JP7574542B2 - 検眼システム、検眼用コントローラ、および検眼プログラム - Google Patents

検眼システム、検眼用コントローラ、および検眼プログラム Download PDF

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Publication number
JP7574542B2
JP7574542B2 JP2020063522A JP2020063522A JP7574542B2 JP 7574542 B2 JP7574542 B2 JP 7574542B2 JP 2020063522 A JP2020063522 A JP 2020063522A JP 2020063522 A JP2020063522 A JP 2020063522A JP 7574542 B2 JP7574542 B2 JP 7574542B2
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eye
optotype
optometry
subject
correction
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Japanese (ja)
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JP2021159284A (ja
JP2021159284A5 (https=
Inventor
尋久 寺部
妙子 堀野
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Nidek Co Ltd
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Nidek Co Ltd
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Priority to JP2020063522A priority Critical patent/JP7574542B2/ja
Priority to PCT/JP2021/012743 priority patent/WO2021200605A1/ja
Priority to EP21778796.9A priority patent/EP4129154A4/en
Publication of JP2021159284A publication Critical patent/JP2021159284A/ja
Publication of JP2021159284A5 publication Critical patent/JP2021159284A5/ja
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  • Eye Examination Apparatus (AREA)
JP2020063522A 2020-03-31 2020-03-31 検眼システム、検眼用コントローラ、および検眼プログラム Active JP7574542B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2020063522A JP7574542B2 (ja) 2020-03-31 2020-03-31 検眼システム、検眼用コントローラ、および検眼プログラム
PCT/JP2021/012743 WO2021200605A1 (ja) 2020-03-31 2021-03-25 検眼システム、検眼用コントローラ、および検眼プログラム
EP21778796.9A EP4129154A4 (en) 2020-03-31 2021-03-25 OPTOMETRY SYSTEM, OPTOMETRY CONTROLLER AND OPTOMETRY PROGRAM

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2020063522A JP7574542B2 (ja) 2020-03-31 2020-03-31 検眼システム、検眼用コントローラ、および検眼プログラム

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JP2021159284A JP2021159284A (ja) 2021-10-11
JP2021159284A5 JP2021159284A5 (https=) 2023-03-02
JP7574542B2 true JP7574542B2 (ja) 2024-10-29

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Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN118356581B (zh) * 2024-05-24 2025-01-07 超目科技(北京)有限公司 一种眼球震颤电刺激智能控制系统

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019062978A (ja) 2017-09-28 2019-04-25 株式会社トプコン 検眼装置、方法およびプログラム
US20190216312A1 (en) 2018-01-15 2019-07-18 Vph Intellectual Property, Llc Remote eye examination system

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2019062978A (ja) 2017-09-28 2019-04-25 株式会社トプコン 検眼装置、方法およびプログラム
US20190216312A1 (en) 2018-01-15 2019-07-18 Vph Intellectual Property, Llc Remote eye examination system

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