JP7525117B2 - 材料応答を検出する方法およびシステム - Google Patents

材料応答を検出する方法およびシステム Download PDF

Info

Publication number
JP7525117B2
JP7525117B2 JP2021503003A JP2021503003A JP7525117B2 JP 7525117 B2 JP7525117 B2 JP 7525117B2 JP 2021503003 A JP2021503003 A JP 2021503003A JP 2021503003 A JP2021503003 A JP 2021503003A JP 7525117 B2 JP7525117 B2 JP 7525117B2
Authority
JP
Japan
Prior art keywords
magnetic field
field
sample
compensation
atomic magnetometer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2021503003A
Other languages
English (en)
Japanese (ja)
Other versions
JP2021530709A (ja
JP2021530709A5 (https=
JPWO2020016557A5 (https=
Inventor
チャルザック,ウィトルド
ガートマン,ラファル
ベビントン,パトリック
Original Assignee
エヌピーエル マネージメント リミテッド
ザ・ユニバーシティ・オブ・ストラスクライド
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB1811928.9A external-priority patent/GB2575695B/en
Priority claimed from GBGB1813858.6A external-priority patent/GB201813858D0/en
Application filed by エヌピーエル マネージメント リミテッド, ザ・ユニバーシティ・オブ・ストラスクライド filed Critical エヌピーエル マネージメント リミテッド
Publication of JP2021530709A publication Critical patent/JP2021530709A/ja
Publication of JP2021530709A5 publication Critical patent/JP2021530709A5/ja
Publication of JPWO2020016557A5 publication Critical patent/JPWO2020016557A5/ja
Application granted granted Critical
Publication of JP7525117B2 publication Critical patent/JP7525117B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N24/00Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
    • G01N24/006Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects using optical pumping
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R33/00Arrangements or instruments for measuring magnetic variables
    • G01R33/20Arrangements or instruments for measuring magnetic variables involving magnetic resonance
    • G01R33/24Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux
    • G01R33/26Arrangements or instruments for measuring magnetic variables involving magnetic resonance for measuring direction or magnitude of magnetic fields or magnetic flux using optical pumping

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Optics & Photonics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Magnetic Variables (AREA)
JP2021503003A 2018-07-20 2019-07-11 材料応答を検出する方法およびシステム Active JP7525117B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB1811928.9A GB2575695B (en) 2018-07-20 2018-07-20 Method and system for detecting a material response
GB1811928.9 2018-07-20
GBGB1813858.6A GB201813858D0 (en) 2018-08-24 2018-08-24 Method and system for detecting a material response
GB1813858.6 2018-08-24
PCT/GB2019/051953 WO2020016557A1 (en) 2018-07-20 2019-07-11 Method and system for detecting a material response

Publications (4)

Publication Number Publication Date
JP2021530709A JP2021530709A (ja) 2021-11-11
JP2021530709A5 JP2021530709A5 (https=) 2022-07-11
JPWO2020016557A5 JPWO2020016557A5 (https=) 2022-07-11
JP7525117B2 true JP7525117B2 (ja) 2024-07-30

Family

ID=67515015

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2021503003A Active JP7525117B2 (ja) 2018-07-20 2019-07-11 材料応答を検出する方法およびシステム

Country Status (6)

Country Link
US (1) US11747302B2 (https=)
EP (1) EP3811068B1 (https=)
JP (1) JP7525117B2 (https=)
CN (1) CN112513623B (https=)
ES (1) ES2992289T3 (https=)
WO (1) WO2020016557A1 (https=)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2585851B (en) 2019-07-17 2021-08-25 Npl Management Ltd Atomic magnetometer system
GB2588114B (en) 2019-10-07 2022-04-13 Npl Management Ltd Method and system for generation of atomic spin orientation
US11486945B1 (en) * 2022-07-05 2022-11-01 Zhejiang University Of Science And Technology Device and method for measuring scalar magnetic field based on pulsed optical pumping
CN115754834B (zh) * 2022-10-24 2026-02-03 浙江科技学院 可用于涡流测量的稳定原子射频磁力仪

