JP7726298B2 - 情報処理システム - Google Patents

情報処理システム

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Publication number
JP7726298B2
JP7726298B2 JP2023568969A JP2023568969A JP7726298B2 JP 7726298 B2 JP7726298 B2 JP 7726298B2 JP 2023568969 A JP2023568969 A JP 2023568969A JP 2023568969 A JP2023568969 A JP 2023568969A JP 7726298 B2 JP7726298 B2 JP 7726298B2
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JP
Japan
Prior art keywords
vector
vectors
embedded
series data
time series
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JP2023568969A
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English (en)
Japanese (ja)
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JPWO2023119598A5 (https=
JPWO2023119598A1 (https=
Inventor
昌尚 棗田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
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NEC Corp
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Publication of JPWO2023119598A1 publication Critical patent/JPWO2023119598A1/ja
Publication of JPWO2023119598A5 publication Critical patent/JPWO2023119598A5/ja
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Publication of JP7726298B2 publication Critical patent/JP7726298B2/ja
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Classifications

    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0283Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL]
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • GPHYSICS
    • G05CONTROLLING; REGULATING
    • G05BCONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00Testing or monitoring of control systems or parts thereof
    • G05B23/02Electric testing or monitoring
    • G05B23/0205Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/024Quantitative history assessment, e.g. mathematical relationships between available data; Functions therefor; Principal component analysis [PCA]; Partial least square [PLS]; Statistical classifiers, e.g. Bayesian networks, linear regression or correlation analysis; Neural networks
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06NCOMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00Machine learning

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • Mathematical Physics (AREA)
  • Evolutionary Computation (AREA)
  • Artificial Intelligence (AREA)
  • Software Systems (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Data Mining & Analysis (AREA)
  • Medical Informatics (AREA)
  • Computing Systems (AREA)
  • General Engineering & Computer Science (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
JP2023568969A 2021-12-23 2021-12-23 情報処理システム Active JP7726298B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/048035 WO2023119598A1 (ja) 2021-12-23 2021-12-23 情報処理システム

Publications (3)

Publication Number Publication Date
JPWO2023119598A1 JPWO2023119598A1 (https=) 2023-06-29
JPWO2023119598A5 JPWO2023119598A5 (https=) 2024-08-21
JP7726298B2 true JP7726298B2 (ja) 2025-08-20

Family

ID=86901855

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023568969A Active JP7726298B2 (ja) 2021-12-23 2021-12-23 情報処理システム

Country Status (3)

Country Link
US (1) US20250044785A1 (https=)
JP (1) JP7726298B2 (https=)
WO (1) WO2023119598A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7689937B2 (ja) * 2022-05-27 2025-06-09 株式会社荏原製作所 研磨パッド寿命推定方法および研磨装置

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112712166A (zh) 2020-12-31 2021-04-27 深圳前海微众银行股份有限公司 一种基于时间序列的预测方法及装置
CN113496312A (zh) 2021-07-05 2021-10-12 山东大学 基于多维特征提取融合与长短期记忆网络的刀具剩余寿命预测方法、设备及存储介质

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112712166A (zh) 2020-12-31 2021-04-27 深圳前海微众银行股份有限公司 一种基于时间序列的预测方法及装置
CN113496312A (zh) 2021-07-05 2021-10-12 山东大学 基于多维特征提取融合与长短期记忆网络的刀具剩余寿命预测方法、设备及存储介质

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
FULCHER, Ben D.,Feature-based time-series analysis,[online],2017年10月02日,[取得日 2022.03.10], 取得先<https://arxiv.org/pdf/1709.08055.pdf>

Also Published As

Publication number Publication date
JPWO2023119598A1 (https=) 2023-06-29
WO2023119598A1 (ja) 2023-06-29
US20250044785A1 (en) 2025-02-06

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