JP7448277B1 - 飛行時間型質量分析計 - Google Patents
飛行時間型質量分析計 Download PDFInfo
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- JP7448277B1 JP7448277B1 JP2024002132A JP2024002132A JP7448277B1 JP 7448277 B1 JP7448277 B1 JP 7448277B1 JP 2024002132 A JP2024002132 A JP 2024002132A JP 2024002132 A JP2024002132 A JP 2024002132A JP 7448277 B1 JP7448277 B1 JP 7448277B1
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- 238000004949 mass spectrometry Methods 0.000 claims abstract description 54
- 230000005284 excitation Effects 0.000 claims abstract description 40
- 238000012545 processing Methods 0.000 claims abstract description 22
- 238000000034 method Methods 0.000 claims abstract description 14
- 230000008569 process Effects 0.000 claims abstract description 9
- 150000002500 ions Chemical class 0.000 claims description 223
- 239000007788 liquid Substances 0.000 claims description 31
- 238000000605 extraction Methods 0.000 claims description 27
- 238000003384 imaging method Methods 0.000 claims description 24
- 230000001133 acceleration Effects 0.000 claims description 15
- 230000005540 biological transmission Effects 0.000 claims description 15
- 230000033001 locomotion Effects 0.000 claims description 13
- 238000005286 illumination Methods 0.000 claims description 12
- 239000000758 substrate Substances 0.000 claims description 11
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 11
- 238000010438 heat treatment Methods 0.000 claims description 8
- 239000002699 waste material Substances 0.000 claims description 8
- 239000011324 bead Substances 0.000 claims description 6
- 239000003153 chemical reaction reagent Substances 0.000 claims description 4
- 238000004891 communication Methods 0.000 claims description 3
- 238000002347 injection Methods 0.000 claims description 2
- 239000007924 injection Substances 0.000 claims description 2
- 238000007781 pre-processing Methods 0.000 claims description 2
- 238000010586 diagram Methods 0.000 abstract description 20
- 238000001514 detection method Methods 0.000 abstract description 17
- 238000005516 engineering process Methods 0.000 abstract description 4
- 108090000623 proteins and genes Proteins 0.000 abstract description 3
- 238000001269 time-of-flight mass spectrometry Methods 0.000 abstract description 3
- 238000011109 contamination Methods 0.000 abstract description 2
- 238000002360 preparation method Methods 0.000 abstract description 2
- 239000000523 sample Substances 0.000 description 25
- 230000005684 electric field Effects 0.000 description 18
- 238000007789 sealing Methods 0.000 description 12
- 238000012546 transfer Methods 0.000 description 8
- 230000003111 delayed effect Effects 0.000 description 7
- 238000009413 insulation Methods 0.000 description 7
- 230000000694 effects Effects 0.000 description 5
- 230000006870 function Effects 0.000 description 4
- 239000000463 material Substances 0.000 description 4
- 230000013011 mating Effects 0.000 description 4
- 238000005070 sampling Methods 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 230000009471 action Effects 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 238000012423 maintenance Methods 0.000 description 3
- 230000007246 mechanism Effects 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 239000012488 sample solution Substances 0.000 description 3
- 238000007493 shaping process Methods 0.000 description 3
- PXHVJJICTQNCMI-UHFFFAOYSA-N Nickel Chemical compound [Ni] PXHVJJICTQNCMI-UHFFFAOYSA-N 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 238000011156 evaluation Methods 0.000 description 2
- 239000000284 extract Substances 0.000 description 2
- 230000002452 interceptive effect Effects 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- 230000003321 amplification Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 229920001222 biopolymer Polymers 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000012864 cross contamination Methods 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000013500 data storage Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 238000003795 desorption Methods 0.000 description 1
- 239000006185 dispersion Substances 0.000 description 1
- 238000001035 drying Methods 0.000 description 1
- 230000005685 electric field effect Effects 0.000 description 1
- 230000005686 electrostatic field Effects 0.000 description 1
- 150000004676 glycans Chemical class 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 238000010884 ion-beam technique Methods 0.000 description 1
- 230000001678 irradiating effect Effects 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 238000007726 management method Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000010813 municipal solid waste Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 238000003199 nucleic acid amplification method Methods 0.000 description 1
