JP7448277B1 - 飛行時間型質量分析計 - Google Patents

飛行時間型質量分析計 Download PDF

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Publication number
JP7448277B1
JP7448277B1 JP2024002132A JP2024002132A JP7448277B1 JP 7448277 B1 JP7448277 B1 JP 7448277B1 JP 2024002132 A JP2024002132 A JP 2024002132A JP 2024002132 A JP2024002132 A JP 2024002132A JP 7448277 B1 JP7448277 B1 JP 7448277B1
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ion
vacuum
chamber
assembly
flight
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Japanese (ja)
Inventor
張郁
張碩
鄭明
相双紅
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Zhejiang Digena Diagnosis Technology Co Ltd
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Zhejiang Digena Diagnosis Technology Co Ltd
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/26Mass spectrometers or separator tubes
    • H01J49/34Dynamic spectrometers
    • H01J49/40Time-of-flight spectrometers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/04Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/24Vacuum systems, e.g. maintaining desired pressures

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
JP2024002132A 2023-04-21 2024-01-10 飛行時間型質量分析計 Active JP7448277B1 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN202310435298.8A CN116153761B (zh) 2023-04-21 2023-04-21 飞行时间质谱仪
CN202310435298.8 2023-04-21

Publications (1)

Publication Number Publication Date
JP7448277B1 true JP7448277B1 (ja) 2024-03-12

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JP2024002132A Active JP7448277B1 (ja) 2023-04-21 2024-01-10 飛行時間型質量分析計

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JP (1) JP7448277B1 (zh)
CN (1) CN116153761B (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113745091A (zh) * 2021-09-15 2021-12-03 深圳泰莱生物科技有限公司 一种质谱装置的控制系统及方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013105737A (ja) 2011-11-14 2013-05-30 Laser-Spectra Kk 顕微レーザー質量分析装置
CN109712862A (zh) 2019-01-28 2019-05-03 安图实验仪器(郑州)有限公司 适于基质辅助激光解析电离飞行时间质谱仪的光路系统

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GB0624679D0 (en) * 2006-12-11 2007-01-17 Shimadzu Corp A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer
CN101465261A (zh) * 2009-01-09 2009-06-24 厦门大学 一种高功率密度激光溅射电离飞行时间质谱仪及其应用
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CN107144360B (zh) * 2017-04-28 2019-08-02 中国科学院化学研究所 低电压弱场加速离子成像式小型光解碎片平动速度谱仪
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WO2019160801A1 (en) * 2018-02-13 2019-08-22 Biomerieux, Inc. Sample handling systems, mass spectrometers and related methods
WO2019229460A1 (en) * 2018-05-31 2019-12-05 Micromass Uk Limited Bench-top time of flight mass spectrometer
CN209216917U (zh) * 2018-11-23 2019-08-06 暨南大学 具有质谱样品快速干燥功能的质谱仪
CN109545647A (zh) * 2018-11-23 2019-03-29 暨南大学 具有质谱样品快速干燥功能的质谱仪及质谱分析方法
CN109444249A (zh) * 2018-11-23 2019-03-08 广州禾信康源医疗科技有限公司 用于真空仪器的真空进换样装置
CN209312715U (zh) * 2019-01-28 2019-08-27 安图实验仪器(郑州)有限公司 适于基质辅助激光解析电离飞行时间质谱仪的光路系统
CN109712863A (zh) * 2019-02-26 2019-05-03 安图实验仪器(郑州)有限公司 适于激光解析电离飞行时间质谱仪的真空交互系统
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CN211238162U (zh) * 2020-03-12 2020-08-11 厦门汉可真空仪器有限公司 一种小型基质辅助激光解析直线式飞行时间质谱仪
CN112103170A (zh) * 2020-09-08 2020-12-18 珠海美华医疗科技有限公司 舱门气压调整装置
CN214672498U (zh) * 2021-06-04 2021-11-09 深圳泰莱生物科技有限公司 一种高效稳定的电弧离子源
CN113745091A (zh) * 2021-09-15 2021-12-03 深圳泰莱生物科技有限公司 一种质谱装置的控制系统及方法
CN113725065A (zh) * 2021-09-15 2021-11-30 深圳泰莱生物科技有限公司 一种生化小分子飞行时间质谱系统
CN113745090A (zh) * 2021-09-15 2021-12-03 深圳泰莱生物科技有限公司 一种质谱装置的处理分析系统及方法
CN217544536U (zh) * 2022-04-29 2022-10-04 厦门金诺花生物技术有限公司 一种基质辅助激光解析电离离子源
CN115206770A (zh) * 2022-05-31 2022-10-18 华南师范大学 用于固体药品质谱分析的激光软电离离子源及其控制方法

Patent Citations (2)

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JP2013105737A (ja) 2011-11-14 2013-05-30 Laser-Spectra Kk 顕微レーザー質量分析装置
CN109712862A (zh) 2019-01-28 2019-05-03 安图实验仪器(郑州)有限公司 适于基质辅助激光解析电离飞行时间质谱仪的光路系统

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CN116153761B (zh) 2023-07-11
CN116153761A (zh) 2023-05-23

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