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040140799A1 (en) 2002-10-16 2004-07-22 The Trustees Of Princeton University High sensitivity atomic magnetometer and methods for using same
US20080010626A1 (en) 2005-06-01 2008-01-10 International Business Machines Corporation System and method for creating a standard cell library for use in circuit designs
US20100028949A1 (en) 2006-12-22 2010-02-04 Vincent Beuger Shrna-mediated inhibition of expression of alpha 1,6-fucosyltransferase
JP2010085134A (ja) 2008-09-30 2010-04-15 Hitachi High-Technologies Corp 磁場計測装置
JP2011007659A (ja) 2009-06-26 2011-01-13 Seiko Epson Corp 磁気センサー
JP2015121409A (ja) 2013-12-20 2015-07-02 株式会社東芝 埋設管検査装置及び埋設管検査方法
US20150219732A1 (en) 2012-08-24 2015-08-06 The Trustees Of Dartmouth College Method and Apparatus For Magnetic Susceptibility Tomography, Magnetoencephalography, and Taggant Or Contrast Agent Detection
JP2016050784A (ja) 2014-08-28 2016-04-11 ニッカ電測株式会社 光ポンピング原子磁力計、及び金属検出装置
JP2016085200A (ja) 2014-10-24 2016-05-19 コリア リサーチ インスティチュート オブ スタンダーズ アンド サイエンス 原子磁力計及びその動作方法
CN106842074A (zh) 2017-03-03 2017-06-13 中国人民解放军国防科学技术大学 基于纵向磁场调制的三轴矢量原子磁力仪及使用方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7521928B2 (en) 2006-11-07 2009-04-21 Trustees Of Princeton University Subfemtotesla radio-frequency atomic magnetometer for nuclear quadrupole resonance detection
WO2009079054A2 (en) * 2007-09-21 2009-06-25 The Regents Of The University Of California Radio frequency atomic magnetometer
US8212556B1 (en) * 2010-01-12 2012-07-03 Sandia Corporation Atomic magnetometer
US8970217B1 (en) 2010-04-14 2015-03-03 Hypres, Inc. System and method for noise reduction in magnetic resonance imaging
KR101206727B1 (ko) * 2011-01-03 2012-11-30 한국표준과학연구원 저자기장 핵자기공명 장치 및 저자기장 핵자기공명 방법
KR101287426B1 (ko) * 2011-10-26 2013-07-18 한국표준과학연구원 극저자기장 핵자기 공명 물체 식별 방법 및 극저자기장 핵자기 공명 물체 식별 장치
US9857441B2 (en) * 2013-06-20 2018-01-02 Honeywell International Inc. Single beam radio frequency atomic magnetometer
FR3008190B1 (fr) * 2013-07-08 2015-08-07 Commissariat Energie Atomique Procede et dispositif de mesure d'un champ magnetique au moyen d'excitations synchronisees
US9995800B1 (en) * 2014-04-29 2018-06-12 National Technology & Engineering Solutions Of Sandia, Llc Atomic magnetometer with multiple spatial channels
JP2017026402A (ja) * 2015-07-21 2017-02-02 キヤノン株式会社 光ポンピング磁力計及び磁気センシング方法

