JPWO2023084790A1 - - Google Patents
Info
- Publication number
- JPWO2023084790A1 JPWO2023084790A1 JP2023559396A JP2023559396A JPWO2023084790A1 JP WO2023084790 A1 JPWO2023084790 A1 JP WO2023084790A1 JP 2023559396 A JP2023559396 A JP 2023559396A JP 2023559396 A JP2023559396 A JP 2023559396A JP WO2023084790 A1 JPWO2023084790 A1 JP WO2023084790A1
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
- G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T1/00—General purpose image data processing
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Theoretical Computer Science (AREA)
- Length Measuring Devices By Optical Means (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| PCT/JP2021/041969 WO2023084790A1 (ja) | 2021-11-15 | 2021-11-15 | 3次元計測システム、並びにその制御方法及び制御プログラム |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPWO2023084790A1 true JPWO2023084790A1 (https=) | 2023-05-19 |
| JP7721666B2 JP7721666B2 (ja) | 2025-08-12 |
Family
ID=86335475
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2023559396A Active JP7721666B2 (ja) | 2021-11-15 | 2021-11-15 | 3次元計測システム、並びにその制御方法及び制御プログラム |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP7721666B2 (https=) |
| WO (1) | WO2023084790A1 (https=) |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009033338A (ja) * | 2007-07-25 | 2009-02-12 | Olympus Imaging Corp | 撮像装置 |
| JP2013036791A (ja) * | 2011-08-05 | 2013-02-21 | Sony Corp | 3次元測定装置、3次元測定方法及びプログラム |
| JP2016045019A (ja) * | 2014-08-20 | 2016-04-04 | オムロン株式会社 | 基板検査装置のティーチング装置及びティーチング方法 |
| JP2019027947A (ja) * | 2017-07-31 | 2019-02-21 | 株式会社キーエンス | 形状測定装置及び形状測定方法 |
-
2021
- 2021-11-15 WO PCT/JP2021/041969 patent/WO2023084790A1/ja not_active Ceased
- 2021-11-15 JP JP2023559396A patent/JP7721666B2/ja active Active
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009033338A (ja) * | 2007-07-25 | 2009-02-12 | Olympus Imaging Corp | 撮像装置 |
| JP2013036791A (ja) * | 2011-08-05 | 2013-02-21 | Sony Corp | 3次元測定装置、3次元測定方法及びプログラム |
| JP2016045019A (ja) * | 2014-08-20 | 2016-04-04 | オムロン株式会社 | 基板検査装置のティーチング装置及びティーチング方法 |
| JP2019027947A (ja) * | 2017-07-31 | 2019-02-21 | 株式会社キーエンス | 形状測定装置及び形状測定方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| WO2023084790A1 (ja) | 2023-05-19 |
| JP7721666B2 (ja) | 2025-08-12 |
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