JP7381167B2 - 差動音波センサ - Google Patents
差動音波センサ Download PDFInfo
- Publication number
- JP7381167B2 JP7381167B2 JP2022512797A JP2022512797A JP7381167B2 JP 7381167 B2 JP7381167 B2 JP 7381167B2 JP 2022512797 A JP2022512797 A JP 2022512797A JP 2022512797 A JP2022512797 A JP 2022512797A JP 7381167 B2 JP7381167 B2 JP 7381167B2
- Authority
- JP
- Japan
- Prior art keywords
- sensor device
- top surface
- resonant cavity
- layer
- reflective structure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 239000000758 substrate Substances 0.000 claims description 55
- 238000010897 surface acoustic wave method Methods 0.000 claims description 37
- 238000001465 metallisation Methods 0.000 claims description 28
- 238000007385 chemical modification Methods 0.000 claims description 27
- 238000002161 passivation Methods 0.000 claims description 20
- 229910016570 AlCu Inorganic materials 0.000 claims description 6
- 229910004298 SiO 2 Inorganic materials 0.000 claims description 6
- 239000013626 chemical specie Substances 0.000 claims description 5
- 229910013641 LiNbO 3 Inorganic materials 0.000 claims description 4
- 229910018072 Al 2 O 3 Inorganic materials 0.000 claims description 3
- 239000000463 material Substances 0.000 description 40
- 230000004048 modification Effects 0.000 description 17
- 238000012986 modification Methods 0.000 description 17
- 238000010586 diagram Methods 0.000 description 16
- 230000000694 effects Effects 0.000 description 16
- 230000004044 response Effects 0.000 description 15
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 14
- 238000005259 measurement Methods 0.000 description 12
- 230000035945 sensitivity Effects 0.000 description 9
- 229910052710 silicon Inorganic materials 0.000 description 9
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 8
- 239000010703 silicon Substances 0.000 description 8
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 7
- 239000013078 crystal Substances 0.000 description 7
- WSMQKESQZFQMFW-UHFFFAOYSA-N 5-methyl-pyrazole-3-carboxylic acid Chemical compound CC1=CC(C(O)=O)=NN1 WSMQKESQZFQMFW-UHFFFAOYSA-N 0.000 description 6
- GQYHUHYESMUTHG-UHFFFAOYSA-N lithium niobate Chemical compound [Li+].[O-][Nb](=O)=O GQYHUHYESMUTHG-UHFFFAOYSA-N 0.000 description 6
- 238000012545 processing Methods 0.000 description 6
- 235000012239 silicon dioxide Nutrition 0.000 description 6
- 239000002131 composite material Substances 0.000 description 5
- 230000008878 coupling Effects 0.000 description 5
- 238000010168 coupling process Methods 0.000 description 5
- 238000005859 coupling reaction Methods 0.000 description 5
- XLOMVQKBTHCTTD-UHFFFAOYSA-N Zinc monoxide Chemical compound [Zn]=O XLOMVQKBTHCTTD-UHFFFAOYSA-N 0.000 description 4
- 229910052681 coesite Inorganic materials 0.000 description 4
- 229910052906 cristobalite Inorganic materials 0.000 description 4
- 230000001747 exhibiting effect Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 239000000377 silicon dioxide Substances 0.000 description 4
- 229910052682 stishovite Inorganic materials 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 229910052905 tridymite Inorganic materials 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Substances [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 3
- 238000000926 separation method Methods 0.000 description 3
- PIGFYZPCRLYGLF-UHFFFAOYSA-N Aluminum nitride Chemical compound [Al]#N PIGFYZPCRLYGLF-UHFFFAOYSA-N 0.000 description 2
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 2
- 230000003321 amplification Effects 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000005520 cutting process Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 230000006698 induction Effects 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 238000002955 isolation Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000003199 nucleic acid amplification method Methods 0.000 description 2
