JP7315017B2 - 時系列データ処理方法 - Google Patents

時系列データ処理方法 Download PDF

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Publication number
JP7315017B2
JP7315017B2 JP2021552071A JP2021552071A JP7315017B2 JP 7315017 B2 JP7315017 B2 JP 7315017B2 JP 2021552071 A JP2021552071 A JP 2021552071A JP 2021552071 A JP2021552071 A JP 2021552071A JP 7315017 B2 JP7315017 B2 JP 7315017B2
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series data
time
value
period
data processing
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Japanese (ja)
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JPWO2021075039A1 (https=
JPWO2021075039A5 (https=
Inventor
直生 吉永
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NEC Corp
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NEC Corp
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M99/00—Subject matter not provided for in other groups of this subclass
    • G01M99/005—Testing of complete machines, e.g. washing-machines or mobile phones
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Debugging And Monitoring (AREA)
JP2021552071A 2019-10-18 2019-10-18 時系列データ処理方法 Active JP7315017B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2019/041013 WO2021075039A1 (ja) 2019-10-18 2019-10-18 時系列データ処理方法

Publications (3)

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JPWO2021075039A1 JPWO2021075039A1 (https=) 2021-04-22
JPWO2021075039A5 JPWO2021075039A5 (https=) 2022-05-30
JP7315017B2 true JP7315017B2 (ja) 2023-07-26

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JP2021552071A Active JP7315017B2 (ja) 2019-10-18 2019-10-18 時系列データ処理方法

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US (1) US11885720B2 (https=)
JP (1) JP7315017B2 (https=)
WO (1) WO2021075039A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7287481B2 (ja) * 2019-10-16 2023-06-06 日本電信電話株式会社 閾値取得装置、その方法、およびプログラム
US20230280736A1 (en) * 2022-03-02 2023-09-07 Applied Materials, Inc. Comprehensive analysis module for determining processing equipment performance

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008059270A (ja) 2006-08-31 2008-03-13 Toshiba Corp プロセス異常診断装置及びプロセス監視システム
WO2011036809A1 (ja) 2009-09-28 2011-03-31 株式会社 東芝 異常判定システムおよびその方法
JP2014228887A (ja) 2013-05-17 2014-12-08 株式会社東芝 稼働データ分析装置およびその方法、ならびにプログラム

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6564799B2 (ja) 2017-03-03 2019-08-21 日本電信電話株式会社 閾値決定装置、閾値決定方法及びプログラム

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008059270A (ja) 2006-08-31 2008-03-13 Toshiba Corp プロセス異常診断装置及びプロセス監視システム
WO2011036809A1 (ja) 2009-09-28 2011-03-31 株式会社 東芝 異常判定システムおよびその方法
JP2014228887A (ja) 2013-05-17 2014-12-08 株式会社東芝 稼働データ分析装置およびその方法、ならびにプログラム

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JPWO2021075039A1 (https=) 2021-04-22
WO2021075039A1 (ja) 2021-04-22
US11885720B2 (en) 2024-01-30
US20220334030A1 (en) 2022-10-20

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