JP7416279B2 - 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置 - Google Patents

訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置 Download PDF

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JP7416279B2
JP7416279B2 JP2022555016A JP2022555016A JP7416279B2 JP 7416279 B2 JP7416279 B2 JP 7416279B2 JP 2022555016 A JP2022555016 A JP 2022555016A JP 2022555016 A JP2022555016 A JP 2022555016A JP 7416279 B2 JP7416279 B2 JP 7416279B2
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JPWO2022074750A5 (https=
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広明 山田
崇史 山▲崎▼
昇平 山根
隆 小林
陽一 巨智部
敏靖 大原
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Fujitsu Ltd
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    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/39—Circuit design at the physical level
    • G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/20—Design optimisation, verification or simulation
    • G06F30/27—Design optimisation, verification or simulation using machine learning, e.g. artificial intelligence, neural networks, support vector machines [SVM] or training a model
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/36—Circuit design at the analogue level
    • G06F30/367—Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

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  • Design And Manufacture Of Integrated Circuits (AREA)
  • Management, Administration, Business Operations System, And Electronic Commerce (AREA)
JP2022555016A 2020-10-06 2020-10-06 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置 Active JP7416279B2 (ja)

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PCT/JP2020/037924 WO2022074750A1 (ja) 2020-10-06 2020-10-06 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置

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JPWO2022074750A1 JPWO2022074750A1 (https=) 2022-04-14
JPWO2022074750A5 JPWO2022074750A5 (https=) 2023-03-22
JP7416279B2 true JP7416279B2 (ja) 2024-01-17

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US (1) US20230252356A1 (https=)
EP (1) EP4227848A4 (https=)
JP (1) JP7416279B2 (https=)
WO (1) WO2022074750A1 (https=)

Families Citing this family (2)

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DE102021206323A1 (de) * 2021-06-21 2022-12-22 Robert Bosch Gesellschaft mit beschränkter Haftung Verfahren zur Analyse einer elektrischen Schaltung
WO2025134410A1 (ja) * 2023-12-19 2025-06-26 株式会社デンソー 分析装置、分析プログラム、方法、半導体装置及び半導体ウエハ

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103728535A (zh) 2013-10-28 2014-04-16 昆明理工大学 一种基于小波变换暂态能量谱的特高压直流输电线路故障测距方法
JP2020060877A (ja) 2018-10-05 2020-04-16 富士通株式会社 推定プログラム、推定装置および推定方法
WO2020095362A1 (ja) 2018-11-06 2020-05-14 三菱電機株式会社 設計支援装置、設計支援方法および機械学習装置

Family Cites Families (4)

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Publication number Priority date Publication date Assignee Title
JP2783988B2 (ja) 1995-10-19 1998-08-06 松下電器産業株式会社 クロストーク現象解析装置及びこれを用いて最適化した回転トランス
US10706197B2 (en) * 2018-05-24 2020-07-07 Hitachi, Ltd. Automated electromagnetic interference filter design
US11704791B2 (en) 2018-08-30 2023-07-18 Topcon Corporation Multivariate and multi-resolution retinal image anomaly detection system
WO2020129617A1 (ja) 2018-12-19 2020-06-25 パナソニックＩｐマネジメント株式会社 外観検査装置及びそれを用いた溶接箇所の形状不良の有無及び種類の判定精度の向上方法、溶接システム及びそれを用いたワークの溶接方法

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103728535A (zh) 2013-10-28 2014-04-16 昆明理工大学 一种基于小波变换暂态能量谱的特高压直流输电线路故障测距方法
JP2020060877A (ja) 2018-10-05 2020-04-16 富士通株式会社 推定プログラム、推定装置および推定方法
WO2020095362A1 (ja) 2018-11-06 2020-05-14 三菱電機株式会社 設計支援装置、設計支援方法および機械学習装置

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EP4227848A4 (en) 2023-11-22
WO2022074750A1 (ja) 2022-04-14
EP4227848A1 (en) 2023-08-16
US20230252356A1 (en) 2023-08-10
JPWO2022074750A1 (https=) 2022-04-14

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