JP7420976B2 - 自動分析装置および分析方法 - Google Patents

自動分析装置および分析方法 Download PDF

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Publication number
JP7420976B2
JP7420976B2 JP2022572148A JP2022572148A JP7420976B2 JP 7420976 B2 JP7420976 B2 JP 7420976B2 JP 2022572148 A JP2022572148 A JP 2022572148A JP 2022572148 A JP2022572148 A JP 2022572148A JP 7420976 B2 JP7420976 B2 JP 7420976B2
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Prior art keywords
reagent
photometer
measurement
analysis
automatic analyzer
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JP2022572148A
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English (en)
Japanese (ja)
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JPWO2022138249A1 (zh
Inventor
朋浩 松永
千枝 藪谷
博 大賀
興子 山本
昌彦 飯島
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Hitachi High Tech Corp
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Hitachi High Tech Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/49—Scattering, i.e. diffuse reflection within a body or fluid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/78—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/75—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated
    • G01N21/77—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator
    • G01N21/82—Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a precipitate or turbidity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations

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  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Plasma & Fusion (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2022572148A 2020-12-22 2021-12-10 自動分析装置および分析方法 Active JP7420976B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020212090 2020-12-22
JP2020212090 2020-12-22
PCT/JP2021/045644 WO2022138249A1 (ja) 2020-12-22 2021-12-10 自動分析装置および分析方法

Publications (2)

Publication Number Publication Date
JPWO2022138249A1 JPWO2022138249A1 (zh) 2022-06-30
JP7420976B2 true JP7420976B2 (ja) 2024-01-23

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JP2022572148A Active JP7420976B2 (ja) 2020-12-22 2021-12-10 自動分析装置および分析方法

Country Status (3)

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JP (1) JP7420976B2 (zh)
CN (1) CN116685843A (zh)
WO (1) WO2022138249A1 (zh)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018016252A1 (ja) 2016-07-19 2018-01-25 株式会社日立ハイテクノロジーズ 自動分析装置及び自動分析方法

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6013796B2 (ja) * 2012-06-25 2016-10-25 株式会社日立ハイテクノロジーズ 自動分析装置及び試料測定方法
JP6104746B2 (ja) * 2013-07-23 2017-03-29 株式会社日立ハイテクノロジーズ 自動分析装置および分析方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2018016252A1 (ja) 2016-07-19 2018-01-25 株式会社日立ハイテクノロジーズ 自動分析装置及び自動分析方法

Also Published As

Publication number Publication date
CN116685843A (zh) 2023-09-01
JPWO2022138249A1 (zh) 2022-06-30
WO2022138249A1 (ja) 2022-06-30

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