JP7721666B2 - 3次元計測システム、並びにその制御方法及び制御プログラム - Google Patents

3次元計測システム、並びにその制御方法及び制御プログラム

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Publication number
JP7721666B2
JP7721666B2 JP2023559396A JP2023559396A JP7721666B2 JP 7721666 B2 JP7721666 B2 JP 7721666B2 JP 2023559396 A JP2023559396 A JP 2023559396A JP 2023559396 A JP2023559396 A JP 2023559396A JP 7721666 B2 JP7721666 B2 JP 7721666B2
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Japan
Prior art keywords
image
exposure
contrast
exposure condition
camera
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JP2023559396A
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Japanese (ja)
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JPWO2023084790A1 (https=
Inventor
颯太 廣瀬
弘之 岡
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Robotics Inc
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Tokyo Robotics Inc
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06TIMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00General purpose image data processing

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Length Measuring Devices By Optical Means (AREA)
JP2023559396A 2021-11-15 2021-11-15 3次元計測システム、並びにその制御方法及び制御プログラム Active JP7721666B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/041969 WO2023084790A1 (ja) 2021-11-15 2021-11-15 3次元計測システム、並びにその制御方法及び制御プログラム

Publications (2)

Publication Number Publication Date
JPWO2023084790A1 JPWO2023084790A1 (https=) 2023-05-19
JP7721666B2 true JP7721666B2 (ja) 2025-08-12

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JP2023559396A Active JP7721666B2 (ja) 2021-11-15 2021-11-15 3次元計測システム、並びにその制御方法及び制御プログラム

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Country Link
JP (1) JP7721666B2 (https=)
WO (1) WO2023084790A1 (https=)

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009033338A (ja) * 2007-07-25 2009-02-12 Olympus Imaging Corp 撮像装置
JP5881235B2 (ja) * 2011-08-05 2016-03-09 Jukiオートメーションシステムズ株式会社 3次元測定装置、3次元測定方法及びプログラム
JP6330574B2 (ja) * 2014-08-20 2018-05-30 オムロン株式会社 基板検査装置のティーチング装置及びティーチング方法
JP6970551B2 (ja) * 2017-07-31 2021-11-24 株式会社キーエンス 形状測定装置及び形状測定方法

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Publication number Publication date
WO2023084790A1 (ja) 2023-05-19
JPWO2023084790A1 (https=) 2023-05-19

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