JPWO2022114130A1 - - Google Patents

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Publication number
JPWO2022114130A1
JPWO2022114130A1 JP2022565450A JP2022565450A JPWO2022114130A1 JP WO2022114130 A1 JPWO2022114130 A1 JP WO2022114130A1 JP 2022565450 A JP2022565450 A JP 2022565450A JP 2022565450 A JP2022565450 A JP 2022565450A JP WO2022114130 A1 JPWO2022114130 A1 JP WO2022114130A1
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JP
Japan
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Application number
JP2022565450A
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Japanese (ja)
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JP7411286B2 (ja
JPWO2022114130A5 (https=
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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01TMEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/02Dosimeters
    • G01T1/10Luminescent dosimeters
    • G01T1/11Thermo-luminescent dosimeters
    • G01T1/115Read-out devices

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2022565450A 2020-11-27 2021-11-26 熱蛍光測定方法及び熱蛍光測定装置 Active JP7411286B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020197373 2020-11-27
JP2020197373 2020-11-27
PCT/JP2021/043398 WO2022114130A1 (ja) 2020-11-27 2021-11-26 熱蛍光測定方法及び熱蛍光測定装置

Publications (3)

Publication Number Publication Date
JPWO2022114130A1 true JPWO2022114130A1 (https=) 2022-06-02
JPWO2022114130A5 JPWO2022114130A5 (https=) 2023-07-31
JP7411286B2 JP7411286B2 (ja) 2024-01-11

Family

ID=81755639

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022565450A Active JP7411286B2 (ja) 2020-11-27 2021-11-26 熱蛍光測定方法及び熱蛍光測定装置

Country Status (2)

Country Link
JP (1) JP7411286B2 (https=)
WO (1) WO2022114130A1 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5016955B1 (https=) * 1970-02-05 1975-06-17
JPS5339178A (en) * 1976-09-22 1978-04-10 Matsushita Electric Ind Co Ltd Method and apparatus for measuring of thermal luminescence dose
EP3605045A1 (en) * 2018-07-30 2020-02-05 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Slit homogenizer for spectral imaging

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5016955B1 (https=) * 1970-02-05 1975-06-17
JPS5339178A (en) * 1976-09-22 1978-04-10 Matsushita Electric Ind Co Ltd Method and apparatus for measuring of thermal luminescence dose
EP3605045A1 (en) * 2018-07-30 2020-02-05 Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO Slit homogenizer for spectral imaging

Non-Patent Citations (2)

* Cited by examiner, † Cited by third party
Title
BRAUNLICH P. ET AL.: "Laser heating of thermoluminescent dielectric layers", APPL. PHYS. LETT., vol. 39, no. 9, JPN7022000578, 11 August 1981 (1981-08-11), US, pages 769 - 771, XP001427436, ISSN: 0005213310 *
KIM SANGHO S. ET AL.: "Depth-dependent temperature effects on thermoluminescence in multilayers", JOURNAL OF APPLIED PHYSICS, vol. Vol. 114, 053519, JPN7022000577, 7 August 2013 (2013-08-07), US, pages 1 - 8, ISSN: 0005213309 *

Also Published As

Publication number Publication date
JP7411286B2 (ja) 2024-01-11
WO2022114130A1 (ja) 2022-06-02

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