JPWO2022074728A1 - - Google Patents

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Publication number
JPWO2022074728A1
JPWO2022074728A1 JP2022554999A JP2022554999A JPWO2022074728A1 JP WO2022074728 A1 JPWO2022074728 A1 JP WO2022074728A1 JP 2022554999 A JP2022554999 A JP 2022554999A JP 2022554999 A JP2022554999 A JP 2022554999A JP WO2022074728 A1 JPWO2022074728 A1 JP WO2022074728A1
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2022554999A
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Japanese (ja)
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JPWO2022074728A5 (https=
JP7416278B2 (ja
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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/20—Design optimisation, verification or simulation
    • G06F30/27—Design optimisation, verification or simulation using machine learning, e.g. artificial intelligence, neural networks, support vector machines [SVM] or training a model
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F30/00—Computer-aided design [CAD]
    • G06F30/30—Circuit design
    • G06F30/39—Circuit design at the physical level
    • G06F30/398—Design verification or optimisation, e.g. using design rule check [DRC], layout versus schematics [LVS] or finite element methods [FEM]
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06N—COMPUTING ARRANGEMENTS BASED ON SPECIFIC COMPUTATIONAL MODELS
    • G06N20/00—Machine learning

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Software Systems (AREA)
  • Evolutionary Computation (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Medical Informatics (AREA)
  • Computer Hardware Design (AREA)
  • Data Mining & Analysis (AREA)
  • Computing Systems (AREA)
  • Mathematical Physics (AREA)
  • Geometry (AREA)
  • Design And Manufacture Of Integrated Circuits (AREA)
  • Semiconductor Integrated Circuits (AREA)
JP2022554999A 2020-10-06 2020-10-06 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置 Active JP7416278B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/037829 WO2022074728A1 (ja) 2020-10-06 2020-10-06 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置

Publications (3)

Publication Number Publication Date
JPWO2022074728A1 true JPWO2022074728A1 (https=) 2022-04-14
JPWO2022074728A5 JPWO2022074728A5 (https=) 2023-03-22
JP7416278B2 JP7416278B2 (ja) 2024-01-17

Family

ID=81126705

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022554999A Active JP7416278B2 (ja) 2020-10-06 2020-10-06 訓練データ生成プログラム、訓練データ生成方法及び訓練データ生成装置

Country Status (4)

Country Link
US (1) US20230237381A1 (https=)
EP (1) EP4227847A4 (https=)
JP (1) JP7416278B2 (https=)
WO (1) WO2022074728A1 (https=)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025134410A1 (ja) * 2023-12-19 2025-06-26 株式会社デンソー 分析装置、分析プログラム、方法、半導体装置及び半導体ウエハ

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008078392A (ja) * 2006-09-21 2008-04-03 Sharp Corp 特性解析方法および装置、異常設備推定方法および装置、上記特性解析方法または異常設備推定方法をコンピュータに実行させるためのプログラム、並びに上記プログラムを記録したコンピュータ読み取り可能な記録媒体
JP2011158373A (ja) * 2010-02-02 2011-08-18 Dainippon Screen Mfg Co Ltd 自動欠陥分類のための教師データ作成方法、自動欠陥分類方法および自動欠陥分類装置
US20180089560A1 (en) * 2016-09-28 2018-03-29 Dell Products, Lp High Speed Serial Links for High Volume Manufacturing
JP2019082874A (ja) * 2017-10-31 2019-05-30 株式会社日立製作所 設計支援装置及び設計支援システム
JP2019101924A (ja) * 2017-12-06 2019-06-24 株式会社豊田中央研究所 学習装置、電磁波反射特性推定装置、学習プログラム、および電磁波反射特性推定プログラム

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20180197110A1 (en) * 2017-01-11 2018-07-12 Netspeed Systems, Inc. Metrics to Train Machine Learning Predictor for NoC Construction
JP2018194919A (ja) 2017-05-12 2018-12-06 富士通株式会社 学習プログラム、学習方法及び学習装置
US20240028907A1 (en) * 2017-12-28 2024-01-25 Intel Corporation Training data generators and methods for machine learning
EP3654103A1 (en) * 2018-11-14 2020-05-20 ASML Netherlands B.V. Method for obtaining training data for training a model of a semicondcutor manufacturing process
US20200166909A1 (en) * 2018-11-20 2020-05-28 Relativity Space, Inc. Real-time adaptive control of manufacturing processes using machine learning
SG11202105438XA (en) * 2018-11-26 2021-06-29 Agency Science Tech & Res Method and system for predicting performance in electronic design based on machine learning
SG11202105436YA (en) * 2018-11-26 2021-06-29 Agency Science Tech & Res Method and system for generating training data for a machine learning model for predicting performance in electronic design
JP7172612B2 (ja) * 2019-01-11 2022-11-16 富士通株式会社 データ拡張プログラム、データ拡張方法およびデータ拡張装置
US11790139B1 (en) * 2022-04-18 2023-10-17 Xilinx, Inc. Predicting a performance metric based on features of a circuit design and explaining marginal contributions of the features to the prediction

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008078392A (ja) * 2006-09-21 2008-04-03 Sharp Corp 特性解析方法および装置、異常設備推定方法および装置、上記特性解析方法または異常設備推定方法をコンピュータに実行させるためのプログラム、並びに上記プログラムを記録したコンピュータ読み取り可能な記録媒体
JP2011158373A (ja) * 2010-02-02 2011-08-18 Dainippon Screen Mfg Co Ltd 自動欠陥分類のための教師データ作成方法、自動欠陥分類方法および自動欠陥分類装置
US20180089560A1 (en) * 2016-09-28 2018-03-29 Dell Products, Lp High Speed Serial Links for High Volume Manufacturing
JP2019082874A (ja) * 2017-10-31 2019-05-30 株式会社日立製作所 設計支援装置及び設計支援システム
JP2019101924A (ja) * 2017-12-06 2019-06-24 株式会社豊田中央研究所 学習装置、電磁波反射特性推定装置、学習プログラム、および電磁波反射特性推定プログラム

Also Published As

Publication number Publication date
US20230237381A1 (en) 2023-07-27
EP4227847A4 (en) 2023-11-22
EP4227847A1 (en) 2023-08-16
WO2022074728A1 (ja) 2022-04-14
JP7416278B2 (ja) 2024-01-17

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