JPWO2024203140A1 - - Google Patents
Info
- Publication number
- JPWO2024203140A1 JPWO2024203140A1 JP2025510185A JP2025510185A JPWO2024203140A1 JP WO2024203140 A1 JPWO2024203140 A1 JP WO2024203140A1 JP 2025510185 A JP2025510185 A JP 2025510185A JP 2025510185 A JP2025510185 A JP 2025510185A JP WO2024203140 A1 JPWO2024203140 A1 JP WO2024203140A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N24/00—Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/20—Arrangements or instruments for measuring magnetic variables involving magnetic resonance
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- High Energy & Nuclear Physics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Measuring Magnetic Variables (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2023054219 | 2023-03-29 | ||
| JP2023054219 | 2023-03-29 | ||
| PCT/JP2024/008898 WO2024203140A1 (ja) | 2023-03-29 | 2024-03-07 | 磁気検出器 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2024203140A1 true JPWO2024203140A1 (https=) | 2024-10-03 |
| JP7823855B2 JP7823855B2 (ja) | 2026-03-04 |
Family
ID=92904374
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2025510185A Active JP7823855B2 (ja) | 2023-03-29 | 2024-03-07 | 磁気検出器 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP7823855B2 (https=) |
| WO (1) | WO2024203140A1 (https=) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2025187461A1 (ja) * | 2024-03-07 | 2025-09-12 | 京セラ株式会社 | 検出器及び顕微鏡 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160282427A1 (en) * | 2014-02-19 | 2016-09-29 | Infinitum Solutions, Inc. | Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices |
| JP2021103093A (ja) * | 2019-12-24 | 2021-07-15 | スミダコーポレーション株式会社 | 測定装置および測定方法 |
| WO2021200144A1 (ja) * | 2020-03-31 | 2021-10-07 | 国立大学法人東京工業大学 | 物理状態計測装置 |
| JP2022098572A (ja) * | 2020-12-22 | 2022-07-04 | 矢崎総業株式会社 | センサ |
| WO2022249995A1 (ja) * | 2021-05-25 | 2022-12-01 | 京セラ株式会社 | 検出基板、検出機及び検出装置 |
-
2024
- 2024-03-07 WO PCT/JP2024/008898 patent/WO2024203140A1/ja not_active Ceased
- 2024-03-07 JP JP2025510185A patent/JP7823855B2/ja active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20160282427A1 (en) * | 2014-02-19 | 2016-09-29 | Infinitum Solutions, Inc. | Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices |
| JP2021103093A (ja) * | 2019-12-24 | 2021-07-15 | スミダコーポレーション株式会社 | 測定装置および測定方法 |
| WO2021200144A1 (ja) * | 2020-03-31 | 2021-10-07 | 国立大学法人東京工業大学 | 物理状態計測装置 |
| JP2022098572A (ja) * | 2020-12-22 | 2022-07-04 | 矢崎総業株式会社 | センサ |
| WO2022249995A1 (ja) * | 2021-05-25 | 2022-12-01 | 京セラ株式会社 | 検出基板、検出機及び検出装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP7823855B2 (ja) | 2026-03-04 |
| WO2024203140A1 (ja) | 2024-10-03 |
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