369A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021150031 2021-09-15
JP2021-150031 2021-09-15
PCT/JP2022/029355 WO2023042554A1 (ja) 2021-09-15 2022-07-29 推定方法、推定プログラム及び推定装置

Publications (1)

Publication Number Publication Date
CN117941369A true CN117941369A (zh) 2024-04-26

Family

ID=85602143

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202280062364.5A Pending CN117941369A (zh) 2021-09-15 2022-07-29 推定方法、推定程序及推定装置

Country Status (5)

Country Link
US (1) US20240361375A1 (https=)
EP (1) EP4358533A4 (https=)
JP (1) JP7837990B2 (https=)
CN (1) CN117941369A (https=)
WO (1) WO2023042554A1 (https=)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007147472A (ja) 2005-11-29 2007-06-14 Nec Corp 光子検出デバイスの特性測定のためのデータ処理方法および装置とそれを利用した光子受信器
US20110210262A1 (en) 2006-06-12 2011-09-01 Radiation Watch Limited Apparatus and method for detecting high-energy radiation
JP5446094B2 (ja) 2008-01-21 2014-03-19 日本電気株式会社 光子検出装置、光子検出方法および光子検出プログラム
GB2485400B (en) 2010-11-12 2014-12-10 Toshiba Res Europ Ltd Photon detector
JP5834584B2 (ja) 2011-07-25 2015-12-24 ソニー株式会社 情報処理装置、情報処理方法、プログラム及び蛍光スペクトルの強度補正方法
WO2014144443A2 (en) 2013-03-15 2014-09-18 Yale University Techniques for processing imaging data having sensor-dependent noise
KR102396261B1 (ko) 2017-01-30 2022-05-10 퍼듀 리서치 파운데이션 이미징 잡음 감소 시스템 및 방법
WO2019102636A1 (ja) 2017-11-24 2019-05-31 浜松ホトニクス株式会社 フォトンカウンティング装置およびフォトンカウンティング方法

Also Published As

Publication number Publication date
JP7837990B2 (ja) 2026-03-31
EP4358533A1 (en) 2024-04-24
EP4358533A4 (en) 2025-05-21
WO2023042554A1 (ja) 2023-03-23
US20240361375A1 (en) 2024-10-31
JPWO2023042554A1 (https=) 2023-03-23

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