JP7664918B2 - 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム - Google Patents

異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム Download PDF

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JP7664918B2
JP7664918B2 JP2022526579A JP2022526579A JP7664918B2 JP 7664918 B2 JP7664918 B2 JP 7664918B2 JP 2022526579 A JP2022526579 A JP 2022526579A JP 2022526579 A JP2022526579 A JP 2022526579A JP 7664918 B2 JP7664918 B2 JP 7664918B2
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modulation
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abnormality
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JPWO2021241576A1 (https=
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洋輝 岡
幸一 山野
史浩 三好
弘康 近藤
英俊 小園
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Daicel Corp
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    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0259—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the response to fault detection
    • G05B23/0275—Fault isolation and identification, e.g. classify fault; estimate cause or root of failure
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/4183—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by data acquisition, e.g. workpiece identification
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B19/00—Program-control systems
    • G05B19/02—Program-control systems electric
    • G05B19/418—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM]
    • G05B19/4184—Total factory control, i.e. centrally controlling a plurality of machines, e.g. direct or distributed numerical control [DNC], flexible manufacturing systems [FMS], integrated manufacturing systems [IMS] or computer integrated manufacturing [CIM] characterised by fault tolerance, reliability of production system
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
    • Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
    • Y02P90/02—Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS]

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Automation & Control Theory (AREA)
  • General Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Quality & Reliability (AREA)
  • Testing And Monitoring For Control Systems (AREA)
JP2022526579A 2020-05-29 2021-05-25 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム Active JP7664918B2 (ja)

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JP2020095036 2020-05-29
JP2020095036 2020-05-29
PCT/JP2021/019798 WO2021241576A1 (ja) 2020-05-29 2021-05-25 異常変調原因特定装置、異常変調原因特定方法及び異常変調原因特定プログラム

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JPWO2021241576A1 JPWO2021241576A1 (https=) 2021-12-02
JP7664918B2 true JP7664918B2 (ja) 2025-04-18

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US (1) US12591233B2 (https=)
EP (1) EP4160342A4 (https=)
JP (1) JP7664918B2 (https=)
CN (1) CN115698882B (https=)
WO (1) WO2021241576A1 (https=)

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KR102711997B1 (ko) * 2021-11-12 2024-09-30 (주)미소정보기술 비정상을 감지하는 방법
CN114296105B (zh) * 2021-12-27 2024-06-14 中国第一汽车股份有限公司 一种定位故障原因确定方法、装置、设备以及存储介质
JPWO2023127748A1 (https=) * 2021-12-27 2023-07-06
JP7798266B2 (ja) * 2022-03-31 2026-01-14 国立研究開発法人産業技術総合研究所 システムバランス変動及びその予兆の表示方法、当該方法を用いた情報処理装置及びプログラム
TW202403912A (zh) * 2022-07-01 2024-01-16 聯華電子股份有限公司 用於偵測參數行為偏離的錯誤偵測方法
CN116050709A (zh) * 2023-02-14 2023-05-02 北京博维仕科技股份有限公司 一种输煤运行智能化监视方法和系统
JP2024152365A (ja) 2023-04-14 2024-10-25 株式会社ダイセル 異常検知方法、異常検知システム及び異常検知プログラム
WO2024218906A1 (ja) * 2023-04-19 2024-10-24 三菱電機株式会社 監視制御装置および監視制御システム
CN119428047A (zh) * 2023-07-31 2025-02-14 汉拿万都株式会社 电磁阀异常检测装置及方法、计算机可读存储介质
KR20250040892A (ko) * 2023-09-15 2025-03-25 주식회사 히타치하이테크 프로세스 처리 장치의 진단 장치, 진단 시스템, 및 진단 방법
CN117290146A (zh) * 2023-10-13 2023-12-26 深圳市富芯通科技有限公司 一种针对固态硬盘故障误判的处理方法以及装置
CN117571107B (zh) * 2024-01-15 2024-03-15 山西富衡达自动化设备有限公司 一种智能化无人值守地磅异常监测系统

Citations (2)

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JP2003167624A (ja) 2001-11-29 2003-06-13 Daicel Chem Ind Ltd プラント制御監視装置
JP2019179400A (ja) 2018-03-30 2019-10-17 エヌ・ティ・ティ・コミュニケーションズ株式会社 監視装置、監視方法および監視プログラム

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JP6862190B2 (ja) 2017-01-24 2021-04-21 株式会社東芝 プロセス診断装置、プロセス診断方法及びプロセス診断システム
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JP6711323B2 (ja) 2017-07-04 2020-06-17 Ｊｆｅスチール株式会社 プロセスの異常状態診断方法および異常状態診断装置
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JP2019179400A (ja) 2018-03-30 2019-10-17 エヌ・ティ・ティ・コミュニケーションズ株式会社 監視装置、監視方法および監視プログラム

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CN115698882B (zh) 2026-02-17
US20230213926A1 (en) 2023-07-06
WO2021241576A1 (ja) 2021-12-02
EP4160342A4 (en) 2024-07-17
JPWO2021241576A1 (https=) 2021-12-02
CN115698882A (zh) 2023-02-03
EP4160342A1 (en) 2023-04-05
US12591233B2 (en) 2026-03-31

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