JP7350217B2 - 光センサ装置 - Google Patents

光センサ装置 Download PDF

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Publication number
JP7350217B2
JP7350217B2 JP2023528906A JP2023528906A JP7350217B2 JP 7350217 B2 JP7350217 B2 JP 7350217B2 JP 2023528906 A JP2023528906 A JP 2023528906A JP 2023528906 A JP2023528906 A JP 2023528906A JP 7350217 B2 JP7350217 B2 JP 7350217B2
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Japan
Prior art keywords
signal
frequency
light
analog
digital
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JP2023528906A
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English (en)
Japanese (ja)
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JPWO2022264393A1 (https=
Inventor
隼也 西岡
隆典 山内
巨生 鈴木
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02003—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using beat frequencies
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • G01C3/06—Use of electric means to obtain final indication
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/26—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable characterised by optical transfer means, i.e. using infrared, visible, or ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S17/00—Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
    • G01S17/02—Systems using the reflection of electromagnetic waves other than radio waves
    • G01S17/06—Systems determining position data of a target
    • G01S17/08—Systems determining position data of a target for measuring distance only
    • G01S17/32—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated
    • G01S17/34—Systems determining position data of a target for measuring distance only using transmission of continuous waves, whether amplitude-, frequency-, or phase-modulated, or unmodulated using transmission of continuous, frequency-modulated waves while heterodyning the received signal, or a signal derived therefrom, with a locally-generated signal related to the contemporaneously transmitted signal
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01S—RADIO DIRECTION-FINDING; RADIO NAVIGATION; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION OR RERADIATION OF RADIO WAVES; ANALOGOUS ARRANGEMENTS USING OTHER WAVES
    • G01S7/00—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00
    • G01S7/48—Details of systems according to groups G01S13/00, G01S15/00, G01S17/00 of systems according to group G01S17/00
    • G01S7/497—Means for monitoring or calibrating
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00—Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/102—Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions for optical coherence tomography [OCT]

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Electromagnetism (AREA)
  • Remote Sensing (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Optical Communication System (AREA)
  • Optical Transform (AREA)
JP2023528906A 2021-06-18 2021-06-18 光センサ装置 Active JP7350217B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2021/023157 WO2022264393A1 (ja) 2021-06-18 2021-06-18 光センサ装置

Publications (2)

Publication Number Publication Date
JPWO2022264393A1 JPWO2022264393A1 (https=) 2022-12-22
JP7350217B2 true JP7350217B2 (ja) 2023-09-25

Family

ID=84526977

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2023528906A Active JP7350217B2 (ja) 2021-06-18 2021-06-18 光センサ装置

Country Status (6)

Country Link
US (1) US20240053256A1 (https=)
JP (1) JP7350217B2 (https=)
KR (1) KR102650419B1 (https=)
CN (1) CN117460946A (https=)
GB (1) GB2622968B (https=)
WO (1) WO2022264393A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2025013662A1 (https=) * 2023-07-11 2025-01-16
WO2026038383A1 (ja) * 2024-08-14 2026-02-19 三菱電機株式会社 光干渉距離測定装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008545970A (ja) 2005-06-01 2008-12-18 ザ ジェネラル ホスピタル コーポレイション 位相分解光学周波数領域画像化を行うための装置、方法及びシステム
US20140268038A1 (en) 2013-03-12 2014-09-18 Carl Zeiss Meditec, Inc. Systems and methods for variable depth optical coherence tomography imaging
JP2014533837A (ja) 2011-12-21 2014-12-15 ウェイブライト ゲーエムベーハー 掃引光源光干渉断層撮影のための装置及び方法
JP2015099078A (ja) 2013-11-19 2015-05-28 株式会社トーメーコーポレーション 光断層画像撮影装置
JP2016031294A (ja) 2014-07-29 2016-03-07 日本電信電話株式会社 光干渉断層装置
JP2016148539A (ja) 2015-02-10 2016-08-18 アンリツ株式会社 Ｏｃｔ装置
US20190223714A1 (en) 2018-01-23 2019-07-25 Amo Wavefront Sciences, Llc Methods and systems of optical coherence tomography with fiducial signal for correcting scanning laser nonlinearity

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4999147B2 (ja) * 2006-05-22 2012-08-15 富士フイルム株式会社 波長掃引光源および光断層画像化装置
US9279659B2 (en) * 2011-01-21 2016-03-08 Duke University Systems and methods for complex conjugate artifact resolved optical coherence tomography
US8908189B2 (en) * 2011-04-15 2014-12-09 Carl Zeiss Meditec, Inc. Systems and methods for swept-source optical coherence tomography
EP2574273B1 (en) * 2011-06-23 2014-09-24 Nidek Co., Ltd. Optical coherence tomography apparatus
US9191020B2 (en) * 2014-02-05 2015-11-17 Waveworks, Inc. Traveling-wave based high-speed sampling systems
JP2016090280A (ja) * 2014-10-30 2016-05-23 日本電信電話株式会社 光断層画像撮像装置及びこれを使用した撮像方法
JP6696782B2 (ja) * 2015-03-09 2020-05-20 炭　親良 ビームフォーミング方法、計測イメージング装置、及び、通信装置
US11255663B2 (en) * 2016-03-04 2022-02-22 May Patents Ltd. Method and apparatus for cooperative usage of multiple distance meters
WO2021009913A1 (ja) * 2019-07-18 2021-01-21 日本電信電話株式会社 波長掃引光測定システム
EP4207635A4 (en) * 2020-09-09 2024-05-22 Nippon Telegraph And Telephone Corporation OPTICAL TRANSMITTER AND FREQUENCY CONTROL METHODS FOR OPTICAL TRANSMISSION
US11988903B2 (en) * 2021-02-11 2024-05-21 Raytheon Company Photonic integrated circuit-based optical phased array calibration technique
GB2620312B (en) * 2021-04-06 2024-08-21 Mitsubishi Electric Corp Optical measurement device

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008545970A (ja) 2005-06-01 2008-12-18 ザ ジェネラル ホスピタル コーポレイション 位相分解光学周波数領域画像化を行うための装置、方法及びシステム
JP2014533837A (ja) 2011-12-21 2014-12-15 ウェイブライト ゲーエムベーハー 掃引光源光干渉断層撮影のための装置及び方法
US20140268038A1 (en) 2013-03-12 2014-09-18 Carl Zeiss Meditec, Inc. Systems and methods for variable depth optical coherence tomography imaging
JP2015099078A (ja) 2013-11-19 2015-05-28 株式会社トーメーコーポレーション 光断層画像撮影装置
JP2016031294A (ja) 2014-07-29 2016-03-07 日本電信電話株式会社 光干渉断層装置
JP2016148539A (ja) 2015-02-10 2016-08-18 アンリツ株式会社 Ｏｃｔ装置
US20190223714A1 (en) 2018-01-23 2019-07-25 Amo Wavefront Sciences, Llc Methods and systems of optical coherence tomography with fiducial signal for correcting scanning laser nonlinearity

Also Published As

Publication number Publication date
WO2022264393A1 (ja) 2022-12-22
KR20230173739A (ko) 2023-12-27
KR102650419B1 (ko) 2024-03-21
CN117460946A (zh) 2024-01-26
GB2622968A (en) 2024-04-03
GB2622968B (en) 2024-11-06
JPWO2022264393A1 (https=) 2022-12-22
GB202318421D0 (en) 2024-01-17
US20240053256A1 (en) 2024-02-15

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