- 230000000704 physical effect Effects 0.000 description 2
- 229910052697 platinum Inorganic materials 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000001902 propagating effect Effects 0.000 description 2
- 239000010453 quartz Substances 0.000 description 2
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 2
- 229910052814 silicon oxide Inorganic materials 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 230000003068 static effect Effects 0.000 description 2
- 229910052721 tungsten Inorganic materials 0.000 description 2
- 235000019687 Lamb Nutrition 0.000 description 1
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 1
- 239000006096 absorbing agent Substances 0.000 description 1
- 238000010521 absorption reaction Methods 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 238000004364 calculation method Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000001427 coherent effect Effects 0.000 description 1
- 229910052593 corundum Inorganic materials 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 230000008021 deposition Effects 0.000 description 1
- 238000005137 deposition process Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000009699 differential effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000001914 filtration Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 125000004435 hydrogen atom Chemical group [H]* 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052750 molybdenum Inorganic materials 0.000 description 1
- 239000011733 molybdenum Substances 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 150000004767 nitrides Chemical class 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 230000000737 periodic effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 238000009877 rendering Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 238000010183 spectrum analysis Methods 0.000 description 1
- 230000003746 surface roughness Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- PBCFLUZVCVVTBY-UHFFFAOYSA-N tantalum pentoxide Inorganic materials O=[Ta](=O)O[Ta](=O)=O PBCFLUZVCVVTBY-UHFFFAOYSA-N 0.000 description 1
- 230000017105 transposition Effects 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 229910001845 yogo sapphire Inorganic materials 0.000 description 1
- 239000011787 zinc oxide Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/22—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of acoustic effects
- G01K11/26—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of acoustic effects of resonant frequencies
- G01K11/265—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of acoustic effects of resonant frequencies using surface acoustic wave [SAW]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/222—Constructional or flow details for analysing fluids
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/02—Analysing fluids
- G01N29/022—Fluid sensors based on microsensors, e.g. quartz crystal-microbalance [QCM], surface acoustic wave [SAW] devices, tuning forks, cantilevers, flexural plate wave [FPW] devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2462—Probes with waveguides, e.g. SAW devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2481—Wireless probes, e.g. with transponders or radio links
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02551—Characteristics of substrate, e.g. cutting angles of quartz substrates
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02559—Characteristics of substrate, e.g. cutting angles of lithium niobate or lithium-tantalate substrates
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02574—Characteristics of substrate, e.g. cutting angles of combined substrates, multilayered substrates, piezoelectrical layers on not-piezoelectrical substrate
