JP7411286B2 - 熱蛍光測定方法及び熱蛍光測定装置 - Google Patents

熱蛍光測定方法及び熱蛍光測定装置 Download PDF

Info

Publication number
JP7411286B2
JP7411286B2 JP2022565450A JP2022565450A JP7411286B2 JP 7411286 B2 JP7411286 B2 JP 7411286B2 JP 2022565450 A JP2022565450 A JP 2022565450A JP 2022565450 A JP2022565450 A JP 2022565450A JP 7411286 B2 JP7411286 B2 JP 7411286B2
Authority
JP
Japan
Prior art keywords
thermofluorescence
substance
heated
temperature
thermoluminescent
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
JP2022565450A
Other languages
English (en)
Japanese (ja)
Other versions
JPWO2022114130A1 (https=
JPWO2022114130A5 (https=
Inventor
浄光 眞正
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Metropolitan Public University Corp
Original Assignee
Tokyo Metropolitan Public University Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Metropolitan Public University Corp filed Critical Tokyo Metropolitan Public University Corp
Publication of JPWO2022114130A1 publication Critical patent/JPWO2022114130A1/ja
Publication of JPWO2022114130A5 publication Critical patent/JPWO2022114130A5/ja
Application granted granted Critical
Publication of JP7411286B2 publication Critical patent/JP7411286B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02—Dosimeters
    • G01T1/10—Luminescent dosimeters
    • G01T1/11—Thermo-luminescent dosimeters
    • G01T1/115—Read-out devices

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2022565450A 2020-11-27 2021-11-26 熱蛍光測定方法及び熱蛍光測定装置 Active JP7411286B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020197373 2020-11-27
JP2020197373 2020-11-27
PCT/JP2021/043398 WO2022114130A1 (ja) 2020-11-27 2021-11-26 熱蛍光測定方法及び熱蛍光測定装置

Publications (3)

Publication Number Publication Date
JPWO2022114130A1 JPWO2022114130A1 (https=) 2022-06-02
JPWO2022114130A5 JPWO2022114130A5 (https=) 2023-07-31
JP7411286B2 true JP7411286B2 (ja) 2024-01-11

Family

ID=81755639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022565450A Active JP7411286B2 (ja) 2020-11-27 2021-11-26 熱蛍光測定方法及び熱蛍光測定装置

Country Status (2)

Country Link
JP (1) JP7411286B2 (https=)
WO (1) WO2022114130A1 (https=)

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3605045A1 (en) 2018-07-30 2020-02-05 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Slit homogenizer for spectral imaging

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5016955B1 (https=) * 1970-02-05 1975-06-17
JPS5339178A (en) * 1976-09-22 1978-04-10 Matsushita Electric Ind Co Ltd Method and apparatus for measuring of thermal luminescence dose

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3605045A1 (en) 2018-07-30 2020-02-05 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Slit homogenizer for spectral imaging

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
BRAUNLICH P. et al.，Laser heating of thermoluminescent dielectric layers，Appl. Phys. Lett.，米国，AIP Publishing，1981年08月11日，Vol. 39, No. 9，pp. 769-771
KIM Sangho S. et al.，Depth-dependent temperature effects on thermoluminescence in multilayers，Journal of Applied Physics，米国，AIP Publishing，2013年08月07日，Vol. 114, 053519，pp. 1-8

Also Published As

Publication number Publication date
JPWO2022114130A1 (https=) 2022-06-02
WO2022114130A1 (ja) 2022-06-02

Similar Documents

Publication Publication Date Title
US9001968B2 (en) Method for characterization of a spherically bent crystal for Kα X-ray imaging of laser plasmas using a focusing monochromator geometry
Shevelko et al. Compact focusing von Hamos spectrometer for quantitative x-ray spectroscopy
CN103631081A (zh) 一种透射式软x光带通成像系统
Dinh et al. Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm
US7329876B2 (en) Narrow-band transmission filter for EUV radiation
Fuchs et al. Sensitivity calibration of an imaging extreme ultraviolet spectrometer-detector system for determining the efficiency of broadband extreme ultraviolet sources
JP7411286B2 (ja) 熱蛍光測定方法及び熱蛍光測定装置
Shevelko et al. X-ray focusing crystal von Hamos spectrometer with a CCD linear array as a detector
Saemann et al. Absolute calibration of a flat field spectrometer in the wavelength range 10–70 Å
Schürmann et al. Metrology tools for EUVL-source characterization and optimization
US11933675B2 (en) System and method for multi-channel pyrometer allowing non-contact temperature measurements down to 800 K on the microsecond scale
JPWO2019038823A1 (ja) 遠赤外分光装置、および遠赤外分光方法
Kiehn et al. Absolute calibration of an XUV time resolving spectrograph
Missalla et al. Metrology tools for EUV-source characterization and optimization
Fujikawa et al. In situ calibration of a flat-field grazing incidence spectrograph with an x-ray charge-coupled device camera using a transmission grating and a laser-produced plasma for x-ray laser research
Shevelko Absolute measurements in the VUV spectral range with a luminescent detector
Johnston et al. Absolute calibration method for nanosecond-resolved, time-streaked, fiber optic light collection, spectroscopy systems
Tallents et al. An investigation of the x-ray point-source brightness for a short-pulse laser plasma
JP4728116B2 (ja) Ｘ線吸収分光装置および方法
Legall et al. Spatial and spectral characterization of a laser produced plasma source for extreme ultraviolet metrology
Lu et al. A simple in situ calibration technique for soft x‐ray film
Böwering et al. Metrology of laser-produced plasma light source for EUV lithography
JP6211286B2 (ja) 赤外線吸収率の測定における赤外線吸収膜に対する赤外線光の入射方法
Scholze et al. Characterization of a laser-produced plasma source for a laboratory EUV reflectometer
Feng et al. A transmission grating spectrograph and its application in both laser plasma and plasma focus

Legal Events

Date Code Title Description
A529 Written submission of copy of amendment under article 34 pct

Free format text: JAPANESE INTERMEDIATE CODE: A5211

Effective date: 20230412

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20230412

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20231205

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20231218

R150 Certificate of patent or registration of utility model

Ref document number: 7411286

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150