JP7341313B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP7341313B2
JP7341313B2 JP2022505840A JP2022505840A JP7341313B2 JP 7341313 B2 JP7341313 B2 JP 7341313B2 JP 2022505840 A JP2022505840 A JP 2022505840A JP 2022505840 A JP2022505840 A JP 2022505840A JP 7341313 B2 JP7341313 B2 JP 7341313B2
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JP
Japan
Prior art keywords
consumables
analysis
automatic analyzer
remaining amount
state
Prior art date
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Active
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JP2022505840A
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English (en)
Japanese (ja)
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JPWO2021181971A1 (cg-RX-API-DMAC7.html
JPWO2021181971A5 (cg-RX-API-DMAC7.html
Inventor
浩気 藤田
晃大 山野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High-Tech Corp
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Hitachi High-Tech Corp
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Publication date
Application filed by Hitachi High-Tech Corp filed Critical Hitachi High-Tech Corp
Publication of JPWO2021181971A1 publication Critical patent/JPWO2021181971A1/ja
Publication of JPWO2021181971A5 publication Critical patent/JPWO2021181971A5/ja
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Publication of JP7341313B2 publication Critical patent/JP7341313B2/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/025—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations having a carousel or turntable for reaction cells or cuvettes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1002—Reagent dispensers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/10—Devices for transferring samples or any liquids to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
    • G01N35/1009—Characterised by arrangements for controlling the aspiration or dispense of liquids
    • G01N35/1016—Control of the volume dispensed or introduced
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00663—Quality control of consumables
    • G01N2035/00673—Quality control of consumables of reagents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00722—Communications; Identification
    • G01N2035/00891—Displaying information to the operator

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  • Chemical & Material Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
JP2022505840A 2020-03-13 2021-02-08 自動分析装置 Active JP7341313B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020044117 2020-03-13
JP2020044117 2020-03-13
PCT/JP2021/004494 WO2021181971A1 (ja) 2020-03-13 2021-02-08 自動分析装置

Publications (3)

Publication Number Publication Date
JPWO2021181971A1 JPWO2021181971A1 (cg-RX-API-DMAC7.html) 2021-09-16
JPWO2021181971A5 JPWO2021181971A5 (cg-RX-API-DMAC7.html) 2022-10-12
JP7341313B2 true JP7341313B2 (ja) 2023-09-08

Family

ID=77671396

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2022505840A Active JP7341313B2 (ja) 2020-03-13 2021-02-08 自動分析装置

Country Status (5)

Country Link
US (1) US12467935B2 (cg-RX-API-DMAC7.html)
EP (1) EP4119950A4 (cg-RX-API-DMAC7.html)
JP (1) JP7341313B2 (cg-RX-API-DMAC7.html)
CN (1) CN115210576B (cg-RX-API-DMAC7.html)
WO (1) WO2021181971A1 (cg-RX-API-DMAC7.html)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025258337A1 (ja) * 2024-06-13 2025-12-18 株式会社日立ハイテク 自動分析システム

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7304969B2 (ja) * 2019-12-26 2023-07-07 株式会社日立ハイテク 自動分析装置及び自動分析装置用の制御プログラム
JP7008744B2 (ja) 2020-04-14 2022-01-25 日本電子株式会社 自動分析装置および自動分析装置の制御方法

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002214240A (ja) 2001-01-15 2002-07-31 Fuji Photo Film Co Ltd 測定チップを用いる分析装置および測定チップ管理装置
JP2010151672A (ja) 2008-12-25 2010-07-08 Beckman Coulter Inc 自動分析装置
WO2010107042A1 (ja) 2009-03-18 2010-09-23 シスメックス株式会社 検体分析装置
JP2011033425A (ja) 2009-07-31 2011-02-17 Hitachi High-Technologies Corp 自動分析装置
JP2013190446A (ja) 2013-07-02 2013-09-26 Sysmex Corp 試料分析装置及び試料分析装置用プログラム
WO2018155049A1 (ja) 2017-02-22 2018-08-30 株式会社 日立ハイテクノロジーズ 自動分析装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3597958B2 (ja) 1996-11-15 2004-12-08 株式会社日立製作所 自動分析装置
JP4735850B2 (ja) * 2006-11-28 2011-07-27 富士ゼロックス株式会社 消耗品管理装置、画像形成装置及びプログラム
JP5280797B2 (ja) * 2008-10-27 2013-09-04 シスメックス株式会社 検体分析装置
JP5340975B2 (ja) * 2010-01-29 2013-11-13 株式会社日立ハイテクノロジーズ 自動分析装置
JP5495884B2 (ja) 2010-03-25 2014-05-21 シスメックス株式会社 試料分析装置
US10837974B2 (en) * 2010-03-30 2020-11-17 Sysmex Corporation System, apparatus and method for auto-replenishment and monitoring of a medical instrument
JP5591674B2 (ja) * 2010-12-02 2014-09-17 株式会社東芝 自動分析装置および試薬容器保管装置
JP5884272B2 (ja) * 2011-02-18 2016-03-15 株式会社リコー 薄膜製造方法
JP5868230B2 (ja) * 2012-03-13 2016-02-24 シャープ株式会社 作動装置及びコンピュータプログラム
US9436924B2 (en) * 2012-12-06 2016-09-06 Ascensia Diabetes Care Holdings Ag Automated analyte sensor ordering methods and apparatus
JP2020044117A (ja) 2018-09-19 2020-03-26 博康 久保田 綿棒
CN110472800A (zh) * 2019-08-23 2019-11-19 山东浪潮通软信息科技有限公司 一种基于lstm+cnn的机床刀具剩余寿命预测方法
JP7008744B2 (ja) * 2020-04-14 2022-01-25 日本電子株式会社 自動分析装置および自動分析装置の制御方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002214240A (ja) 2001-01-15 2002-07-31 Fuji Photo Film Co Ltd 測定チップを用いる分析装置および測定チップ管理装置
JP2010151672A (ja) 2008-12-25 2010-07-08 Beckman Coulter Inc 自動分析装置
WO2010107042A1 (ja) 2009-03-18 2010-09-23 シスメックス株式会社 検体分析装置
JP2011033425A (ja) 2009-07-31 2011-02-17 Hitachi High-Technologies Corp 自動分析装置
JP2013190446A (ja) 2013-07-02 2013-09-26 Sysmex Corp 試料分析装置及び試料分析装置用プログラム
WO2018155049A1 (ja) 2017-02-22 2018-08-30 株式会社 日立ハイテクノロジーズ 自動分析装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2025258337A1 (ja) * 2024-06-13 2025-12-18 株式会社日立ハイテク 自動分析システム

Also Published As

Publication number Publication date
US20230135106A1 (en) 2023-05-04
CN115210576B (zh) 2025-10-28
CN115210576A (zh) 2022-10-18
JPWO2021181971A1 (cg-RX-API-DMAC7.html) 2021-09-16
EP4119950A4 (en) 2024-02-28
WO2021181971A1 (ja) 2021-09-16
EP4119950A1 (en) 2023-01-18
US12467935B2 (en) 2025-11-11

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