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02637—Details concerning reflective or coupling arrays
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02637—Details concerning reflective or coupling arrays
- H03H9/02685—Grating lines having particular arrangements
- H03H9/0274—Intra-transducers grating lines
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02637—Details concerning reflective or coupling arrays
- H03H9/02685—Grating lines having particular arrangements
- H03H9/02771—Reflector banks
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02637—Details concerning reflective or coupling arrays
- H03H9/02779—Continuous surface reflective arrays
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
- H03H9/02842—Means for compensation or elimination of undesirable effects of reflections
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
- H03H9/25—Constructional features of resonators using surface acoustic waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/025—Change of phase or condition
- G01N2291/0256—Adsorption, desorption, surface mass change, e.g. on biosensors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/028—Material parameters
- G01N2291/02881—Temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/04—Wave modes and trajectories
- G01N2291/042—Wave modes
- G01N2291/0423—Surface waves, e.g. Rayleigh waves, Love waves
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/10—Number of transducers
- G01N2291/101—Number of transducers one transducer
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Pathology (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Computer Networks & Wireless Communication (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Measuring Fluid Pressure (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
インターデジタル変換器(櫛形電極を備える)と、
インターデジタル変換器の一方の側に配置された第1の反射構造と、
インターデジタル変換器の他方の側に配置された第2の反射構造と、
第1の上面を備え、インターデジタル変換器と第1の反射構造との間に形成された第1の共振空胴と、
第2の上面を備え、インターデジタル変換器と第2の反射構造との間に形成された第2の共振空胴と
を具備し、
第2の上面は、第1の上面と比較して、物理的及び/又は化学的改質を含む、音波センサデバイスを提供することによって、上記目的に対応する。
Claims (18)
- インターデジタル変換器と、
前記インターデジタル変換器の一方の側に配置された第1の反射構造と、
前記インターデジタル変換器の他方の側に配置された第2の反射構造と、
第1の上面を備え、前記インターデジタル変換器と前記第1の反射構造との間に形成された第1の共振空胴と、
第2の上面を備え、前記インターデジタル変換器と前記第2の反射構造との間に形成された第2の共振空胴と、
を具備し、
前記第2の上面は、前記第1の上面と比較すると、物理的及び/又は化学的改質を含み、
バルク基板と、
誘電体層と、
圧電層と、
をさらに備え、
前記圧電層に前記インターデジタル変換器並びに前記第1の反射構造及び前記第2の反射構造が形成され、前記第1の共振空胴及び前記第2の共振空胴が、前記圧電層を備える、音波センサデバイス。 - 前記物理的及び/又は化学的改質が、前記第2の上面に形成された金属被覆層を含む、請求項1に記載の音波センサデバイス。
- 前記金属被覆層が、AlCu及びTiのうちの少なくとも一方を含む、又はこれからなる、請求項2に記載の音波センサデバイス。
- 前記物理的及び/又は化学的改質が、前記第2の上面に形成されたパッシベーション層を含む、請求項1に記載の音波センサデバイス。
- 前記パッシベーション層は、Si 3 N 4 、Al 2 O 3 、AlN、Ta 2 O 5 、及びSiO 2 のうちの少なくとも1つを含む、又はこれからなる、請求項4に記載の音波センサデバイス。
- 前記物理的及び/又は化学的改質が、前記第2の上面の凹部を含む、請求項1~5のいずれか一項に記載の音波センサデバイス。
- 前記第1の上面が、前記第1の上面へのパッシベーション層の形成及び/又は前記第1の上面の凹部の形成によって改質される、請求項2又は3に記載の音波センサデバイス。
- 前記第1の上面が、前記第1の上面への金属被覆層の形成及び/又は前記第1の上面の凹部の形成によって改質される、請求項4又は5に記載の音波センサデバイス。
- 前記第1の上面が、前記第1の上面への金属被覆層又はパッシベーション層の形成によって改質される、請求項6に記載の音波センサデバイス。
- 前記第1の反射構造が、ブラッグミラーを備えるか又はこれからなり、前記第2の反射構造が、別のブラッグミラーを備えるか又はこれからなる、請求項1~9のいずれか一項に記載の音波センサデバイス。
- 前記第1の反射構造が、端面反射構造を備える、又はこれからなる、請求項1~9のいずれか一項に記載の音波センサデバイス。
- 前記第1の共振空胴が、前記第1の反射構造の複数の第1の反射サブ構造によって互いから分離された複数の第1の共振サブ空胴を備え、前記第2の共振空胴が、前記第2の反射構造の複数の第2の反射サブ構造によって互いから分離された複数の第2の共振サブ空胴を備える、請求項1~11のいずれか一項に記載の音波センサデバイス。
- 前記第1の共振空胴及び前記第2の共振空胴の伸張長が互いに異なっている、請求項1~12のいずれか一項に記載の音波センサデバイス。
- 前記インターデジタル変換器が、2つの部分に分割され、前記2つの部分の間に配置された追加の反射構造をさらに備える、請求項1~13のいずれか一項に記載の音波センサデバイス。
- 前記音波センサデバイスが、パッシブ表面弾性波センデバイスであり、及び/又は、周囲パラメータは、温度、化学種、歪み、圧力、又は回転軸線のトルクのうちの1つである、請求項1~14のいずれか一項に記載の音波センサデバイス。
- 前記バルク基板がSiバルク基板である、請求項1~15のいずれか一項に記載の音波センサデバイス。
- 前記誘電体層が、前記バルク基板に形成されたSiO 2 層である、請求項1~16のいずれか一項に記載の音波センサデバイス。
- 前記圧電層が、LiNbO 3 又はLiTaO 3 層である、請求項1~17のいずれか一項に記載の音波センサデバイス。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
