JP7676538B2 - ガラス容器検査システム - Google Patents

ガラス容器検査システム Download PDF

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Publication number
JP7676538B2
JP7676538B2 JP2023516498A JP2023516498A JP7676538B2 JP 7676538 B2 JP7676538 B2 JP 7676538B2 JP 2023516498 A JP2023516498 A JP 2023516498A JP 2023516498 A JP2023516498 A JP 2023516498A JP 7676538 B2 JP7676538 B2 JP 7676538B2
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JP
Japan
Prior art keywords
glass container
mirror
container
image
inspection system
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JP2023516498A
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English (en)
Japanese (ja)
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JPWO2022055596A5 (enExample
JP2023542865A (ja
Inventor
ジェームス クリスマン，ベンジャミン
レオ クレス，マイケル
ジョセフ トロベッタ，ジェイコブ
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アプライド ビジョン コーポレーション
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Publication of JPWO2022055596A5 publication Critical patent/JPWO2022055596A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9036—Investigating the presence of flaws or contamination in a container or its contents using arrays of emitters or receivers
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/023—Catoptric systems, e.g. image erecting and reversing system for extending or folding an optical path, e.g. delay lines
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B17/00—Systems with reflecting surfaces, with or without refracting elements
    • G02B17/02—Catoptric systems, e.g. image erecting and reversing system
    • G02B17/06—Catoptric systems, e.g. image erecting and reversing system using mirrors only, i.e. having only one curved mirror
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/02—Diffusing elements; Afocal elements
    • G02B5/0273—Diffusing elements; Afocal elements characterized by the use
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G06T7/001—Industrial image inspection using an image reference approach
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/90—Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/18—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast
    • H04N7/183—Closed-circuit television [CCTV] systems, i.e. systems in which the video signal is not broadcast for receiving images from a single remote source
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/061—Sources
    • G01N2201/06126—Large diffuse sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0634—Diffuse illumination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/063—Illuminating optical parts
    • G01N2201/0636—Reflectors

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Signal Processing (AREA)
  • Multimedia (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2023516498A 2020-09-10 2021-06-28 ガラス容器検査システム Active JP7676538B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
US202063076763P 2020-09-10 2020-09-10
US63/076,763 2020-09-10
US17/110,277 US11047803B1 (en) 2020-09-10 2020-12-02 Glass container inspection system
US17/110,277 2020-12-02
PCT/US2021/039463 WO2022055596A1 (en) 2020-09-10 2021-06-28 Glass container inspection system

Publications (3)

Publication Number Publication Date
JP2023542865A JP2023542865A (ja) 2023-10-12
JPWO2022055596A5 JPWO2022055596A5 (enExample) 2024-07-01
JP7676538B2 true JP7676538B2 (ja) 2025-05-14

Family

ID=76548344

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023516498A Active JP7676538B2 (ja) 2020-09-10 2021-06-28 ガラス容器検査システム

Country Status (7)

Country Link
US (1) US11047803B1 (enExample)
EP (1) EP4211449A4 (enExample)
JP (1) JP7676538B2 (enExample)
KR (1) KR102873429B1 (enExample)
CN (1) CN116888458A (enExample)
MX (1) MX2023002918A (enExample)
WO (1) WO2022055596A1 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
PT4244576T (pt) * 2020-11-11 2025-10-29 Centrum Voor Technische Informatica B V Método para inspeção de produtos de vidro ocos de material de produto de vidro
US12445707B2 (en) * 2022-09-19 2025-10-14 Applied Vision Corporation Glass container inspection system
CN119985515B (zh) * 2025-04-16 2025-07-08 潍坊天恒检测科技有限公司 一种不旋转玻璃瓶裂纹检测设备及其检测方法

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000241363A (ja) 1999-02-22 2000-09-08 Mitsubishi Heavy Ind Ltd 物品の外観検査装置及び外観検査方法
JP2005134358A (ja) 2003-10-28 2005-05-26 Yoshihiko Takashima ４枚の傾斜ミラーの使用により、カメラ１台で平面と４方向側面を撮像する方式
US20060126060A1 (en) 2002-10-25 2006-06-15 Olivier Colle Lighting method and device for detection of surface defects and/or unfilled finish on the finish of a container
WO2012172695A1 (ja) 2011-06-15 2012-12-20 キリンテクノシステム株式会社 ガラス壜の検査方法および装置
WO2017196193A1 (en) 2016-05-10 2017-11-16 Ksm Vision Sp. Z O.O. System for control of the external surfaces and geometry of objects manufactured on production lines, utilizing peripheral observation at a full 360° angular range