- 229920001282 polysaccharide Polymers 0.000 description 1
- 239000005017 polysaccharide Substances 0.000 description 1
- 102000004169 proteins and genes Human genes 0.000 description 1
- 238000011084 recovery Methods 0.000 description 1
- 238000010992 reflux Methods 0.000 description 1
- 230000002441 reversible effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000035939 shock Effects 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 150000003384 small molecules Chemical class 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 230000009897 systematic effect Effects 0.000 description 1
- 238000002834 transmittance Methods 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/26—Mass spectrometers or separator tubes
- H01J49/34—Dynamic spectrometers
- H01J49/40—Time-of-flight spectrometers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/24—Vacuum systems, e.g. maintaining desired pressures
Landscapes
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202310435298.8A CN116153761B (zh) | 2023-04-21 | 2023-04-21 | 飞行时间质谱仪 |
CN202310435298.8 | 2023-04-21 |
Publications (1)
Publication Number | Publication Date |
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JP7448277B1 true JP7448277B1 (ja) | 2024-03-12 |
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JP2024002132A Active JP7448277B1 (ja) | 2023-04-21 | 2024-01-10 | 飛行時間型質量分析計 |
Country Status (2)
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JP (1) | JP7448277B1 (zh) |
CN (1) | CN116153761B (zh) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
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CN113745091A (zh) * | 2021-09-15 | 2021-12-03 | 深圳泰莱生物科技有限公司 | 一种质谱装置的控制系统及方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013105737A (ja) | 2011-11-14 | 2013-05-30 | Laser-Spectra Kk | 顕微レーザー質量分析装置 |
CN109712862A (zh) | 2019-01-28 | 2019-05-03 | 安图实验仪器(郑州)有限公司 | 适于基质辅助激光解析电离飞行时间质谱仪的光路系统 |
Family Cites Families (24)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7015463B2 (en) * | 2002-04-10 | 2006-03-21 | The Johns Hopkins University | Miniaturized sample scanning mass analyzer |
GB2390935A (en) * | 2002-07-16 | 2004-01-21 | Anatoli Nicolai Verentchikov | Time-nested mass analysis using a TOF-TOF tandem mass spectrometer |
KR20040034252A (ko) * | 2002-10-21 | 2004-04-28 | 삼성전자주식회사 | 매질 보조 레이저 탈착 여기 비행시간 질량분석기 |
GB0624679D0 (en) * | 2006-12-11 | 2007-01-17 | Shimadzu Corp | A time-of-flight mass spectrometer and a method of analysing ions in a time-of-flight mass spectrometer |
CN101465261A (zh) * | 2009-01-09 | 2009-06-24 | 厦门大学 | 一种高功率密度激光溅射电离飞行时间质谱仪及其应用 |
CN104267138A (zh) * | 2014-10-13 | 2015-01-07 | 中国药科大学 | 新型平面色谱点样仪 |
CN107144360B (zh) * | 2017-04-28 | 2019-08-02 | 中国科学院化学研究所 | 低电压弱场加速离子成像式小型光解碎片平动速度谱仪 |
CN107658205B (zh) * | 2017-09-29 | 2024-05-24 | 珠海美华医疗科技有限公司 | 一种maldi用光路及高压电场施加装置及质谱仪 |
WO2019160801A1 (en) * | 2018-02-13 | 2019-08-22 | Biomerieux, Inc. | Sample handling systems, mass spectrometers and related methods |
WO2019229460A1 (en) * | 2018-05-31 | 2019-12-05 | Micromass Uk Limited | Bench-top time of flight mass spectrometer |
CN209216917U (zh) * | 2018-11-23 | 2019-08-06 | 暨南大学 | 具有质谱样品快速干燥功能的质谱仪 |
CN109545647A (zh) * | 2018-11-23 | 2019-03-29 | 暨南大学 | 具有质谱样品快速干燥功能的质谱仪及质谱分析方法 |
CN109444249A (zh) * | 2018-11-23 | 2019-03-08 | 广州禾信康源医疗科技有限公司 | 用于真空仪器的真空进换样装置 |
CN209312715U (zh) * | 2019-01-28 | 2019-08-27 | 安图实验仪器(郑州)有限公司 | 适于基质辅助激光解析电离飞行时间质谱仪的光路系统 |
CN109712863A (zh) * | 2019-02-26 | 2019-05-03 | 安图实验仪器(郑州)有限公司 | 适于激光解析电离飞行时间质谱仪的真空交互系统 |
CN210964039U (zh) * | 2019-11-04 | 2020-07-10 | 四川阿尔法能源装备有限公司 | 一种用于放射化学的全自动固相萃取装置 |
CN211238162U (zh) * | 2020-03-12 | 2020-08-11 | 厦门汉可真空仪器有限公司 | 一种小型基质辅助激光解析直线式飞行时间质谱仪 |
CN112103170A (zh) * | 2020-09-08 | 2020-12-18 | 珠海美华医疗科技有限公司 | 舱门气压调整装置 |
CN214672498U (zh) * | 2021-06-04 | 2021-11-09 | 深圳泰莱生物科技有限公司 | 一种高效稳定的电弧离子源 |
CN113745091A (zh) * | 2021-09-15 | 2021-12-03 | 深圳泰莱生物科技有限公司 | 一种质谱装置的控制系统及方法 |
CN113725065A (zh) * | 2021-09-15 | 2021-11-30 | 深圳泰莱生物科技有限公司 | 一种生化小分子飞行时间质谱系统 |
CN113745090A (zh) * | 2021-09-15 | 2021-12-03 | 深圳泰莱生物科技有限公司 | 一种质谱装置的处理分析系统及方法 |
CN217544536U (zh) * | 2022-04-29 | 2022-10-04 | 厦门金诺花生物技术有限公司 | 一种基质辅助激光解析电离离子源 |
CN115206770A (zh) * | 2022-05-31 | 2022-10-18 | 华南师范大学 | 用于固体药品质谱分析的激光软电离离子源及其控制方法 |
-
2023
- 2023-04-21 CN CN202310435298.8A patent/CN116153761B/zh active Active
-
2024
- 2024-01-10 JP JP2024002132A patent/JP7448277B1/ja active Active
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2013105737A (ja) | 2011-11-14 | 2013-05-30 | Laser-Spectra Kk | 顕微レーザー質量分析装置 |
CN109712862A (zh) | 2019-01-28 | 2019-05-03 | 安图实验仪器(郑州)有限公司 | 适于基质辅助激光解析电离飞行时间质谱仪的光路系统 |
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CN116153761B (zh) | 2023-07-11 |
CN116153761A (zh) | 2023-05-23 |
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