FR1909734 | 2019-09-04 | ||
FR1909734A FR3100405B1 (fr) | 2019-09-04 | 2019-09-04 | Capteur à ondes acoustiques différentiel |
PCT/EP2020/074865 WO2021044031A1 (en) | 2019-09-04 | 2020-09-04 | Differential acoustic wave sensors |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2022547268A JP2022547268A (ja) | 2022-11-11 |
JP7381167B2 true JP7381167B2 (ja) | 2023-11-15 |
Family
ID=69172907
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2022512797A Active JP7381167B2 (ja) | 2019-09-04 | 2020-09-04 | 差動音波センサ |
JP2023512318A Pending JP2023540459A (ja) | 2019-09-04 | 2021-03-03 | 石英基板に形成された表面弾性波センサデバイス |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2023512318A Pending JP2023540459A (ja) | 2019-09-04 | 2021-03-03 | 石英基板に形成された表面弾性波センサデバイス |
Country Status (5)
Country | Link |
---|---|
US (2) | US20220341881A1 (ja) |
EP (2) | EP4025904A1 (ja) |
JP (2) | JP7381167B2 (ja) |
FR (1) | FR3100405B1 (ja) |
WO (2) | WO2021044031A1 (ja) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN113394571B (zh) * | 2021-07-20 | 2022-06-10 | 合肥工业大学 | 一种交指状阶梯谐振结构及低频率电磁波的吸波体 |
FR3127660A1 (fr) | 2021-09-27 | 2023-03-31 | Frec'n'sys | Filtre a ondes elastiques de surface et a cavites resonantes |
Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002272737A (ja) | 2001-03-21 | 2002-09-24 | Fuji Photo Film Co Ltd | 超音波受信装置及びそれを用いた超音波診断装置 |
JP2003169801A (ja) | 2001-05-14 | 2003-06-17 | Fuji Photo Film Co Ltd | 超音波受信装置 |
US20060049714A1 (en) | 2004-09-03 | 2006-03-09 | James Liu | Passive wireless acoustic wave chemical sensor |
JP2007232707A (ja) | 2005-04-20 | 2007-09-13 | Nec Tokin Corp | 力学量センサ及びその製造方法 |
JP2008129020A (ja) | 2006-11-16 | 2008-06-05 | Honeywell Internatl Inc | 化学的かつ生物学的感知のための装置および方法 |
JP2008224582A (ja) | 2007-03-15 | 2008-09-25 | Seiko Epson Corp | ガスセンサ |
JP2009222589A (ja) | 2008-03-17 | 2009-10-01 | Nissan Motor Co Ltd | 圧力センサおよびこれを備えた圧力測定装置 |
JP2009300302A (ja) | 2008-06-16 | 2009-12-24 | Japan Radio Co Ltd | 被測定物特性測定装置 |
JP2010501067A (ja) | 2006-08-17 | 2010-01-14 | アトノミックス アクティーゼルスカブ | 目標検体を検出するための、生体表面音響波(saw)共振器増幅 |
WO2010041390A1 (ja) | 2008-10-07 | 2010-04-15 | 株式会社 村田製作所 | 弾性波センサ及び弾性波センサを用いた検出方法 |
CN104768113A (zh) | 2015-03-20 | 2015-07-08 | 南京航空航天大学 | 一种用于液体多参数传感的乐甫波器件结构及检测方法 |
WO2016137009A1 (ja) | 2015-02-27 | 2016-09-01 | 京セラ株式会社 | 検体液の測定方法および検体液センサ |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH01214719A (ja) * | 1988-02-24 | 1989-08-29 | Hitachi Constr Mach Co Ltd | 光音響波の集音装置 |
EP0332935A1 (de) * | 1988-03-14 | 1989-09-20 | Siemens Aktiengesellschaft | Sensomaterial zur Messung des Partialdruckes von Gasen oder Dämpfen und Gassensor |
US5221870A (en) * | 1991-09-30 | 1993-06-22 | Sumitomo Electric Industries, Ltd. | Surface acoustic wave device |
FR2785473B1 (fr) * | 1998-10-30 | 2001-01-26 | Thomson Csf | Filtre faibles pertes a ondes acoustiques de surface sur substrat de quartz de coupe optimisee |
JP4569447B2 (ja) * | 2005-11-18 | 2010-10-27 | エプソントヨコム株式会社 | 弾性表面波素子片および弾性表面波デバイス |
JP2008267968A (ja) * | 2007-04-19 | 2008-11-06 | Japan Radio Co Ltd | 被測定物特性測定装置 |
EP2418482B1 (en) * | 2010-08-11 | 2017-03-22 | Honeywell International Inc. | Surface acoustic wave humidity sensor |
JP5956901B2 (ja) * | 2011-12-22 | 2016-07-27 | 日本無線株式会社 | 被測定物特性測定装置 |
EP2871474B1 (en) * | 2013-11-08 | 2018-03-07 | Pro-micron GmbH & Co. KG | SAW sensor based on Fabry-Pérot-type resonator |
-
2019
- 2019-09-04 FR FR1909734A patent/FR3100405B1/fr active Active
-
2020
- 2020-09-04 JP JP2022512797A patent/JP7381167B2/ja active Active
- 2020-09-04 US US17/753,508 patent/US20220341881A1/en active Pending
- 2020-09-04 WO PCT/EP2020/074865 patent/WO2021044031A1/en unknown
- 2020-09-04 EP EP20775821.0A patent/EP4025904A1/en active Pending
-
2021
- 2021-03-03 EP EP21720556.6A patent/EP4208715A1/en active Pending
- 2021-03-03 WO PCT/IB2021/000128 patent/WO2022049418A1/en unknown
