JP7416278B2 - 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置 - Google Patents

訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置 Download PDF

Info

Publication number
JP7416278B2
JP7416278B2 JP2022554999A JP2022554999A JP7416278B2 JP 7416278 B2 JP7416278 B2 JP 7416278B2 JP 2022554999 A JP2022554999 A JP 2022554999A JP 2022554999 A JP2022554999 A JP 2022554999A JP 7416278 B2 JP7416278 B2 JP 7416278B2
Authority
JP
Japan
Prior art keywords
training data
circuit
circuit information
emi
data generation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2022554999A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2022074728A5 (https=
JPWO2022074728A1 (https=
Inventor
広明 山田
昇平 山根
崇史 山▲崎▼
陽一 巨智部
敏靖 大原
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujitsu Ltd
Original Assignee
Fujitsu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujitsu Ltd filed Critical Fujitsu Ltd
Publication of JPWO2022074728A1 publication Critical patent/JPWO2022074728A1/ja
Publication of JPWO2022074728A5 publication Critical patent/JPWO2022074728A5/ja
Application granted granted Critical
Publication of JP7416278B2 publication Critical patent/JP7416278B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/20—Design optimisation, verification or simulation
    • G06F30/27—Design optimisation, verification or simulation using machine learning, e.g. artificial intelligence, neural networks, support vector machines [SVM] or training a model
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/39—Circuit design at the physical level
    • G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Software Systems (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Medical Informatics (AREA)
  • Computer Hardware Design (AREA)
  • Data Mining & Analysis (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Geometry (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2022554999A 2020-10-06 2020-10-06 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置 Active JP7416278B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/037829 WO2022074728A1 (ja) 2020-10-06 2020-10-06 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置

Publications (3)

Publication Number Publication Date
JPWO2022074728A1 JPWO2022074728A1 (https=) 2022-04-14
JPWO2022074728A5 JPWO2022074728A5 (https=) 2023-03-22
JP7416278B2 true JP7416278B2 (ja) 2024-01-17

Family

ID=81126705

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022554999A Active JP7416278B2 (ja) 2020-10-06 2020-10-06 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置

Country Status (4)

Country Link
US (1) US20230237381A1 (https=)
EP (1) EP4227847A4 (https=)
JP (1) JP7416278B2 (https=)
WO (1) WO2022074728A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025134410A1 (ja) * 2023-12-19 2025-06-26 株式会社デンソー 分析装置、分析プログラム、方法、半導体装置及び半導体ウエハ

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008078392A (ja) 2006-09-21 2008-04-03 Sharp Corp 特性解析方法および装置、異常設備推定方法および装置、上記特性解析方法または異常設備推定方法をコンピュータに実行させるためのプログラム、並びに上記プログラムを記録したコンピュータ読み取り可能な記録媒体
JP2011158373A (ja) 2010-02-02 2011-08-18 Dainippon Screen Mfg Co Ltd 自動欠陥分類のための教師データ作成方法、自動欠陥分類方法および自動欠陥分類装置
US20180089560A1 (en) 2016-09-28 2018-03-29 Dell Products, Lp High Speed Serial Links for High Volume Manufacturing
JP2019082874A (ja) 2017-10-31 2019-05-30 株式会社日立製作所 設計支援装置及び設計支援システム
JP2019101924A (ja) 2017-12-06 2019-06-24 株式会社豊田中央研究所 学習装置、電磁波反射特性推定装置、学習プログラム、および電磁波反射特性推定プログラム

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180197110A1 (en) * 2017-01-11 2018-07-12 Netspeed Systems, Inc. Metrics to Train Machine Learning Predictor for NoC Construction
JP2018194919A (ja) 2017-05-12 2018-12-06 富士通株式会社 学習プログラム、学習方法及び学習装置
US20240028907A1 (en) * 2017-12-28 2024-01-25 Intel Corporation Training data generators and methods for machine learning
EP3654103A1 (en) * 2018-11-14 2020-05-20 ASML Netherlands B.V. Method for obtaining training data for training a model of a semicondcutor manufacturing process
US20200166909A1 (en) * 2018-11-20 2020-05-28 Relativity Space, Inc. Real-time adaptive control of manufacturing processes using machine learning
SG11202105438XA (en) * 2018-11-26 2021-06-29 Agency Science Tech & Res Method and system for predicting performance in electronic design based on machine learning
SG11202105436YA (en) * 2018-11-26 2021-06-29 Agency Science Tech & Res Method and system for generating training data for a machine learning model for predicting performance in electronic design
JP7172612B2 (ja) * 2019-01-11 2022-11-16 富士通株式会社 データ拡張プログラム、データ拡張方法およびデータ拡張装置
US11790139B1 (en) * 2022-04-18 2023-10-17 Xilinx, Inc. Predicting a performance metric based on features of a circuit design and explaining marginal contributions of the features to the prediction

