JP7823855B2 - 磁気検出器 - Google Patents

磁気検出器

Info

Publication number
JP7823855B2
JP7823855B2 JP2025510185A JP2025510185A JP7823855B2 JP 7823855 B2 JP7823855 B2 JP 7823855B2 JP 2025510185 A JP2025510185 A JP 2025510185A JP 2025510185 A JP2025510185 A JP 2025510185A JP 7823855 B2 JP7823855 B2 JP 7823855B2
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JP
Japan
Prior art keywords
substrate
diamond
magnetic detector
magnetic
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2025510185A
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English (en)
Japanese (ja)
Other versions
JPWO2024203140A1 (https=
Inventor
裕司 岸田
翔太朗 吉田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Kyocera Corp
Keio University
Original Assignee
Kyocera Corp
Keio University
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Publication date
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Publication of JPWO2024203140A1 publication Critical patent/JPWO2024203140A1/ja
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Publication of JP7823855B2 publication Critical patent/JP7823855B2/ja
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Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00—Arrangements or instruments for measuring magnetic variables
    • G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Measuring Magnetic Variables (AREA)
JP2025510185A 2023-03-29 2024-03-07 磁気検出器 Active JP7823855B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2023054219 2023-03-29
JP2023054219 2023-03-29
PCT/JP2024/008898 WO2024203140A1 (ja) 2023-03-29 2024-03-07 磁気検出器

Publications (2)

Publication Number Publication Date
JPWO2024203140A1 JPWO2024203140A1 (https=) 2024-10-03
JP7823855B2 true JP7823855B2 (ja) 2026-03-04

Family

ID=92904374

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2025510185A Active JP7823855B2 (ja) 2023-03-29 2024-03-07 磁気検出器

Country Status (2)

Country Link
JP (1) JP7823855B2 (https=)
WO (1) WO2024203140A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025187461A1 (ja) * 2024-03-07 2025-09-12 京セラ株式会社 検出器及び顕微鏡

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160282427A1 (en) 2014-02-19 2016-09-29 Infinitum Solutions, Inc. Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
JP2021103093A (ja) 2019-12-24 2021-07-15 スミダコーポレーション株式会社 測定装置および測定方法
WO2021200144A1 (ja) 2020-03-31 2021-10-07 国立大学法人東京工業大学 物理状態計測装置
WO2022249995A1 (ja) 2021-05-25 2022-12-01 京セラ株式会社 検出基板、検出機及び検出装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7530284B2 (ja) * 2020-12-22 2024-08-07 矢崎総業株式会社 センサ

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20160282427A1 (en) 2014-02-19 2016-09-29 Infinitum Solutions, Inc. Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices
JP2021103093A (ja) 2019-12-24 2021-07-15 スミダコーポレーション株式会社 測定装置および測定方法
WO2021200144A1 (ja) 2020-03-31 2021-10-07 国立大学法人東京工業大学 物理状態計測装置
WO2022249995A1 (ja) 2021-05-25 2022-12-01 京セラ株式会社 検出基板、検出機及び検出装置

Also Published As

Publication number Publication date
WO2024203140A1 (ja) 2024-10-03
JPWO2024203140A1 (https=) 2024-10-03

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