- 2021-03-03 US US18/042,948 patent/US20230361751A1/en active Pending
- 2021-03-03 JP JP2023512318A patent/JP2023540459A/ja active Pending
Patent Citations (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2002272737A (ja) | 2001-03-21 | 2002-09-24 | Fuji Photo Film Co Ltd | 超音波受信装置及びそれを用いた超音波診断装置 |
JP2003169801A (ja) | 2001-05-14 | 2003-06-17 | Fuji Photo Film Co Ltd | 超音波受信装置 |
US20060049714A1 (en) | 2004-09-03 | 2006-03-09 | James Liu | Passive wireless acoustic wave chemical sensor |
JP2007232707A (ja) | 2005-04-20 | 2007-09-13 | Nec Tokin Corp | 力学量センサ及びその製造方法 |
JP2010501067A (ja) | 2006-08-17 | 2010-01-14 | アトノミックス アクティーゼルスカブ | 目標検体を検出するための、生体表面音響波(saw)共振器増幅 |
JP2008129020A (ja) | 2006-11-16 | 2008-06-05 | Honeywell Internatl Inc | 化学的かつ生物学的感知のための装置および方法 |
JP2008224582A (ja) | 2007-03-15 | 2008-09-25 | Seiko Epson Corp | ガスセンサ |
JP2009222589A (ja) | 2008-03-17 | 2009-10-01 | Nissan Motor Co Ltd | 圧力センサおよびこれを備えた圧力測定装置 |
JP2009300302A (ja) | 2008-06-16 | 2009-12-24 | Japan Radio Co Ltd | 被測定物特性測定装置 |
WO2010041390A1 (ja) | 2008-10-07 | 2010-04-15 | 株式会社 村田製作所 | 弾性波センサ及び弾性波センサを用いた検出方法 |
WO2016137009A1 (ja) | 2015-02-27 | 2016-09-01 | 京セラ株式会社 | 検体液の測定方法および検体液センサ |
CN104768113A (zh) | 2015-03-20 | 2015-07-08 | 南京航空航天大学 | 一种用于液体多参数传感的乐甫波器件结构及检测方法 |
Non-Patent Citations (1)
Title |
---|
Axial modes of acoustically coupled surface acoustic wave Fabry-Perot resonators,Journal of Applied Physics,American Institute of Physics,1990年07月15日,Vol. 68, No. 2,pp. 474-481,doi: 10.1063/1.347189 |
Also Published As
Publication number | Publication date |
---|---|
EP4208715A1 (en) | 2023-07-12 |
FR3100405A1 (fr) | 2021-03-05 |
FR3100405B1 (fr) | 2021-12-31 |
US20220341881A1 (en) | 2022-10-27 |
JP2023540459A (ja) | 2023-09-25 |
WO2022049418A1 (en) | 2022-03-10 |
JP2022547268A (ja) | 2022-11-11 |
WO2021044031A1 (en) | 2021-03-11 |
US20230361751A1 (en) | 2023-11-09 |
EP4025904A1 (en) | 2022-07-13 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
US7609132B2 (en) | Hybrid resonant structure | |
US20240159710A1 (en) | Surface acoustic wave sensor device | |
JP7480936B2 (ja) | Rfid及びセンサ用途のためのsawタグ用複合基板 | |
US20160261248A1 (en) | Surface elastic wave device comprising a single-crystal piezoelectric film and a crystalline substrate with low visoelastic coefficients | |
US8258674B2 (en) | Surface acoustic wave sensor and system | |
JP7381167B2 (ja) | 差動音波センサ | |
US20240154603A1 (en) | Two-port acoustic wave sensor device | |
US20220196490A1 (en) | Resonator device | |
US8207649B2 (en) | Surface wave resonator having reduced parasitic resonance | |
JP2023171888A (ja) | 音波センサ及びその質問 | |
US20230366755A1 (en) | Resonator device | |
EP2933619B1 (en) | A differential temperature measuring device comprising surface transverse wave resonators | |
US11828668B2 (en) | Differential acoustic wave pressure sensor with improved signal-to-noise ratio | |
EP3949120B1 (en) | Interrogation of acoustic wave sensors | |
Schiopu et al. | Recent developments in surface acoustic wave sensors | |
JP2021032676A (ja) | 認識信号生成素子及び素子認識システム | |
Bassignot et al. | Fabrication and characterization of acoustic waveguides using Silicon/PPT/Silicon structures and analysis of diffraction effects for various modelings |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20220419 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A712 Effective date: 20230324 |
|
A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20230331 |
|
A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20230523 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20230731 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20231003 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20231030 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 7381167 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 |