JP7673216B2 - 自動分析装置とその制御方法 - Google Patents

自動分析装置とその制御方法 Download PDF

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Publication number
JP7673216B2
JP7673216B2 JP2023546797A JP2023546797A JP7673216B2 JP 7673216 B2 JP7673216 B2 JP 7673216B2 JP 2023546797 A JP2023546797 A JP 2023546797A JP 2023546797 A JP2023546797 A JP 2023546797A JP 7673216 B2 JP7673216 B2 JP 7673216B2
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Prior art keywords
measurement
sample
analysis
analysis module
quality control
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Japanese (ja)
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JPWO2023037732A1 (https=
Inventor
博文 塩畑
正志 圷
真章 近久
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Hitachi High Tech Corp
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Hitachi High Tech Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00712—Automatic status testing, e.g. at start-up or periodic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling

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  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Quality & Reliability (AREA)
  • Engineering & Computer Science (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2023546797A 2021-09-08 2022-06-30 自動分析装置とその制御方法 Active JP7673216B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2021146034 2021-09-08
JP2021146034 2021-09-08
PCT/JP2022/026252 WO2023037732A1 (ja) 2021-09-08 2022-06-30 自動分析装置とその制御方法

Publications (2)

Publication Number Publication Date
JPWO2023037732A1 JPWO2023037732A1 (https=) 2023-03-16
JP7673216B2 true JP7673216B2 (ja) 2025-05-08

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JP2023546797A Active JP7673216B2 (ja) 2021-09-08 2022-06-30 自動分析装置とその制御方法

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US (1) US20240353435A1 (https=)
EP (1) EP4400843A4 (https=)
JP (1) JP7673216B2 (https=)
CN (1) CN117795346A (https=)
WO (1) WO2023037732A1 (https=)

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002350970A (ja) 2001-05-23 2002-12-04 East Japan Railway Co カメラ用ハウジング
JP2006071451A (ja) 2004-09-02 2006-03-16 Keyence Corp 試料表示装置、試料表示装置の操作方法、試料表示装置操作プログラムおよびコンピュータで読み取り可能な記録媒体又は記録した機器
US20080006653A1 (en) 2006-03-13 2008-01-10 Biomachines, Inc. Small volume liquid handling system
JP2008175791A (ja) 2007-01-22 2008-07-31 Juki Corp 分注装置
JP2010175420A (ja) 2009-01-30 2010-08-12 Hitachi High-Technologies Corp 試料分析装置
JP2017151002A (ja) 2016-02-25 2017-08-31 株式会社日立ハイテクノロジーズ 自動分析装置
JP2019000961A (ja) 2017-06-19 2019-01-10 国立大学法人東京工業大学 テレスコピック型ロボットアーム

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2996860B2 (ja) * 1994-03-18 2000-01-11 株式会社日立製作所 自動分析装置
JP2006038881A (ja) * 2005-10-20 2006-02-09 Hitachi Ltd 生体サンプルの自動分析システム
JP4919677B2 (ja) * 2006-03-07 2012-04-18 株式会社日立ハイテクノロジーズ 自動分析システム及び当該自動分析システムの制御方法
EP3588093B1 (en) * 2017-02-22 2024-12-18 Hitachi High-Tech Corporation Automated analyzer
EP3640646A1 (en) * 2018-10-16 2020-04-22 F. Hoffmann-La Roche AG Method of operating an analytical laboratory

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002350970A (ja) 2001-05-23 2002-12-04 East Japan Railway Co カメラ用ハウジング
JP2006071451A (ja) 2004-09-02 2006-03-16 Keyence Corp 試料表示装置、試料表示装置の操作方法、試料表示装置操作プログラムおよびコンピュータで読み取り可能な記録媒体又は記録した機器
US20080006653A1 (en) 2006-03-13 2008-01-10 Biomachines, Inc. Small volume liquid handling system
JP2008175791A (ja) 2007-01-22 2008-07-31 Juki Corp 分注装置
JP2010175420A (ja) 2009-01-30 2010-08-12 Hitachi High-Technologies Corp 試料分析装置
JP2017151002A (ja) 2016-02-25 2017-08-31 株式会社日立ハイテクノロジーズ 自動分析装置
JP2019000961A (ja) 2017-06-19 2019-01-10 国立大学法人東京工業大学 テレスコピック型ロボットアーム

Also Published As

Publication number Publication date
EP4400843A4 (en) 2025-08-06
JPWO2023037732A1 (https=) 2023-03-16
CN117795346A (zh) 2024-03-29
WO2023037732A1 (ja) 2023-03-16
EP4400843A1 (en) 2024-07-17
US20240353435A1 (en) 2024-10-24

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