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20040140799A1 (en) 2002-10-16 2004-07-22 The Trustees Of Princeton University High sensitivity atomic magnetometer and methods for using same
US20080010626A1 (en) 2005-06-01 2008-01-10 International Business Machines Corporation System and method for creating a standard cell library for use in circuit designs
US20100028949A1 (en) 2006-12-22 2010-02-04 Vincent Beuger Shrna-mediated inhibition of expression of alpha 1,6-fucosyltransferase
JP2010085134A (ja) 2008-09-30 2010-04-15 Hitachi High-Technologies Corp 磁場計測装置
JP2011007659A (ja) 2009-06-26 2011-01-13 Seiko Epson Corp 磁気センサー
US20150219732A1 (en) 2012-08-24 2015-08-06 The Trustees Of Dartmouth College Method and Apparatus For Magnetic Susceptibility Tomography, Magnetoencephalography, and Taggant Or Contrast Agent Detection
JP2015121409A (ja) 2013-12-20 2015-07-02 株式会社東芝 埋設管検査装置及び埋設管検査方法
JP2016050784A (ja) 2014-08-28 2016-04-11 ニッカ電測株式会社 光ポンピング原子磁力計、及び金属検出装置
JP2016085200A (ja) 2014-10-24 2016-05-19 コリア リサーチ インスティチュート オブ スタンダーズ アンド サイエンス 原子磁力計及びその動作方法
CN106842074A (zh) 2017-03-03 2017-06-13 中国人民解放军国防科学技术大学 基于纵向磁场调制的三轴矢量原子磁力仪及使用方法

Also Published As

Publication number Publication date
US20210278371A1 (en) 2021-09-09
JP2021530709A (ja) 2021-11-11
ES2992289T3 (es) 2024-12-11
CN112513623B (zh) 2023-03-28
EP3811068A1 (en) 2021-04-28
CN112513623A (zh) 2021-03-16
EP3811068C0 (en) 2024-09-25
US11747302B2 (en) 2023-09-05
EP3811068B1 (en) 2024-09-25
WO2020016557A1 (en) 2020-01-23

Similar Documents

Publication Publication Date Title
Bevington et al. Enhanced material defect imaging with a radio-frequency atomic magnetometer
JP7525117B2 (ja) 材料応答を検出する方法およびシステム
Tsukada et al. Small eddy current testing sensor probe using a tunneling magnetoresistance sensor to detect cracks in steel structures
US20230400534A1 (en) Sensor using a field gradient in a given volume
Bevington et al. Non-destructive structural imaging of steelwork with atomic magnetometers
Nair et al. A GMR-based eddy current system for NDE of aircraft structures
Bevington et al. Imaging of material defects with a radio-frequency atomic magnetometer
US12044639B2 (en) Atomic magnetometer system
CN113777540B (zh) 一种包含磁通聚集器的金刚石nv色心磁力仪
GB2575695A (en) Method and system for detecting a material response
JP2021530709A5 (https=)
Zhou et al. Imaging damage in steel using a diamond magnetometer
Lekavicius et al. Magnetometry based on silicon-vacancy centers in isotopically purified 4 h-sic
Ye et al. Frequency domain analysis of magnetic field images obtained using TMR array sensors for subsurface defect detection and quantification
Kikuchi et al. Challenges for detection of small defects of submillimeter size in steel using magnetic flux leakage method with higher sensitive magnetic field sensors
Wang et al. Multi-frequency imaging with non-linear calibration of magnetoresistance sensors for surface and buried defects inspection
Likhachev et al. All-optical vector magnetometry based on fine and hyperfine interactions in spin-3 2 centers in silicon carbide
KR101929240B1 (ko) 웨이퍼 검사장치
JPWO2020016557A5 (https=)
Rushton et al. Polarization of radio-frequency magnetic fields in magnetic induction measurements with an atomic magnetometer
Bevington et al. Role of the primary radio frequency magnetic field distribution in atomic magnetometer based inductive measurements
Matsunaga et al. Application of a HTS coil with a magnetic sensor to nondestructive testing using a low-frequency magnetic field
Keenan et al. Compensated high temperature SQUID gradiometer for mobile NDE in magnetically noisy environments
Vindolet et al. Diamond quantum sensors for non-destructive testing
Majima et al. Thickness measurements using extremely low frequency eddy current testing via TMR Sensors operated with AC modulation

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220630

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20220630

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20220701

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20230428

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20230726

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230920

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20240105

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20240314

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20240607

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20240708

R150 Certificate of patent or registration of utility model

Ref document number: 7525117

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150