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AR207635A1 (es) * 1973-06-27 1976-10-22 Connor B O Aparato para senalar la presencia de materia extrana y/o grietas en envases translucidos
US4424441A (en) * 1981-06-12 1984-01-03 Owens-Illinois, Inc. Method and apparatus for inspecting glass containers
NL8800866A (nl) * 1988-04-05 1989-11-01 Thomassen & Drijver Inspektie-inrichting.
DE4022733C1 (en) * 1989-12-19 1991-05-08 Elpatronic Ag, Zug, Ch Three=dimensional cavity inspection appts. - uses matrix or line camera to receive reflected light via gp. of four mirrors and deflecting mirror
EP1553405B1 (de) * 1993-07-30 2011-03-30 Krones AG Inspektionsmaschine
EP0657732A1 (de) * 1993-12-06 1995-06-14 Elpatronic Ag Verfahren und Vorrichtung zur optischen Prüfung eines durchsichtigen Behälterbereichs, insbesondere des Mündungsbereichs
US5495330A (en) * 1994-09-16 1996-02-27 Emhart Glass Machinery Investments Inc. Container inspection machine having sequentially accessed computer alignment gages
US5699152A (en) * 1995-04-03 1997-12-16 Alltrista Corporation Electro-optical inspection system and method
JP3614597B2 (ja) * 1996-10-24 2005-01-26 三菱原子燃料株式会社 内面撮像装置
DE19940363C2 (de) * 1999-08-25 2003-08-07 Krones Ag Vorrichtung und Verfahren zur optischen Inspektion offener Getränkebehälter
US6104482A (en) 1999-12-02 2000-08-15 Owens-Brockway Glass Container Inc. Container finish check detection
US6512239B1 (en) 2000-06-27 2003-01-28 Photon Dynamics Canada Inc. Stereo vision inspection system for transparent media
DE20103875U1 (de) 2001-03-07 2001-08-16 Vollmar Gmbh Abwasseranlage mit Reinigungsvorrichtung
US6795176B1 (en) * 2003-06-30 2004-09-21 Emhart Glass S.A. Container inspection machine
US20040263620A1 (en) * 2003-06-30 2004-12-30 Diehr Richard D. Container inspection machine
US7816639B2 (en) 2006-10-23 2010-10-19 Emhart Glass S.A. Machine for inspecting glass containers at an inspection station using an addition of a plurality of illuminations of reflected light
US7876951B2 (en) 2006-10-23 2011-01-25 Emhart Glass S. A. Machine for inspecting glass containers
JP5883779B2 (ja) * 2012-05-29 2016-03-15 株式会社 日立産業制御ソリューションズ 撮像装置および照明装置
FR3005354B1 (fr) * 2013-05-03 2015-05-15 Msc & Sgcc Procede et dispositif d'observation et d'analyse de singularites optiques portees par des recipients en verre
US9322787B1 (en) 2014-10-18 2016-04-26 Emhart Glass S.A. Glass container inspection machine with a graphic user interface
TW201706591A (zh) * 2015-05-08 2017-02-16 工業動力有限公司 使用光線以檢測瓶子及容器之系統及方法
US10012598B2 (en) 2015-07-17 2018-07-03 Emhart S.A. Multi-wavelength laser check detection tool
FR3053792B1 (fr) * 2016-07-06 2023-07-14 Tiama Procede, dispositif et ligne d'inspection pour la determination d'une bavure a l'endroit d'un bord interne d'une surface de bague
FR3076619B1 (fr) * 2018-01-05 2020-01-24 Tiama Procede, dispositif et ligne d'inspection pour determiner la geometrie tridimensionnelle d'une surface de bague de recipient

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000241363A (ja) 1999-02-22 2000-09-08 Mitsubishi Heavy Ind Ltd 物品の外観検査装置及び外観検査方法
US20060126060A1 (en) 2002-10-25 2006-06-15 Olivier Colle Lighting method and device for detection of surface defects and/or unfilled finish on the finish of a container
JP2005134358A (ja) 2003-10-28 2005-05-26 Yoshihiko Takashima ４枚の傾斜ミラーの使用により、カメラ１台で平面と４方向側面を撮像する方式
WO2012172695A1 (ja) 2011-06-15 2012-12-20 キリンテクノシステム株式会社 ガラス壜の検査方法および装置
WO2017196193A1 (en) 2016-05-10 2017-11-16 Ksm Vision Sp. Z O.O. System for control of the external surfaces and geometry of objects manufactured on production lines, utilizing peripheral observation at a full 360° angular range

Also Published As

Publication number Publication date
KR102873429B1 (ko) 2025-10-21
EP4211449A4 (en) 2024-10-23
CN116888458A (zh) 2023-10-13
EP4211449A1 (en) 2023-07-19
MX2023002918A (es) 2023-07-26
KR20230106151A (ko) 2023-07-12
JP2023542865A (ja) 2023-10-12
WO2022055596A1 (en) 2022-03-17
US11047803B1 (en) 2021-06-29

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