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008078392A (ja) 2006-09-21 2008-04-03 Sharp Corp 特性解析方法および装置、異常設備推定方法および装置、上記特性解析方法または異常設備推定方法をコンピュータに実行させるためのプログラム、並びに上記プログラムを記録したコンピュータ読み取り可能な記録媒体
JP2011158373A (ja) 2010-02-02 2011-08-18 Dainippon Screen Mfg Co Ltd 自動欠陥分類のための教師データ作成方法、自動欠陥分類方法および自動欠陥分類装置
US20180089560A1 (en) 2016-09-28 2018-03-29 Dell Products, Lp High Speed Serial Links for High Volume Manufacturing
JP2019082874A (ja) 2017-10-31 2019-05-30 株式会社日立製作所 設計支援装置及び設計支援システム
JP2019101924A (ja) 2017-12-06 2019-06-24 株式会社豊田中央研究所 学習装置、電磁波反射特性推定装置、学習プログラム、および電磁波反射特性推定プログラム

Also Published As

Publication number Publication date
US20230237381A1 (en) 2023-07-27
EP4227847A4 (en) 2023-11-22
JPWO2022074728A1 (https=) 2022-04-14
EP4227847A1 (en) 2023-08-16
WO2022074728A1 (ja) 2022-04-14

Similar Documents

Publication Publication Date Title
KR20210082210A (ko) 신경망을 사용한 통합 회로 플로어 플랜 생성
Liu et al. Multiple classifiers combination by clustering and selection
Koo et al. Fast algorithm for minimizing the number of decap in power distribution networks
WO2022252694A1 (zh) 神经网络优化方法及其装置
US20230252356A1 (en) Non-transitory computer-readable recording medium storing training data generation program, training data generation method, and training data generation device
JP2020060877A (ja) 推定プログラム、推定装置および推定方法
Li et al. Toward a Deeper understanding: RetNet viewed through convolution
JP7416278B2 (ja) 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置
KR102464963B1 (ko) 데이터 기반의 물체 위치 최적화를 위한 강화학습 장치
JP6323333B2 (ja) 基板設計方法及び設計装置
Hrytsyk et al. Real-time sensing, reasoning and adaptation for computer vision systems
JP2020098592A (ja) ウェブページ内容を抽出する方法、装置及び記憶媒体
Garbuglia et al. Bayesian optimization for microwave devices using deep GP spectral surrogate models
KR20200052411A (ko) 영상 분류 장치 및 방법
US7467077B2 (en) Mesh model creating method, simulation apparatus and computer-readable storage medium
Lenarduzzi et al. Kernel-based adaptive approximation of functions with discontinuities
US20070283299A1 (en) A Method And Apparatus To Target Pre-Determined Spatially Varying Voltage Variation Across The Area Of The VLSI Power Distribution System Using Frequency Domain Analysis
EP3910523B1 (en) Machine learning program, method and device for estimating the electromagnetic wave radiation situation of an electronic circuit
JP2023178008A (ja) 設計支援装置及び設計支援方法
CN115994601A (zh) 训练预测模型的装置及方法
Meyer Competitive learning of network diagram layout
CN120317195A (zh) 一种提高主板散热性能的热仿真分析方法及其系统
JP2022167044A (ja) Ｅｍｉ算出プログラム、ｅｍｉ算出方法およびｅｍｉ算出装置
US20240257901A1 (en) Information processing device, information processing method, and non- transitory computer-readable storage medium stored with information processing program
Dervenis et al. Neural network specialists for inverse spiral inductor design

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20230104

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20230104

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20230905

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20231102

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20231205

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20231218

R150 Certificate of patent or registration of utility model

Ref document number: 7416278

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150